DOE OSTI · 3007962
Guided combinatorial synthesis, high-throughput characterization and machine learning expedite discovery of improved Pt-Au thin films
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Adams, David P. [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000216775439), Kothari, Rishabh Satya [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)], Shilt, Troy Patrick [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)], Desai, Saaketh [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)], Sobczak, Catherine Elizabeth [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)], Custer, Joyce Olsen [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)], Kalaswad, Matias [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)], Dorman, Kyle Rhys [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000195897954), Addamane, Sadhvikas Jayachandra [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000252387409), Bianco, Nathan Robert [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0009000183029989), Jain, Manish [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)], Fowler, James Elliott [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000225181018), DelRio, Frank William [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000317278220), Rodriguez, Mark Andrew [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000269405044), Martinez, Carianne [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)], Dingreville, Remi Philippe Michel [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:000000031613695X), Boyce, Brad Lee [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000159941743). 2024-12-01. Guided combinatorial synthesis, high-throughput characterization and machine learning expedite discovery of improved Pt-Au thin films. https://doi.org/10.2172/3007962
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