DOE OSTI · 3407891
Flux trapping in NbTiN strips
Abstract
We use scanning superconducting quantum interference device (SQUID) microscopy to image vortices in superconducting structures fabricated from NbTiN thin films. We repeatedly cool superconducting strips with different width in an applied magnetic field and image the individual vortices. From these images we determine the threshold field at which the first vortex enters a strip and the number and configuration of vortices beyond this threshold field. We model the behavior of the vortices with and without considering the effect of pinning using numerical methods to minimize the Gibbs free energy of vortices in the strips. Our measurements provide a first benchmark to investigate the flux trapping properties of NbTiN thin films directly relevant to NbTiN-based superconducting digital circuits.
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Bai, Ruiheng [Cornell University] (ORCID:0000000253858372), Sepehri, Aliakbar [University of North Dakota] (ORCID:0009000539349909), Loh, Yen-Lee [University of North Dakota] (ORCID:0000000222222128), Valente-Feliciano, Anne-Marie [Thomas Jefferson National Accelerator Facility] (ORCID:0000000347806936), Herr, Anna [imec USA] (ORCID:0000000192470090), Herr, Quentin [imec USA] (ORCID:0000000268642603), Nowack, Katja C. [Cornell University] (ORCID:0000000205179279). 2026-07-29. Flux trapping in NbTiN strips. https://doi.org/10.1103/b9sm-nl9c
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