DOE OSTI · 3019768
All hard X-ray transient grating spectroscopy
Abstract
Optical-domain transient grating (TG) spectroscopy is the ideal tool to investigate transport phenomena in gases, liquids and solids, but it is limited to typically micron-size grating periods. Extreme-Ultraviolet TG has represented a major leap forward to access the mesoscopic scales. Hard X-ray TGs open access in principle to the nanoscale. Hard X-ray TGs were recently generated using the Talbot effect and probed by optical pulses, but these hinder exploiting the advantages of the nanoscale gratings. Here, we present an all-X-ray TG study, in which few-femtosecond hard X-ray pulses are used both for excitation and probing. Our experiment was performed on an amorphous film of an FeGd alloy and on a thin silicon single crystal. The results show a manifestation of the TG induced by the X-ray pump and probe pulses in the form of Talbot carpets, as well as temporal evolution of the grating in crystalline silicon showing coherent optical phonons. Ultrafast all-X-ray TG spectroscopy has the potential to study fundamental excitations with femtosecond time resolution and nanometer spatial sensitivity.
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Ferrari, Eugenio [Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Paul Scherrer Inst. (PSI), Villigen (Switzerland)] (ORCID:0000000210825984), Ueda, Hiroki [Paul Scherrer Inst. (PSI), Villigen (Switzerland)] (ORCID:0000000153057930), Fainozzi, Danny [Univ. of Bern (Switzerland)] (ORCID:0000000173808324), Osaka, Taito [RIKEN SPring-8 Center, Sayo (Japan)] (ORCID:0000000305459737), Bencivenga, Filippo [Elettra Sincrotrone Trieste S.C.p.A. (Italy)], Burian, Max [DECTRIS Ltd., Baden-Daettwil (Switzerland)], Carrara, Pietro [Univ. degli Studi di Milano (Italy); Consiglio Nazionale delle Ricerche (CNR), Milano (Italy). Istituto Officina dei Materiali (CNR-IOM)] (ORCID:0000000219377591), Vila-Comamala, Joan [Paul Scherrer Inst. (PSI), Villigen (Switzerland)] (ORCID:0000000215433146), Cucini, Riccardo [Consiglio Nazionale delle Ricerche (CNR), Milano (Italy). Istituto Officina dei Materiali (CNR-IOM)] (ORCID:0000000185161409), David, Christian [Paul Scherrer Inst. (PSI), Villigen (Switzerland)] (ORCID:0000000229531265), Gessini, Alessandro [Elettra Sincrotrone Trieste S.C.p.A. (Italy)], Gerber, Simon [Paul Scherrer Inst. (PSI), Villigen (Switzerland)] (ORCID:0000000257172626), Goloborodko, Andrii [PWGP Labs, Bucha (Ukraine)] (ORCID:0000000245506457), Hrabec, Ales [Paul Scherrer Inst. (PSI), Villigen (Switzerland); Eidgenoessische Technische Hochschule (ETH), Zurich (Switzerland)] (ORCID:0000000228951962), Inoue, Ichiro [RIKEN SPring-8 Center, Sayo (Japan)] (ORCID:0009000804231347), Inubushi, Yuichi [RIKEN SPring-8 Center, Sayo (Japan); Japan Synchrotron Radiation Research Institute, Sayo, Hyogo (Japan)], Diniz Leroy, Ludmila M. [Paul Scherrer Inst. (PSI), Villigen (Switzerland); DECTRIS Ltd., Baden-Daettwil (Switzerland)], Mincigrucci, Riccardo [Elettra Sincrotrone Trieste S.C.p.A. (Italy)] (ORCID:0000000163436256), Paris, Eugenio [Paul Scherrer Inst. (PSI), Villigen (Switzerland)] (ORCID:0000000234188828), Pedrini, Bill [Paul Scherrer Inst. (PSI), Villigen (Switzerland)] (ORCID:0000000342287874), Roesner, Benedikt [Paul Scherrer Inst. (PSI), Villigen (Switzerland)] (ORCID:0000000187655904), Rouxel, Jérémy R. [Argonne National Laboratory (ANL), Argonne, IL (United States)], Serrat, Carles [Polytechnic Univ. of Catalonia, Barcelona (Spain)] (ORCID:0000000295281938), Scagnoli, Valerio [Paul Scherrer Inst. (PSI), Villigen (Switzerland); Eidgenoessische Technische Hochschule (ETH), Zurich (Switzerland)] (ORCID:0000000281168870), Tono, Kensuke [RIKEN SPring-8 Center, Sayo (Japan); Japan Synchrotron Radiation Research Institute, Sayo, Hyogo (Japan)] (ORCID:0000000312183759), Yabashi, Makina [RIKEN SPring-8 Center, Sayo (Japan); Japan Synchrotron Radiation Research Institute, Sayo, Hyogo (Japan)] (ORCID:0000000224721684), Yamada, Jumpei [RIKEN SPring-8 Center, Sayo (Japan); Osaka Univ. (Japan)] (ORCID:0000000254764327), Yamamoto, Kohei [Institute for Molecular Science (IMS), Okazaki, Aichi (Japan); National Inst. for Quantum Science and Technology (QST), Sendai (Japan)], Zdora, Marie Christine [Paul Scherrer Inst. (PSI), Villigen (Switzerland)], Beye, Martin [Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Stockholm Univ. (Sweden)] (ORCID:0000000239242993), Masciovecchio, Claudio [Elettra Sincrotrone Trieste S.C.p.A. (Italy)] (ORCID:0000000285713522), Chergui, Majed [Elettra Sincrotrone Trieste S.C.p.A. (Italy); Ecole Polytechnique Federale Lausanne (EPFL) (Switzerland)] (ORCID:000000024856226X), Staub, Urs [Paul Scherrer Inst. (PSI), Villigen (Switzerland)] (ORCID:0000000320353367), Svetina, Cristian [Paul Scherrer Inst. (PSI), Villigen (Switzerland); Ciudad Univ. de Cantoblanco, Madrid (Spain); European XFEL, Schenefeld (Germany)] (ORCID:0000000323994426). 2025-06-18. All hard X-ray transient grating spectroscopy. https://doi.org/10.1038/s42005-025-02178-y
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