DOE OSTI · 3382464
TCF Base Technology-Specific Final Report: Negative Cracked Film Lithography for PERC CdTe
Abstract
NLR worked with the world's leading thin-film photovoltaic manufacturer - First Solar, an American company - to develop electrical contacting methods that improve the power conversion efficiency of First Solar's cells by 0.5% absolute. We met this milestone but contrary to our hypothesis, these performance gains are not passivation (PERC)-based. Instead, we identified another mechanism by which our micropatterned Al 2 O 3 contacts improve efficiency. Using the results of this project, we will adapt NLR's cracked film lithography intellectual property (IP) toward the application we identified, which is a new route to commercialization.
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Muzzillo, Christopher P. [National Renewable Energy Laboratory (NREL), Golden, CO (United States)]. 2026-07-15. TCF Base Technology-Specific Final Report: Negative Cracked Film Lithography for PERC CdTe. https://doi.org/10.66816/tp2926006
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