Calibration of Elastoplastic Constitutive Model Parameters with Numerically-Exact Sensitivities

Seidl, Daniel Thomas [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000245792676); Yan, Ryan [University of California, Berkeley]; Granzow, Brian Neal [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000284523129); Papadopoulos, Panayiotis [University of California, Berkeley]

doi:10.2172/3022179

DOE OSTI · 3022179

Calibration of Elastoplastic Constitutive Model Parameters with Numerically-Exact Sensitivities

Seidl, Daniel Thomas [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000245792676)·Yan, Ryan [University of California, Berkeley]·Granzow, Brian Neal [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000284523129)·Papadopoulos, Panayiotis [University of California, Berkeley]

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Seidl, Daniel Thomas [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000245792676), Yan, Ryan [University of California, Berkeley], Granzow, Brian Neal [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000284523129), Papadopoulos, Panayiotis [University of California, Berkeley]. 2025-03-01. Calibration of Elastoplastic Constitutive Model Parameters with Numerically-Exact Sensitivities. https://doi.org/10.2172/3022179

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