Deep Learning Super-Resolution X-Ray Computed Tomography Algorithms for Additive Manufacturing

Abstract

Industrial X-ray computed tomography (XCT) is a nondestructive method for inspection and characterization of additively manufactured (AM) materials and parts. In practice, the resolution of XCT can be limited by factors such as detector binning, restricted field of view for large-scale objects, system blur, motion during scanning, and acquisition settings. These limitations can reduce the detectability of critical flaws such as pores, cracks, and lack of fusion. Super-resolution (SR) techniques offer a promising solution for improving the effective resolution and image quality of XCT reconstructions without the need for expensive hardware upgrades or laborious, time-consuming scans. In particular, deep learning-based SR methods have garnered attention in recent years as powerful tools for reconstructing high-resolution volumes from low-resolution inputs. In this work, a novel deep learning-based SR method is proposed for XCT scans of AM parts, and compared against several existing state-of-the-art (SOTA) methods. The proposed method, Simurgh-SR, is built on the pre-existing Simurgh framework and consists of a 2.5D U-Net trained to map low-quality inputs containing noise and artifacts to high-quality reconstructions characterized by higher flaw contrast, better noise texture, and reduced artifacts. The experimental results demonstrate superior performance of Simurgh-SR in performing 4× SR on real industrial XCT scans of thick 316L components, enhancing the structural similarity score and peak signal-to-noise ratio (>7dB) compared to the LR counterpart while improving the F1-score for flaw detection by more than 2.3× when compared to alternative SOTA SR methods. This improvement enables more accurate and significantly faster characterization of metal AM components. Additionally, Simurgh-SR was trained for both 2X and 4X SR and performs effectively at both levels, enabling the use of a single model for various SR factors.