Modified Data Collection And Analysis Codes Of Using Tcm (thermal Conductivity Microscope) To Measure Thermal Conductivity And Diffusivity

Abstract

The "data collection" basically involves setting up the thermal wave frequency, laser scan distance, and other parameters related to the experimental setup. The modification of this code is minor and the details of this code can be found in the earlier patent ("thermal conductivity microscope"). The "data analysis" instead, replaces the simplified analytical model by a more complete analytical model, and used a "thermoquadruple" method to solve the analytical model. The efficiency is orders of magnitude improved and the accuracy is also better. Meanwhile, the previous model can only handle a two-layer sample structure. The new, complete model can handle materials with multiple layers (any given number), which is necessary to handle post ion irradiated materials.