DOE OSTI · 2572430
X-ray Micro-Computed Tomography for Structural Analysis of All-Solid-State Battery at Pouch Cell Level
Abstract
Characterizing the microstructure of all-solid-state batteries (ASSBs) during fabrication and operation is vital for their advancement, particularly as scaling to pouch cell levels introduces challenges in probing large-scale microstructural evolution. This work highlights the potential of synchrotron X-ray micro-computed tomography (sXCT) as a nondestructive, rapid (<30 min), and high-resolution technique for visualizing and quantifying key microstructural features, including overhang, porosity, contact loss, active surface area, and tortuosity, in all-solid-state pouch cells. The large field of view (up to millimeters) of sXCT enables detailed analysis at an industry-relevant scale, bridging the gap between laboratory research and commercial applications. Furthermore, integrating realistic sXCT-derived 3D models into multiphysics simulations could provide insights into chemo-mechanical degradation, particularly at the edges of the pouch cells, offering a pathway for designing robust, high-performance ASSBs. This perspective establishes sXCT as an indispensable tool for advancing both the understanding and the engineering of next-generation energy storage systems.
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Huang, Chen-Jui [University of Chicago, IL (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000183381424), Oh, Jin An Sam [University of California San Diego, La Jolla, CA (United States); Agency for Science, Technology and Research (A*STAR) (Singapore)] (ORCID:000000019336234X), Vicencio, Marta [University of California San Diego, La Jolla, CA (United States)], Hu, Tianchen [Argonne National Laboratory (ANL), Argonne, IL (United States)], Yang, Hedi [University of Chicago, IL (United States)], Burrow, James N. [University of Chicago, IL (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000274453788), Song, Yen-Fang [National Synchrotron Radiation Research Center, Hsinchu (Taiwan)], Yin, Gung-Chian [National Synchrotron Radiation Research Center, Hsinchu (Taiwan)], Shevchenko, Pavel [Argonne National Laboratory (ANL), Argonne, IL (United States)], Wiaderek, Kamila M. [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000200513661), Hwang, Bing Joe [National Synchrotron Radiation Research Center, Hsinchu (Taiwan); National Taiwan University of Science and Technology, Taipei (Taiwan)] (ORCID:0000000238732149), Meng, Ying Shirley [University of Chicago, IL (United States); University of California San Diego, La Jolla, CA (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000189368845). 2025-06-26. X-ray Micro-Computed Tomography for Structural Analysis of All-Solid-State Battery at Pouch Cell Level. https://doi.org/10.1021/acsenergylett.5c00956
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