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DOE OSTI · 3682448

Interfacial magnetization enhancement and the perpendicularly magnetized component in Fe16N2 thin films

Hang, Xudong [University of Minnesota]·T held, Jacob [University of Minnesota]·Lauter, Valeria [ORNL] (ORCID:0000000309896563)·Ambaye, Haile [ORNL] (ORCID:0000000281229952)·Mkhoyan, Andre [University of Minnesota]·Wang, Jian-Ping [University of Minnesota]
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Abstract

A detailed study of depth-resolved magnetization and microstructure of Fe16N2 thin films on MgO (001) and MgAl2O4 (001) substrates and Fe and Cr seed layers is presented. Two aspects of the magnetic properties of Fe16N2 thin films are discussed. First, magnetization enhancement at the interface is observed. Strain and nitrogen deficiency are discussed as possible interfacial mechanisms contributing to this enhancement. Second, the perpendicularly magnetized component (PMC) is identified in Fe16N2 thin films. Correlation with microstructural observations suggests that the PMC is associated with V-shaped grains that are not fully confined within the continuous Fe16N2 layer.

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Hang, Xudong [University of Minnesota], T held, Jacob [University of Minnesota], Lauter, Valeria [ORNL] (ORCID:0000000309896563), Ambaye, Haile [ORNL] (ORCID:0000000281229952), Mkhoyan, Andre [University of Minnesota], Wang, Jian-Ping [University of Minnesota]. 2026-08-01. Interfacial magnetization enhancement and the perpendicularly magnetized component in Fe16N2 thin films. https://doi.org/10.1016/j.jmmm.2026.174468

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