DOE OSTI · 3385109
Tiny Tapeout Laser Scan
Abstract
Fault analysis of integrated circuits (ICs) is crucial for the understanding of the devices’ functionality. However, more traditional methods of probing and measuring signals are not possible for ICs due to their feature sizes going under the micron range.
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Dominguez Rodriguez, Ever Joaquin [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)], Fuentes, Luis Angel [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)]. 2025-08-01. Tiny Tapeout Laser Scan. https://doi.org/10.2172/3385109
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