DOE OSTI · 2584526
Stacking polymorphism of PtSe 2 : its implication to layer-dependent metal-insulator transitions
Abstract
Using diffusion Monte Carlo (DMC) and density functional theory (DFT) calculations, we examine the structural stability and interlayer binding properties of PtSe 2 . Our DMC study reveals that AA and AB-r bilayer stacking modes are nearly degenerate, highlighting the significant role of interlayer hybridization in offsetting the energy cost due to larger interlayer separations in the AB-r mode. Additionally, our DMC-benchmarked DFT calculations with the r 2 SCAN+rVV10 functional uncover pronounced stacking polymorphism in few-layer PtSe 2 , driven by degenerate AA and AB-r interfaces, which leads to substantial band gap variations across different stacking configurations. This polymorphism, along with selenium vacancies, influences a layer-dependent metal-insulator transition observed in few-layer PtSe 2 . Our findings emphasize the importance of both van der Waals interactions and interlayer hybridization in determining the phase stability and electronic properties of PtSe 2 , advancing our understanding of its fundamental properties and refining theoretical models for practical applications in nanoelectronic devices.
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Ahn, Jeonghwan [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States); Konkuk University, Seoul (Korea, Republic of)] (ORCID:0000000310414680), Hong, Iuegyun [Konkuk University, Seoul (Korea, Republic of)] (ORCID:0000000300600156), Lee, Gwangyoung [Konkuk University, Seoul (Korea, Republic of)] (ORCID:0000000323629023), Shin, Hyeondeok [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000169330989), Benali, Anouar [Argonne National Laboratory (ANL), Argonne, IL (United States)], Kwon, Yongkyung [Konkuk University, Seoul (Korea, Republic of)], Krogel, Jaron T. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000000021859181X). 2025-04-30. Stacking polymorphism of PtSe 2 : its implication to layer-dependent metal-insulator transitions. https://doi.org/10.1038/s41699-025-00544-6
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