DOE OSTI · 2579872
Confidence-Aware Graph Neural Networks for Learning Reliability Assessment Commitments
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Park, Seonho (ORCID:0000000247262441), Chen, Wenbo (ORCID:0000000257126101), Han, Dahye, Tanneau, Mathieu (ORCID:0000000299670578), Van Hentenryck, Pascal (ORCID:0000000170859994). 2024-03-01. Confidence-Aware Graph Neural Networks for Learning Reliability Assessment Commitments. https://doi.org/10.1109/tpwrs.2023.3298735
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