Search NASA⌕ Search

DOE OSTI · 2999943

Geometry-aware framework for deep energy method: An application to structural mechanics with hyperelastic materials

Abstract

Here, in this work, we introduce a novel physics-informed framework named the Geometry-Aware Deep Energy Method (GADEM) for solving structural mechanics problems on different geometries. As the weak form of the physical system equation (or the energy-based approach) has demonstrated clear advantages compared to the strong form for solving solid mechanics problems, GADEM employs the weak form and aims to infer the solution on multiple shapes of geometries. Integrating a geometry-aware framework into an energy-based method results in an effective physics-informed deep learning model in terms of accuracy and computational cost. Different ways to represent the geometric information and to encode the geometric latent vectors are investigated in this work. We introduce a loss function of GADEM which is minimized based on the potential energy of all considered geometries. An adaptive learning method is also employed for the sampling of collocation points to enhance the performance of GADEM. We present some applications of GADEM to solve solid mechanics problems, including a loading simulation of a toy tire involving contact mechanics and large deformation hyperelasticity. The numerical results of this work demonstrate the remarkable capability of GADEM to infer the solution on various and new shapes of geometries using only one trained model.

Explore related subjects

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Nguyen, Thi Nguyen Khoa [École Normale Supérieure (ENS) Paris-Saclay, Gif-sur-Yvette (France); Michelin, Cébazat (France); CEA, DAM, DIF, Arpajon (France); Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] (ORCID:0000000208347186), Dairay, Thibault [École Normale Supérieure (ENS) Paris-Saclay, Gif-sur-Yvette (France); Michelin, Cébazat (France)], Meunier, Raphaël [Michelin, Cébazat (France)], Di Stasio, Jean [Michelin, Cébazat (France)], Millet, Christophe [École Normale Supérieure (ENS) Paris-Saclay, Gif-sur-Yvette (France); CEA, DAM, DIF, Arpajon (France)], Mougeot, Mathilde [École Normale Supérieure (ENS) Paris-Saclay, Gif-sur-Yvette (France); École Nationale Supérieure d'Informatique pour l'Industrie et l'Entreprise (EnsIIE), Évry-Courcouronnes (France)]. 2025-07-24. Geometry-aware framework for deep energy method: An application to structural mechanics with hyperelastic materials. https://doi.org/10.1016/j.cpc.2025.109757

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related reports

TANTE: Time-adaptive operator learning via neural Taylor expansion

Operator learning for time-dependent partial differential equations (PDEs) has seen rapid progress in recent years, enabling efficient approximation of complex spatiotemporal dynamics. However, most existing methods rely on fixed time step sizes during rollout, which limits their ability to adapt to varying temporal complexity and often leads to error accumulation. In this work, we propose the Time-Adaptive Transformer with Neural Taylor Expansion (TANTE), a novel operator-learning framework that produces continuous-time predictions with adaptive step sizes. TANTE predicts future states by performing a Taylor expansion at the current state, where neural networks learn both the higher-order temporal derivatives and the local radius of convergence. This allows the model to dynamically adjust its rollout based on the local behavior of the solution, thereby reducing cumulative error and improving computational efficiency. We demonstrate the effectiveness of TANTE across a wide range of PDE benchmarks, achieving superior accuracy and adaptability compared to fixed-step baselines, delivering accuracy gains of 60-80 % and speed-ups of 30-40 % at inference time.

97 MATHEMATICS AND COMPUTING↗

Structured illumination for surface-resolved grazing-incidence X-ray scattering

Grazing-incidence (GI) scattering techniques are widely used to characterize thin films, offering high surface sensitivity and insight into morphology and structure. However, these approaches typically provide statistical averaged information due to elongated footprint or limited spatial resolution due to beam size. Here we introduce a method that combines structured illumination with GI X-ray scattering and leverages our computational imaging approach to resolve local structural details. We demonstrate that our method captures local features of an organic semiconductor thin film without the need for sample rotation as in tomography. The method expands GI techniques from statistical averaging to high-resolution imaging, thereby providing the capability for detailed analysis of local material properties, such as domain shape, orientation and polymorphism, which are critical for advancing material design towards more efficient and tailored materials.

97 MATHEMATICS AND COMPUTING↗