MCPC Characterization Round 3

Barker, Erin I [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)]; Todd, Donald R [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)]; Nwe, Kathy [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)]; Pole, Mayur [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)]; Guo, Yanming [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)]; Guzman, Anthony D [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)]; Ortiz, Angel [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)]; Olszta, Matthew J [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)]; Linsuain, Otto [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)]; Brown, David Michael Leo [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)] (ORCID:0000000220737777); Escobar, Julian D [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)]; Garcia, David [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)]; Wang, Tianhao [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)]; Das, Hrishikesh [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)]; Ross, Kenneth A [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)]; Smith, Leon E [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)]

doi:10.25584/mcpc/2572815

DOE OSTI · 2572815

MCPC Characterization Round 3

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Abstract

Characterization data for the MCPC LDRD Agile investment is collected in multiple rounds. Contained herein is data from Round 3 in which eleven distinct samples and one control sample are characterized by five modalities: EBSD, HARDNESS, OPTICAL, SEM, and ULTRASONIC. Data is organized in subdirectories for the five modalities and each one modality containing subdirectories for the datasets and other information.

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316 stainless steel 36 MATERIALS SCIENCE EBSD Hardness Materials Science Optical Microscopy SEM Ultrasonic

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Barker, Erin I [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)], Todd, Donald R [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)], Nwe, Kathy [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)], Pole, Mayur [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)], Guo, Yanming [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)], Guzman, Anthony D [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)], Ortiz, Angel [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)], Olszta, Matthew J [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)], Linsuain, Otto [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)], Brown, David Michael Leo [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)] (ORCID:0000000220737777), Escobar, Julian D [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)], Garcia, David [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)], Wang, Tianhao [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)], Das, Hrishikesh [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)], Ross, Kenneth A [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)], Smith, Leon E [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)]. 2025-07-22. MCPC Characterization Round 3. https://doi.org/10.25584/mcpc%2F2572815

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