DOE OSTI · 3017623
Impulse Response Functions for Characterizing Pulse-to-Pulse Junction Temperature Behavior in Laser Diode Pulse Trains
Abstract
A method is proposed for determination of the pulse-to-pulse variation in junction temperature and emission wavelength of a semiconductor laser diode during a train of pulses. Here, this approach, based on impulse response functions, enables predictions for pulse trains with arbitrary pulse-to-pulse variations in output power, pulse width, and pulse delay using a limited set of experimental characterization data. The use of this approach is illustrated by application to a particular device structure.
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Deri, Robert J. [Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)], Li, Jiang [Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)], Patra, S. K. [Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)], Fenwick, William E. [Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)] (ORCID:000900058479071X), Pope, David L. [Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)], Boisselle, Matthew C. [Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)] (ORCID:0000000187377983), Dutra, David M. [Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)], Martin, Logan [Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)], Gilmore, Laina V. [Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)]. 2025-09-10. Impulse Response Functions for Characterizing Pulse-to-Pulse Junction Temperature Behavior in Laser Diode Pulse Trains. https://doi.org/10.1109/jqe.2025.3608638
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