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DOE OSTI · 3022844

Advancing Battery Manufacturing: Synchrotron Characterization for Industry

Koh, Hyeongjun [Princeton University, NJ (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0009000121223911)·Burrow, James N. [Argonne National Laboratory (ANL), Argonne, IL (United States); University of Chicago, IL (United States)] (ORCID:0000000274453788)·D’Anna, Nicolò [Argonne National Laboratory (ANL), Argonne, IL (United States); University of California San Diego, La Jolla, CA (United States)] (ORCID:0000000159537521)·Zhang, Haozhe [Argonne National Laboratory (ANL), Argonne, IL (United States); University of Chicago, IL (United States)]·Beatriceveena, Tharigopala Vincent [Argonne National Laboratory (ANL), Argonne, IL (United States); University of Chicago, IL (United States)]·Wang, Jiaqi [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:000000031176704X)·Lai, Jianwei [Argonne National Laboratory (ANL), Argonne, IL (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)] (ORCID:0000000158411134)·Chen, Yiming [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000215015550)·Cabana, Jordi [Argonne National Laboratory (ANL), Argonne, IL (United States); University of Chicago, IL (United States)]·Chan, Maria K. Y. [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000309221363)·Crumlin, Ethan J. [Argonne National Laboratory (ANL), Argonne, IL (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)] (ORCID:000000033132190X)·Fenter, Paul A. [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000266729748)·Fister, Timothy T. [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000165376170)·Liu, Di-Jia [Argonne National Laboratory (ANL), Argonne, IL (United States); University of Chicago, IL (United States)] (ORCID:000000031747028X)·Meng, Ying Shirley [Argonne National Laboratory (ANL), Argonne, IL (United States); University of Chicago, IL (United States); University of California San Diego, La Jolla, CA (United States)] (ORCID:0000000189368845)·Shpyrko, Oleg [Argonne National Laboratory (ANL), Argonne, IL (United States); University of California San Diego, La Jolla, CA (United States)]·Wiaderek, Kamila [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000200513661)·Hatzell, Kelsey B. [Princeton University, NJ (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000252227288)
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Abstract

Large-scale battery manufacturing requires understanding the fundamental principles of materials and interfaces and relies on advanced techniques for detailed interrogation. Despite advancements in the industrial scale production and their associated quality control tools, challenges such as electrode heterogeneity, internal defects, and largescale material waste (e.g., scrap) can hamper manufacturing. Synchrotron X-ray characterization techniques offer spatial, temporal, and chemical resolution that can provide diagnostic insights for metrology across various manufacturing steps. This review examines the use of synchrotron tools to advance understanding of key steps in the battery manufacturing process. Recent examples demonstrate how synchrotron methods resolve manufacturing challenges and uncover degradation pathways that are otherwise inaccessible. Future directions for advancing battery manufacturing emphasize collaboration between academia and industry through the use of synchrotron X-ray techniques.

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Koh, Hyeongjun [Princeton University, NJ (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0009000121223911), Burrow, James N. [Argonne National Laboratory (ANL), Argonne, IL (United States); University of Chicago, IL (United States)] (ORCID:0000000274453788), D’Anna, Nicolò [Argonne National Laboratory (ANL), Argonne, IL (United States); University of California San Diego, La Jolla, CA (United States)] (ORCID:0000000159537521), Zhang, Haozhe [Argonne National Laboratory (ANL), Argonne, IL (United States); University of Chicago, IL (United States)], Beatriceveena, Tharigopala Vincent [Argonne National Laboratory (ANL), Argonne, IL (United States); University of Chicago, IL (United States)], Wang, Jiaqi [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:000000031176704X), Lai, Jianwei [Argonne National Laboratory (ANL), Argonne, IL (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)] (ORCID:0000000158411134), Chen, Yiming [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000215015550), Cabana, Jordi [Argonne National Laboratory (ANL), Argonne, IL (United States); University of Chicago, IL (United States)], Chan, Maria K. Y. [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000309221363), Crumlin, Ethan J. [Argonne National Laboratory (ANL), Argonne, IL (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)] (ORCID:000000033132190X), Fenter, Paul A. [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000266729748), Fister, Timothy T. [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000165376170), Liu, Di-Jia [Argonne National Laboratory (ANL), Argonne, IL (United States); University of Chicago, IL (United States)] (ORCID:000000031747028X), Meng, Ying Shirley [Argonne National Laboratory (ANL), Argonne, IL (United States); University of Chicago, IL (United States); University of California San Diego, La Jolla, CA (United States)] (ORCID:0000000189368845), Shpyrko, Oleg [Argonne National Laboratory (ANL), Argonne, IL (United States); University of California San Diego, La Jolla, CA (United States)], Wiaderek, Kamila [Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000200513661), Hatzell, Kelsey B. [Princeton University, NJ (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)] (ORCID:0000000252227288). 2026-02-27. Advancing Battery Manufacturing: Synchrotron Characterization for Industry. https://doi.org/10.1021/acs.chemrev.5c00772

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