DOE OSTI · 2586015
Using ion beam irradiation as a surrogate for neutron displacement damage in microelectronics: Simple theory and equivalency considerations
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Young, Joshua Michael, Bielejec, Edward Salvatore, Asper, Nicholas Anthony, Wampler, William R., Vizkelethy, Gyorgy. 2024-07-01. Using ion beam irradiation as a surrogate for neutron displacement damage in microelectronics: Simple theory and equivalency considerations. https://doi.org/10.2172/2586015
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