DOE OSTI · 3414047
Electrically Active Defect Localization using X-ray-Induced Voltage Alteration (XrIVA)
Abstract
Demonstration of failure analysis technique x-ray-induced voltage alteration for failure analysis of integrated circuits.
Keep this discovery
Explore connections, maps & timelines
Hernandez, Andrea Rodarte [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000196577178). 2025-11-01. Electrically Active Defect Localization using X-ray-Induced Voltage Alteration (XrIVA). https://www.osti.gov/biblio/3414047
Cite the original work for its findings. Save a collection to share your selection of sources.