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DOE OSTI · 2585639

Mapping of fracture and ionic conductivity changes in ion implanted solid electrolytes: Insights from molecular dynamics

Abstract

Ion implantation emerges as a promising technique to address the persistent challenge of lithium (Li) filament growth in solid-state electrolytes as it can induce compressive stresses inhibiting crack growth and deflect dendrites, de facto mitigating early electrolyte failure. In this study, we examine the potential paradox of ion implantation: while aiming to enhance electrolyte performance, the radiation damage associated with implantation might inadvertently compromise both the ionic conductivity and the intrinsic fracture toughness of the material, rendering the material unsuitable for battery applications. Specifically, we employed molecular dynamics simulations to examine the scope of the downsides of ion implantation, specifically: (i) reduced ionic conductivity (due to radiation-induced amorphization) and (ii) mechanical stability (due to radiation-induced embrittlement) in ion-implanted Li 7 La 3 Zr 2 O 12 (LLZO) solid-state electrolytes. We explore how radiation damage impacts LLZO’s crystalline structure, Li-ion diffusion, and fracture properties at various temperatures and radiation damage levels. The study aims to provide insights into the competing effects of ion implantation and suggest potential engineering strategies for developing more robust solid-state electrolytes with improved conductivity and dendrite resistance.

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BibTeXRIS

Monismith, Scott Quinlan [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000168331699), McBrayer, Josefine Desiree [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)], Dingreville, Rémi Philippe Michel [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States). Center for Integrated Nanotechnologies] (ORCID:000000031613695X). 2025-07-26. Mapping of fracture and ionic conductivity changes in ion implanted solid electrolytes: Insights from molecular dynamics. https://doi.org/10.1016/j.jpowsour.2025.237881

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