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DOE OSTI · 2575502

Calculation of rf-induced temporal jitter in ultrafast electron diffraction

Abstract

A significant contribution to the temporal resolution of an ultrafast electron diffraction (UED) instrument is arrival time jitter caused by amplitude and phase variation of radio-frequency (rf) cavities. In this paper, we present a semianalytical approach for calculating rf-induced temporal jitter from klystron and rf cavity parameters. Our approach allows fast estimation of temporal jitter for MeV-UED beamlines and can serve as a virtual timing tool when shot-to-shot measurements of rf amplitude and phase jitters are available. A simulation study for the SLAC MeV-UED instrument is presented, and the temporal resolution of several beamline configurations is compared.

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BibTeXRIS

Xu, T. [SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)] (ORCID:0000000249777561), Ji, F. [SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)] (ORCID:0009000396016233), Duncan, C. J. R. [SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)], Weathersby, S. P. [SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)], England, R. J. [SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)] (ORCID:0000000340930213). 2025-02-05. Calculation of rf-induced temporal jitter in ultrafast electron diffraction. https://doi.org/10.1103/physrevaccelbeams.28.024001

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