DOE OSTI · 2998649
Towards Portable Laser Desorption Postionization Mass Spectrometry Utilizing Microchip Laser Pulses
Abstract
A 355 nm, 1.5 ns, up to 1 kHz microchip laser system has been tested to both yield ablation spots and postionize material within a plasma plume. A 30 µJ pulse energy microchip laser successfully ablated all samples: 6601 aluminum, 316 and 304 stainless steel, and Mo metal. While visible ablation craters were observed on all samples mentioned above, the stainless-steel samples displayed visible color changes in the resolidified iron, indicating ionization with the 355 nm pulses during ablation. Additionally, when used to intercept a plasma plume of Cs 2 CO 3 made with a separate laser system, the microchip laser pulses yielded Cs + emission signal otherwise not observed. With these experiments completed, the microchip laser has been successfully verified for readiness to be integrated into the front end of a mass spectrometer system as the ion source.
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Gross, J. [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000272527245), Bettinardi, D. [Argonne National Laboratory (ANL), Argonne, IL (United States)], Condon, N. [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000155834852). 2025-09-01. Towards Portable Laser Desorption Postionization Mass Spectrometry Utilizing Microchip Laser Pulses. https://doi.org/10.2172/2998649
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