DOE OSTI · 3009502
The Measurement of Grain Size by Electron Beam Backscattered Diffraction
Abstract
The method of electron back-scatter diffraction provides an analytic means to identify crystalline phase and the grain size of structural materials. The need to utilize imaging parameters consistent with revealing the contributing microstructural scale is often overlooked through packaged imaging scripts. It is shown that imaging parameters consistent with a post processing assessment of low misorientation angles between boundaries are achievable as using pixel sizes on the order of 10 1 nm.
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Jankowski, Alan F. [Sandia National Laboratories (SNL-CA), Livermore, CA (United States)] (ORCID:0000000317816957), Rogers, Meghan Joan [Sandia National Laboratories (SNL-CA), Livermore, CA (United States)] (ORCID:0009000558170090), Yee, Joshua Keng [Sandia National Laboratories (SNL-CA), Livermore, CA (United States)]. 2025-12-01. The Measurement of Grain Size by Electron Beam Backscattered Diffraction. https://doi.org/10.2172/3009502
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