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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 181 records · Page 10
All sourcesNASA NTRSDOE OSTI
NASA NTRS1972

Effects of electrons and protons on science instruments

The radiation effects on typical science instruments according to the Jupiter trapped radiation design restraint model are described, and specific aspects of the model where an improved understanding would be beneficial are suggested. The spacecraft design used is the TOPS 12L configuration. Ionization and displacement damage are considered, and damage criteria are placed on the most sensitive components. Possible protective measures are mentioned: selecting components as radiation resistant as possible, using a difference in desired and undesired signal shapes for electronic shielding, orienting and locating the component on the spacecraft for better shielding, and adding passive shields to protect specific components. Available options are listed in decreasing order of attractiveness: attempt to lower the design restraints without compromising the success of the missions, trade off experiment objectives for increased reliability, alter the trajectory, and remove sensitive instruments from the payload.

Parker, R. H.↗
NASA NTRS1998

Radiation Effects and Protection for Moon and Mars Missions

Manned and robotic missions to the Earth's moon and Mars are exposed to a continuous flux of Galactic Cosmic Rays (GCR) and occasional, but intense, fluxes of Solar Energetic Particles (SEP). These natural radiations impose hazards to manned exploration, but also present some constraints to the design of robotic missions. The hazards to interplanetary flight crews and their uncertainties have been studied recently by a National Research Council Committee (Space Studies Board 1996). Considering the present uncertainty estimates, thick spacecraft shielding would be needed for manned missions, some of which could be accomplished with onboard equipment and expendables. For manned and robotic missions, the effects of radiation on electronics, sensors, and controls require special consideration in spacecraft design. This paper describes the GCR and SEP particle fluxes, secondary particles behind shielding, uncertainties in radiobiological effects and their impact on manned spacecraft design, as well as the major effects on spacecraft equipment. The principal calculational tools and considerations to mitigate the radiation effects are discussed, and work in progress to reduce uncertainties is included.

Parnell, Thomas A.↗
NASA NTRS1992

Thermoluminescent dosimetry for LDEF experiment M0006

Experiment M0006 on the Long Duration Exposure Facility had as its objective the investigation of space radiation effects on various electronic and optical components, as well as on seed germination. The Grumman Corporate Research Center provided the radiation dosimetric measurements for M0006, comprising the preparation of thermoluminescent dosimeters (TLD) and the subsequent measurement and analysis of flight exposed and control samples. In addition, various laboratory exposures of TLD's with gamma rays and protons were performed to obtain a better understanding of the flight exposures.

Chang, J. Y.↗
NASA NTRS2003

On the Utilization of In-flight Radiation-induced Performance Data and Anomaly Resolution of Commercial Off the Shelf (COTS) Electronics

This viewgraph presentation presents an overview of the use of in-flight science data to review the radiation effects on commercial off the shelf (COTS) electronics used in recent spacecraft missions. The authors review the hazards that the space radiation environment pose for spacecraft electronics. They specifically discuss long term effects such as total ionizing dose (TID) and short term effects like single particle events (SEE). The advantages of using COTS electronics despite not being radiation hardened are mentioned. The reasons cite for tracking in-flight performance of COTS electronics include: anomaly resolution, validate ground tests and environmental predictions and provide lessons for future designers. Sample radiation impacts of science data from the following missions are analyzed: SOHO/LASCO 3 Coronograph, Microwave Anisotrophy Probe, Hubble Space Telescope and Chandra X-Ray Observatory.

Kenneth A. LeBel↗
NASA NTRS2017

The Great Proton Search Continues

This presentation is an outbrief of the current team status for access to domestic high (>200 MeV) energy proton facilities. In addition, future considerations will be discussed.

Radiation Effects on Electronics↗
NASA NTRS2016

Terrestrial Sources of X-Ray Radiation and Their Effects on NASA Flight Hardware

X-rays are an energetic and penetrating form of ionizing electromagnetic radiation, which can degrade NASA flight hardware. The main concern posed by such radiation is degradation of active electronic devices and, in some cases, diodes. Non-electronic components are only damaged at doses that far exceed the point where any electronic device would be destroyed. For the purposes of this document, flight hardware can be taken to mean an entire instrument, the flight electronics within the instrument or the individual microelectronic devices in the flight electronics. This document will discuss and describe the ways in which NASA flight hardware might be exposed to x-rays, what is and isn't a concern, and how to tell the difference. First, we must understand what components in flight hardware may be vulnerable to degradation or failure as a result of being exposed to ionizing radiation, such as x-rays. As stated above, bulk materials (structural metals, plastics, etc.) are generally only affected by ionizing radiation at very high dose levels. Likewise, passive electronic components (e.g. resistors, capacitors, most diodes) are strongly resistant to exposure to x-rays, except at very high doses. The main concerns arise when active components, that is, components like discrete transistors and microelectronic devices, are exposed to ionizing radiation. Active components are designed to respond to minute changes in currents and voltages in the circuit. As such, it is not surprising that exposure to ionizing radiation, which creates ionized and therefore electrically active particles, may degrade the way the hardware performs. For the most part, the mechanism for this degradation is trapping of the charges generated by ionizing radiation by defects in dielectric materials in the hardware. As such, the degree of damage is a function of both the quantity of ionizing radiation exposure and the physical characteristics of the hardware itself. The metric that describes the level of exposure to ionizing radiation is total ionizing dose (TID). The unit of TID is the rad, which is defined as 100 ergs absorbed per gram of material. Dose can be expressed in other units, for example grays (gy), where 1 gy = 100 rads. The actual fluence of radiation needed to deliver a rad depends on the absorbing material, so units of dose are usually stated in reference to the material of interest. That is, for microelectronic devices, the unit of dose is generally rad (Si) or rad (SiO2). However, the definition of absorbed dose in this fashion has the advantage that the type of radiation causing the ionization can be normalized so that a realistic and adequate comparison can be made. The sensitivity of microelectronic parts to TID varies over many orders of magnitude. (Note: Doses to humans are typically expressed in rems-or roentgen-equivalent-man-which measures tissue damage, and depends on the type of radiation, as well as the dose in rads.) Thus far, the "softest" parts tested at NASA showed damage at 500 rads (Si), while parts that are radiation-hardened by design can remain functional to doses on the order of 107 rads (Si). This broad range of sensitivity highlights one of the most important considerations when considering the effects of radiation on electronic parts: In order to determine whether a radiation exposure is a concern for a particular part, one must understand the technologies used in the part and their vulnerabilities to TID damage. A NASA radiation expert should be consulted to obtain such information.

