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DOE OSTI · 3364206

Dimensional Evolution Guides Property Control in the A n Cu 4– n TiS 4 Semiconductor Series

Abstract

Through progressive reduction of the three-dimensional (3D) covalent network of Cu 4 TiS 4 , we isolate seven new members of the A n Cu 4–n TiS 4 family (A = alkali metal; n = 0–4), spanning 3D, 2D, 1D, and 0D structural fragments. The dimensional reduction is rational, as it preserves the edge-sharing connectivity between [CuS 4 ] 7– and [TiS 4 ] 4– tetrahedra across the series. This structural evolution is driven by the stepwise substitution of Cu with alkali metals, guiding the formation of fragments with reduced dimensionality. The effects of “n” and “A” on the crystal structures, stabilities, electronic structures, and optoelectronic properties are profound, demonstrating that the manipulation of alkali metal size and A n Cu 4–n TiS 4 stoichiometry enables predictable variations in structure and properties. For example, the n = 0 and n = 4 end members of the A n Cu 4–n TiS 4 family set the range of achievable band gaps with 2.00 eV for Cu 4 TiS 4 , 2.60 eV for Na 4 TiS 4 , and intermediate values for the n = 1–3 members. Notably, CsCu 3 TiS 4 exhibits exceptional air stability and congruent melting, with density functional theory (DFT) calculating moderate hole and electron effective masses in specific crystallographic directions (mh = 1.24m 0 , me = 0.87m 0 ). Additionally, A 3 CuTiS 4 (A = Na, K, Rb) displays direct band gap behavior and long photoluminescence lifetimes of 2.3–8.6 μs, and K 3 CuTiS 4 has a PLQY of 5.19%. These findings underscore the potential of the A n Cu 4–n TiS 4 family for applications in optoelectronics and demonstrate widely applicable design concepts that unveil rational stoichiometries within a given composition space to generate a series of crystal structures related through an evolving covalent dimensionality that corresponds to a predictable electronic structure and property progression.

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BibTeXRIS

Viti, Michael A. [Northwestern Univ., Evanston, IL (United States)] (ORCID:0009000866679147), Li, Zhi [Northwestern Univ., Evanston, IL (United States)] (ORCID:000000030451567X), Liu, Zhifu [Northwestern Univ., Evanston, IL (United States)] (ORCID:0000000190871114), Wolverton, Christopher [Northwestern Univ., Evanston, IL (United States)] (ORCID:000000032248474X), Kanatzidis, Mercouri G. [Northwestern Univ., Evanston, IL (United States); Argonne National Laboratory (ANL), Lemont, IL (United States). Materials Science Division] (ORCID:0000000320374168). 2025-06-13. Dimensional Evolution Guides Property Control in the A n Cu 4– n TiS 4 Semiconductor Series. https://doi.org/10.1021/jacs.5c05985

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