Search NASA⌕ Search

DOE OSTI · 3377549

A Fast, Accurate Prediction for System-Wide Damage Due to Dynamic Wind Loading

Abstract

The complex relationship between photovoltaic (PV) hardware configurations, overall system dynamics, and turbulent aerodynamic phenomena generates highly unsteady, non-uniform loads that can lead to damaging instabilities. These effects may result in glass breakage, cell cracking, and structural failures in frames and mounting systems, even under moderate wind conditions. Addressing industry concerns about premature system failures in field conditions deemed survivable, our research aims to develop a fast and accurate predictive model for system damage. This model integrates configurable hardware choices with advanced simulation tools to represent the overall system-specific dynamics effectively. Using this model, we predict responses under varying weather conditions and hardware setups, translating these predictions into pre-trained surrogate models capable of accurately identifying failure risks and rapidly testing new system hardening measures. In this presentation, we will showcase preliminary results in capturing system dynamics through our customizable library of PV hardware configurations. Additionally, we will highlight how these new tools build upon PVade's established wind load modeling capabilities and foster the development of advanced AI/ML surrogates for improving system robustness.

Explore related subjects

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Young, Ethan [National Laboratory of the Rockies, Golden, CO (United States)], Springer, Martin [National Laboratory of the Rockies, Golden, CO (United States)] (ORCID:000000016803108X), Stanislawski, Brooke [National Laboratory of the Rockies, Golden, CO (United States)] (ORCID:0000000331460053), Glaws, Andrew [National Laboratory of the Rockies, Golden, CO (United States)], He, Xin [National Laboratory of the Rockies, Golden, CO (United States)], Arsalane, Walid [National Laboratory of the Rockies, Golden, CO (United States)], Emes, Matthew [National Laboratory of the Rockies, Golden, CO (United States)] (ORCID:0000000341474387). 2026-06-12. A Fast, Accurate Prediction for System-Wide Damage Due to Dynamic Wind Loading. https://doi.org/10.66816/po4401772

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related reports

TANTE: Time-adaptive operator learning via neural Taylor expansion

Operator learning for time-dependent partial differential equations (PDEs) has seen rapid progress in recent years, enabling efficient approximation of complex spatiotemporal dynamics. However, most existing methods rely on fixed time step sizes during rollout, which limits their ability to adapt to varying temporal complexity and often leads to error accumulation. In this work, we propose the Time-Adaptive Transformer with Neural Taylor Expansion (TANTE), a novel operator-learning framework that produces continuous-time predictions with adaptive step sizes. TANTE predicts future states by performing a Taylor expansion at the current state, where neural networks learn both the higher-order temporal derivatives and the local radius of convergence. This allows the model to dynamically adjust its rollout based on the local behavior of the solution, thereby reducing cumulative error and improving computational efficiency. We demonstrate the effectiveness of TANTE across a wide range of PDE benchmarks, achieving superior accuracy and adaptability compared to fixed-step baselines, delivering accuracy gains of 60-80 % and speed-ups of 30-40 % at inference time.

97 MATHEMATICS AND COMPUTING↗

Structured illumination for surface-resolved grazing-incidence X-ray scattering

Grazing-incidence (GI) scattering techniques are widely used to characterize thin films, offering high surface sensitivity and insight into morphology and structure. However, these approaches typically provide statistical averaged information due to elongated footprint or limited spatial resolution due to beam size. Here we introduce a method that combines structured illumination with GI X-ray scattering and leverages our computational imaging approach to resolve local structural details. We demonstrate that our method captures local features of an organic semiconductor thin film without the need for sample rotation as in tomography. The method expands GI techniques from statistical averaging to high-resolution imaging, thereby providing the capability for detailed analysis of local material properties, such as domain shape, orientation and polymorphism, which are critical for advancing material design towards more efficient and tailored materials.

97 MATHEMATICS AND COMPUTING↗