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DOE OSTI · 2572819

High-frequency electrical behavior in V 3 O 5 thin films

Abstract

Vanadium oxides are known for their metal–insulator transition (MIT), with V 3 O 5 being notable for its transition temperature exceeding room temperature. At about 430 K, this material shows a change in crystal symmetry accompanied with one order of magnitude increase in its electrical conductivity and alterations in its optical properties. Although the property changes during the MIT in V 3 O 5 are less pronounced than those observed in VO 2 , its transition temperature is 90 K higher, making it appealing for applications requiring elevated temperatures. In this article, the high-frequency characteristics were determined in a V 3 O 5 two-terminal device in the range from 5 to 35 GHz. The S-parameters showed that the return loss at room temperature was close to −1.5 dB, and the isolation between ports was approximately −50 dB. At temperatures above the metal–insulator transition, the isolation decreased to around −40 dB at 35 GHz. For S11 and S22, similar behavior was observed at room temperature, with a notable change in the S-parameter phase of the device. This behavior suggests that V 3 O 5 may function well as a capacitor because the considerable change in phase could control the flow of electrical signals in devices. This property also may be used for matching purposes, especially considering its response to temperature changes. Additionally, conductivity calculation from S-parameters shows a decrease of approximately two orders of magnitude at 500 K and one order of magnitude at 300 K compared to DC values. These findings highlight V 3 O 5 potential for integration into radio frequency devices that demand consistent performance in high-temperature environments.

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BibTeXRIS

Verbel, Camilo [Univ. of Puerto Rico, Mayaguez, PR (United States)] (ORCID:0000000223154841), Bartenev, Alexander [Univ. of Puerto Rico, Mayaguez, PR (United States)] (ORCID:0009000585314619), Lozano, Manuel [Univ. of Puerto Rico, Mayaguez, PR (United States)], Camino, Fernando [Brookhaven National Laboratory (BNL), Upton, NY (United States). Center for Functional Nanomaterials (CFN)] (ORCID:0000000305752976), Rodríguez-Solís, Rafael A. [Univ. of Puerto Rico, Mayaguez, PR (United States)], Rúa, Armando [Univ. of Puerto Rico, Mayaguez, PR (United States)] (ORCID:000000020962371X). 2025-06-17. High-frequency electrical behavior in V 3 O 5 thin films. https://doi.org/10.1063/5.0268450

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36 MATERIALS SCIENCE↗