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DOE OSTI · 3001106

Evaluating Variable-Impedance Magnetically-Insulated Transmission Lines as a Risk-Mitigation Measure for Next-Generation Pulsed Power

Abstract

This project has produced the first detailed characterizations of power flow resulting from applying the “variable-impedance MITL” concept to real-life systems in Sandia’s pulsed power program (Z and next-generation pulsed power (NGPP)). We present simulation results and analyses for constant-impedance versions of both Z and NGPP and survey the operational viability of several variable-impedance re-designs in the parameter space of linear tapers. Circuit modeling (SCREAMER/Bertha) was used to pinpoint promising candidate designs, and EM-PIC (Empire) simulations were used to evaluate these candidates more rigorously. This approach was particularly successful in the Z regime which resulted in the identification of several viable variable-impedance MITL designs for each level. The approach was more challenged in the operating space NGPP occupies, producing data points that speak to a more restrictive design space due to anode plasma turn-on. In the end, we were able to converge on one viable variable-impedance design for the highest inductance line (level “F”) and one for the highest current line (level “A”). Altogether, the body of simulation evidence presented in this report suggest there does exist flexibility in operating space for magnetically-insulated transmission lines (MITLs) having variable geometric impedance to be a potential enabling technology for safely increasing current delivery (and potentially lowering stack voltage) in pulsed-power drivers by manipulating electron losses; however, operating points for a particular design must be carefully screened. Circuit and EM-PIC modeling provided consistent verdicts in safe operating regimes for operational viability, but additional physics such as anode plasma turn-on which is included in Empire but not in SCREAMER/Bertha was found to be a critical factor affecting power flow that lead to different assessments between the codes. It is not always the case that the occurrence of anode plasma caused a design to fail (some designs turned on anode plasma yet still delivered load currents meeting design targets); the details matter such as how early in the pulse anode surfaces break down (and how large a region). However, in every case that it did fail it was found that the feedback from anode plasma was the cause (i.e., turning off the anode plasma model in Empire restored agreement with the circuit model prediction). As circuit simulations represent an efficient and practical means of surveying design space compared to more computationally-expensive approaches such as EM-PIC, it could be prudent to invest in the research and development of models to include the effects of anode plasma such as ion emission in circuit codes. The variable-impedance MITL design is a new concept that enables controlled manipulation of the initial electron losses in the outer MITL and can be tested on Z today. We encourage follow-on work to explore further optimization (including alternative variable-impedance profiles, e.g., having constant dZ/dR), and to confirm the major findings presented in this report by fielding test hardware on actual Z shots.

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BibTeXRIS

Sirajuddin, David [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000213496258), Shapovalov, Roman [Univ. of Rochester, NY (United States)], Hutsel, Brian Thomas [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000163831184), Evstatiev, Evstati Georgiev [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)], Darr, Adam [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000245911639), Cartwright, Keith [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:000000032075200X). 2025-10-26. Evaluating Variable-Impedance Magnetically-Insulated Transmission Lines as a Risk-Mitigation Measure for Next-Generation Pulsed Power. https://doi.org/10.2172/3001106

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