DOE OSTI · 2565033
Improved temporal resolution in ultrafast electron diffraction measurements through THz compression and time-stamping
Abstract
We present an experimental demonstration of ultrafast electron diffraction (UED) with THz-driven electron bunch compression and time-stamping that enables UED probes with improved temporal resolution. Through THz-driven longitudinal bunch compression, a compression factor of approximately four is achieved. Moreover, the time-of-arrival jitter between the compressed electron bunch and a pump laser pulse is suppressed by a factor of three. Simultaneously, the THz interaction imparts a transverse spatiotemporal correlation on the electron distribution, which we utilize to further enhance the precision of time-resolved UED measurements. We use this technique to probe single-crystal gold nanofilms and reveal transient oscillations in the THz near fields with a temporal resolution down to 50 fs. These oscillations were previously beyond reach in the absence of THz compression and time-stamping.
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Othman, Mohamed A. K. (ORCID:0000000178848667), Gabriel, Annika E. (ORCID:0009000165835514), Snively, Emma C., Kozina, Michael E. (ORCID:000000024747345X), Shen, Xiaozhe (ORCID:000000026844608X), Ji, Fuhao (ORCID:0009000396016233), Lewis, Samantha, Weathersby, Stephen (ORCID:0000000202534781), Vasireddy, Praful, Luo, Duan, Wang, Xijie, Hoffmann, Matthias C. (ORCID:0000000235969853), Nanni, Emilio A. (ORCID:0000000219000778). 2024-04-22. Improved temporal resolution in ultrafast electron diffraction measurements through THz compression and time-stamping. https://doi.org/10.1063/4.0000230
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