X-ray↗
DOE OSTI2023

Modeling the Effects of Drift Orbit Bifurcation on the Magnetopause Shadowing Loss of Radiation Belt Electrons

Abstract Last closed drift shell (LCDS) has been identified as a crucial parameter for investigating the magnetopause shadowing loss of radiation belt electrons. However, drift orbit bifurcation (DOB) effects have not been physically incorporated into the LCDS calculation. Here we calculate event‐specific LCDS using different approaches to dealing with the DOB effects, that is, tracing field lines ignoring DOB, tracing test particles rejecting field lines with DOB, and tracing particles including field lines with DOB, and then incorporate them into a radial diffusion model to simulate the fast electron dropout observed by Van Allen Probes in May 2017. The model effectively captures the fast dropout at high L* and exhibits the best agreement with data when LCDS is calculated by tracing test particles with DOB more physically included. This study represents the first quantitative modeling of the DOB effects on radiation belt magnetopause shadowing loss via a more physical specification of LCDS.

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗
NASA NTRSDate not supplied

Radiation Effects Considerations for Instrumentation and Control in Space Nuclear Systems

Radiation effects in electrical, electronic, electro-motive, and electro-optical (EEEE) hardware encompass a complex variety of interactions, processes, environments, and an evolving landscape of relevant hardware. Appropriately mitigating the effects of radiation in sensors, data acquisition, and control hardware is among the most significant challenges associated with deploying space nuclear power and propulsion systems. The expertise within EEEE radiation effects disciplines require working knowledge that is at least as complex and diverse as the problem itself, but that should not dissuade stakeholders and engineers in adjacent disciplines from attempting to understand the general principles associated with the problem at hand. This brief overview seeks to bring to the foreground a set of relevant topics that are of special importance for space nuclear propulsion applications that involve high rates of neutron and gamma radiation. The unique set of environments and design requirements for space nuclear systems mean that the experience and utility for methods applied to typical spaceflight hardware or terrestrial nuclear systems must not be applied naively. Forward consideration on the applicability of testing methods applied to either existing or bespoke hardware is likely to drive early decisions on system-wide radiation effects mitigation strategies, and will influence procurement requirements for providers of radiation tolerant hardware who are unlikely to have experience in this unique set of environments. Radiation hardness assurance (RHA) guidance should be adapted and emphasize the importance of hardware testing in the relevant environment. These must consider the combined effects of temperature, total ionizing dose (TID), non-ionizing/displacement damage (TNID/DD), and single event effects (SEE), and should consider the impacts of flux (rate) in addition to cumulative effects.

Radiation↗
NASA NTRS2019

Bringing Single-Event Effects Down to Earth

In the 47 years since single-event effects were first observed in spacecraft electronics, radiation experts have developed an effective methodology supported by a nationwide infrastructure. A highly skilled workforce of radiation engineers has developed test facilities and methods, modeling and simulation techniques, and mitigation and design strategies to ensure space missions meet their performance and reliability requirements even in the harsh radiation environments of space. Now, increasing performance demands of space missions, the continued disruptive evolution of microcircuit technologies and growth and changes of the space industry have combined with an aging infrastructure are placing increasing strain on the radiation effects community, and the community is responding.

Single-event effects↗
NASA NTRS2001

Creation and utilization of a World Wide Web based space radiation effects code: SIREST

In order for humans and electronics to fully and safely operate in the space environment, codes like HZETRN (High Charge and Energy Transport) must be included in any designer's toolbox for design evaluation with respect to radiation damage. Currently, spacecraft designers do not have easy access to accurate radiation codes like HZETRN to evaluate their design for radiation effects on humans and electronics. Today, the World Wide Web is sophisticated enough to support the entire HZETRN code and all of the associated pre and post processing tools. This package is called SIREST (Space Ionizing Radiation Effects and Shielding Tools). There are many advantages to SIREST. The most important advantage is the instant update capability of the web. Another major advantage is the modularity that the web imposes on the code. Right now, the major disadvantage of SIREST will be its modularity inside the designer's system. This mostly comes from the fact that a consistent interface between the designer and the computer system to evaluate the design is incomplete. This, however, is to be solved in the Intelligent Synthesis Environment (ISE) program currently being funded by NASA.

NASA Discipline Radiation Health↗