DOE OSTI · 2588333
Voltage-Controlled Magnetic Tunnel Junctions Demonstrate Resilience to Displacement Damage
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Bennett, Christopher, Hughart, David Russell, Bielejec, Edward Salvatore, Xiao, Tianyao Patrick, Young, Joshua Michael, Arzate, Jared Daniel, Athas, Jordan, Khalili amiri, Pedram, Shao, Yixin, Katti, Romney. 2024-09-01. Voltage-Controlled Magnetic Tunnel Junctions Demonstrate Resilience to Displacement Damage. https://doi.org/10.2172/2588333
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