Search NASASearch

DOE OSTI · 3377465

Cyber-Informed Engineering: Standards Development Organization Quick Start Guide

Abstract

Cyber-Informed Engineering (CIE) is an emerging methodology focused on identifying and reducing high-consequence events that may affect physical critical infrastructure systems as a result of their dependence on digital technology. CIE, developed by National Laboratories and promoted by the Department of Energy (DOE), incorporates consequence-focused planning into the design and engineering process from the earliest stages of a project. This guide provides a concise overview of CIE and offers practical insight into how Standards Development Organizations (SDOs) can interpret CIE principles and apply those concepts in updates to various standards. It is important to remember that CIE extends beyond a compliance checklist, emphasizing a broader, interpretive approach. Instead, it encourages an interpretive mindset - a "turning of 'what if' to 'even if'" approach that anticipates and engineers out high-consequence events. The authors encourage SDOs to establish and promote CIE principles as enhancements for more resilient-by-design outcomes across critical infrastructure energy sectors. The 12 core principles of CIE outline specific behaviors and actions that SDOs and engineers may adopt to enhance system resilience. This guide applies these principles in a manner intended to be relevant across various technologies and threat landscapes. We welcome institutions and vendors to identify new or different framework alignments and mappings as we collectively work towards a safer and more reliable digital landscape.

Explore related subjects

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

MaGill, Charles [National Renewable Energy Lab., Golden, CO (United States)], Hatic, Dana [National Renewable Energy Lab., Golden, CO (United States)], Martin, Maurice [National Renewable Energy Lab., Golden, CO (United States)], Lampe, Ben [Idaho National Laboratory (INL), Idaho Falls, ID (United States)], Turkaly, Ed [Idaho National Laboratory (INL), Idaho Falls, ID (United States)]. 2026-05-28. Cyber-Informed Engineering: Standards Development Organization Quick Start Guide. https://doi.org/10.66816/tp2402618

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related reports

TANTE: Time-adaptive operator learning via neural Taylor expansion

Operator learning for time-dependent partial differential equations (PDEs) has seen rapid progress in recent years, enabling efficient approximation of complex spatiotemporal dynamics. However, most existing methods rely on fixed time step sizes during rollout, which limits their ability to adapt to varying temporal complexity and often leads to error accumulation. In this work, we propose the Time-Adaptive Transformer with Neural Taylor Expansion (TANTE), a novel operator-learning framework that produces continuous-time predictions with adaptive step sizes. TANTE predicts future states by performing a Taylor expansion at the current state, where neural networks learn both the higher-order temporal derivatives and the local radius of convergence. This allows the model to dynamically adjust its rollout based on the local behavior of the solution, thereby reducing cumulative error and improving computational efficiency. We demonstrate the effectiveness of TANTE across a wide range of PDE benchmarks, achieving superior accuracy and adaptability compared to fixed-step baselines, delivering accuracy gains of 60-80 % and speed-ups of 30-40 % at inference time.

97 MATHEMATICS AND COMPUTING

Structured illumination for surface-resolved grazing-incidence X-ray scattering

Grazing-incidence (GI) scattering techniques are widely used to characterize thin films, offering high surface sensitivity and insight into morphology and structure. However, these approaches typically provide statistical averaged information due to elongated footprint or limited spatial resolution due to beam size. Here we introduce a method that combines structured illumination with GI X-ray scattering and leverages our computational imaging approach to resolve local structural details. We demonstrate that our method captures local features of an organic semiconductor thin film without the need for sample rotation as in tomography. The method expands GI techniques from statistical averaging to high-resolution imaging, thereby providing the capability for detailed analysis of local material properties, such as domain shape, orientation and polymorphism, which are critical for advancing material design towards more efficient and tailored materials.

97 MATHEMATICS AND COMPUTING