Scaling Factors for Single Event Upsets with High Error Counts

Oldiges, Philip Joseph [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000289353894); Domme, Nicholas Andrew [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)]; Zedric, Robert Michael [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000158535735)

doi:10.2172/3378074

DOE OSTI · 3378074

Scaling Factors for Single Event Upsets with High Error Counts

Oldiges, Philip Joseph [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000289353894)·Domme, Nicholas Andrew [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)]·Zedric, Robert Michael [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000158535735)

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Oldiges, Philip Joseph [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000289353894), Domme, Nicholas Andrew [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)], Zedric, Robert Michael [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000158535735). 2025-07-01. Scaling Factors for Single Event Upsets with High Error Counts. https://doi.org/10.2172/3378074

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