DOE OSTI · 3389375
Evaluation of point defects as Charge Noise Sources in Semiconductor Quantum Dot Qubits
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Srivastava, Shivani [Lawrence Livermore National Laboratory], Lordi, Vincenzo [Lawrence Livermore National Laboratory], Varley, Joel [Lawrence Livermore National Laboratory]. 2026-07-28. Evaluation of point defects as Charge Noise Sources in Semiconductor Quantum Dot Qubits. https://doi.org/10.2172/3389375
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