DOE OSTI · 3008782
Reconstruction of 2D line-integrated electron density using angular filter refractometry and a fast marching Eikonal solver
Abstract
Refraction of an optical probe beam by a plasma can be measured with angular filter refractometry (AFR), which produces an image of the beam’s 2D spatial profile that contains intensity contours corresponding to curves of constant refraction angle. Further analysis is required to reconstruct the underlying line-integrated electron density. Most prior efforts to calculate density from AFR data have been limited to 1D analysis or forward-fitting techniques. Here, in this paper, we detail the use of a fast-marching Eikonal solver to directly invert AFR data and obtain the full 2D line-integrated electron density. The analysis method is first verified with synthetic data and then applied to experimental measurements of single and colliding plasma plumes collected at the OMEGA EP Laser Facility. The calculated densities agree with 1D results and are shown to be consistent with the original AFR measurements via forward modeling. We also discuss ways to improve the precision of this technique.
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McCluskey, B. [Princeton Univ., NJ (United States); Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States)] (ORCID:0009000618670020), Griff-McMahon, J. [Princeton Univ., NJ (United States); Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States)] (ORCID:0000000207740613), Haberberger, D. [Univ. of Rochester, NY (United States). Laboratory for Laser Energetics] (ORCID:0000000259090149), Valenzuela-Villaseca, V. [Princeton Univ., NJ (United States)] (ORCID:0000000167721441), Landsberger, H. [Princeton Univ., NJ (United States); Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States)] (ORCID:0000000278001391), Fox, W. [Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States); Univ. of Maryland, College Park, MD (United States)] (ORCID:000000016289858X). 2025-12-03. Reconstruction of 2D line-integrated electron density using angular filter refractometry and a fast marching Eikonal solver. https://doi.org/10.1063/5.0295850
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