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DOE OSTI · 2575350

Thickness-dependent polaron crossover in tellurene

Zhang, Kunyan [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States); Univ. of California, Berkeley, CA (United States)] (ORCID:000000026830409X)·Fu, Chuliang [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] (ORCID:0000000346269622)·Kelly, Shelly [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:000000018996628X)·Liang, Liangbo [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:0000000311990049)·Kang, Seoung-Hun [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000192679038)·Jiang, Jing [Purdue Univ., West Lafayette, IN (United States)] (ORCID:0009000483815500)·Zhang, Ruifang [Purdue Univ., West Lafayette, IN (United States)]·Wang, Yixiu [Purdue Univ., West Lafayette, IN (United States)]·Wan, Gang [Stanford Univ., CA (United States)] (ORCID:0000000316585376)·Siriviboon, Phum [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)]·Yoon, Mina [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000213173301)·Ye, Peide D. [Purdue Univ., West Lafayette, IN (United States)] (ORCID:0000000184669745)·Wu, Wenzhuo [Purdue Univ., West Lafayette, IN (United States)] (ORCID:0000000303626650)·Li, Mingda [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] (ORCID:0000000270556368)·Huang, Shengxi [Rice Univ., Houston, TX (United States)] (ORCID:0000000236189074)
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Abstract

Polarons, quasiparticles from electron-phonon coupling, are crucial for material properties including high-temperature superconductivity and colossal magnetoresistance. However, scarce studies have investigated polaron formation in low-dimensional materials with phonon polarity and electronic structure transitions. In this work, we studied polarons of tellurene, composed of chiral Te chains. The frequency and linewidth of the A 1 phonon, which becomes increasingly polar for thinner tellurene, change abruptly for thickness below 10 nanometers, where field-effect mobility drops rapidly. These phonon and transport signatures, combined with phonon polarity and band structure, suggest a crossover from large polarons in bulk tellurium to small polarons in few-layer tellurene. Effective field theory considering phonon renormalization in the small-polaron regime semiquantitatively reproduces the phonon hardening and broadening effects. This polaron crossover stems from the quasi–one-dimensional nature of tellurene, where modulation of interchain distance reduces dielectric screening and promotes electron-phonon coupling. Our work provides valuable insights into the influence of polarons on phononic, electronic, and structural properties in low-dimensional materials.

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Zhang, Kunyan [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States); Univ. of California, Berkeley, CA (United States)] (ORCID:000000026830409X), Fu, Chuliang [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] (ORCID:0000000346269622), Kelly, Shelly [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:000000018996628X), Liang, Liangbo [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:0000000311990049), Kang, Seoung-Hun [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000192679038), Jiang, Jing [Purdue Univ., West Lafayette, IN (United States)] (ORCID:0009000483815500), Zhang, Ruifang [Purdue Univ., West Lafayette, IN (United States)], Wang, Yixiu [Purdue Univ., West Lafayette, IN (United States)], Wan, Gang [Stanford Univ., CA (United States)] (ORCID:0000000316585376), Siriviboon, Phum [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)], Yoon, Mina [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000213173301), Ye, Peide D. [Purdue Univ., West Lafayette, IN (United States)] (ORCID:0000000184669745), Wu, Wenzhuo [Purdue Univ., West Lafayette, IN (United States)] (ORCID:0000000303626650), Li, Mingda [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] (ORCID:0000000270556368), Huang, Shengxi [Rice Univ., Houston, TX (United States)] (ORCID:0000000236189074). 2025-01-08. Thickness-dependent polaron crossover in tellurene. https://doi.org/10.1126/sciadv.ads4763

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