DOE OSTI · 2580016
XT race : Making the Most of Every Sample in Stochastic Trace Estimation
Abstract
Not provided.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Epperly, Ethan (ORCID:0000000307128296), Tropp, Joel (ORCID:0000000310241791), Webber, Robert (ORCID:0000000182866315). 2024-01-03. XT race : Making the Most of Every Sample in Stochastic Trace Estimation. https://doi.org/10.1137/23m1548323
Cite the original work for its findings. Save a collection to share your selection of sources.