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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 181 records · Page 10

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NASA NTRS2024

Extended Investigation into Fault-Tolerant Integrated Motor Drive for a Quadrotor Urban Air Mobility (UAM) Aircraft

Electric propulsor machines and their associated power electronics have been identified in past studies as low-reliability components in emerging Urban Air Mobility (UAM) Vertical Takeoff and Landing (VTOL) vehicles that raise their predicted catastrophic failure rates. This research effort extends previously presented work investigating the use of fault-tolerant (FT) motor drives in quadrotor aircraft as a promising approach to significantly increase their mean-time-to-failure (MTTF). In particular, fault-tolerant modular motor drives (FT-MMDs) are identified as strong candidates for closing the electric propulsor reliability gap. These FT-MMDs divide a machine drive into multiple redundant modules, each consisting of three phase stator windings and power electronics units, enabling continued machine operation after a module failure. Achieving the highest possible isolation between modules (physical, magnetic, thermal, electrical) is critically important in FT-MMDs to prevent the propagation of any failure between modules. Key additional requirements for achieving the highest possible reliability characteristics with FT-MMDs are high repair rates and aggressive suppression of all single-point failures.

quadrotor↗

NASA NTRS1975

Techniques of Final Preseal Visual Inspection

A dissertation is given on the final preseal visual inspection of microcircuit devices to detect manufacturing defects and reduce failure rates in service. The processes employed in fabricating monolithic integrated circuits and hybrid microcircuits, various failure mechanisms resulting from deficiencies in those processes, and the rudiments of performing final inspection are outlined.

Anstead, R. J.↗

NASA NTRS1988

An experiment in software reliability: Additional analyses using data from automated replications

A study undertaken to collect software error data of laboratory quality for use in the development of credible methods for predicting the reliability of software used in life-critical applications is summarized. The software error data reported were acquired through automated repetitive run testing of three independent implementations of a launch interceptor condition module of a radar tracking problem. The results are based on 100 test applications to accumulate a sufficient sample size for error rate estimation. The data collected is used to confirm the results of two Boeing studies reported in NASA-CR-165836 Software Reliability: Repetitive Run Experimentation and Modeling, and NASA-CR-172378 Software Reliability: Additional Investigations into Modeling With Replicated Experiments, respectively. That is, the results confirm the log-linear pattern of software error rates and reject the hypothesis of equal error rates per individual fault. This rejection casts doubt on the assumption that the program's failure rate is a constant multiple of the number of residual bugs; an assumption which underlies some of the current models of software reliability. data raises new questions concerning the phenomenon of interacting faults.

Dunham, Janet R.↗

DOE OSTI2025

Deconsolidation and Leach Burn Leach of Seven As Irradiated AGR 5/6/7 TRISO Fuel Compacts from Capsules 2, 3, 4, and 5

Seven as-irradiated Advanced Gas Reactor (AGR) 5/6/7 compacts underwent destructive post-irradiation examination via deconsolidation-leach-burn leach at Idaho National Laboratory (INL). The selection of the compacts extended the upper and lower limits of time-average volume-average (TAVA) temperature for compacts that had gone through deconsolidation-leach-burn leach so far. The measured inventories of fission products and actinides in the compact matrix and outer pyrolytic carbon were reported. Results indicated unexpectedly higher rates of fuel kernel leaching compared to compacts from AGR-1 and AGR-2. These failure rates were attributed to damage during post-irradiation sample handling, rather than irradiation itself. AGR-5/6/7 compacts have little or no matrix coverage for some particles at the top and bottom ends of cylindrical fuel compacts, making them more fragile. Sixty particles were randomly sampled from each compact, and the gamma results were reported. Three SiC shells from were identified, one of which showed signs of chemical attack in the high-irradiation temperature compact.

11 - NUCLEAR FUEL CYCLE AND FUEL MATERIALS↗

NASA NTRS1984

Solar-cell interconnect design for terrestrial photovoltaic modules

Useful solar cell interconnect reliability design and life prediction algorithms are presented, together with experimental data indicating that the classical strain cycle (fatigue) curve for the interconnect material does not account for the statistical scatter that is required in reliability predictions. This shortcoming is presently addressed by fitting a functional form to experimental cumulative interconnect failure rate data, which thereby yields statistical fatigue curves enabling not only the prediction of cumulative interconnect failures during the design life of an array field, but also the quantitative interpretation of data from accelerated thermal cycling tests. Optimal interconnect cost reliability design algorithms are also derived which may allow the minimization of energy cost over the design life of the array field.

Mon, G. R.↗

NASA NTRS1988

Investigation of energy transfer in the ignition mechanism of a NASA standard initiator

The principal objective of the proposed research was to construct a detailed computer model of the NASA Standard Initiator (NSI). The NSI plays a critical role in initiating various pyrotechnic events in the National Space Transportation System and is also used in Shuttle payload applications. Several initiators failed when being tested at very low temperatures (4 to 20 K). During subsequent investigation an unacceptable high failure rate was found even at higher temperatures (100 to 150 K) but the precise cause of failure was not determined. The modelling work was undertaken to investigate reasons for failure and to predict the performance of alternate firing schemes. The work has shown that the most likely cause of failure at low temperature is poor thermal contact between the electrically heated bridgewire and the pyrotechnic charge. This problem may be masked if there is good thermal contact between the bridgewire and the alumina charge cup. The high thermal conductivity of alumina at cryogenic temperatures was overlooked in previous analyses, which assumed that the charge cup acted as a thermal insulator.

Varghese, Philip L.↗

NASA NTRS2004

Cryogenic Characterization and Testing of Magnetically-Actuated Microshutter Arrays for the James Webb Space Telescope

Two-dimensional MEMS microshutter arrays (MSA) have been fabricated at the NASA Goddard Space Flight Center (GSFC) for the James Webb Space Telescope (JWST) to enable cryogenic (approximately 35 K) spectrographic astronomy measurements in the near-infrared region. Functioning as a focal plane object selection device, the MSA is a 2-D programmable aperture mask with fine resolution, high efficiency and high contrast. The MSA are close- packed silicon nitride shutters (cell size of 100 x 200 microns) patterned with a torsion flexure to allow opening to 90 degrees. A layer of magnetic material is deposited onto each shutter to permit magnetic actuation. Two electrodes are deposited, one onto each shutter and another onto the support structure side-wall, permitting electrostatic latching and 2-D addressing. New techniques were developed to test MSA under mission-similar conditions (8 K less than or equal to T less than 300K). The magnetic rotisserie has proven to be an excellent tool for rapid characterization of MSA. Tests conducted with the magnetic rotisserie method include accelerated cryogenic lifetesting of unpackaged 128 x 64 MSA and parallel measurement of the magneto-mechanical stiffness of shutters in pathfinder test samples containing multiple MSA designs. Lifetest results indicate a logarithmic failure rate out to approximately 10(exp 6) shutter actuations. These results have increased our understanding of failure mechanisms and provide a means to predict the overall reliability of MSA devices.

King, T. T.↗

NASA NTRS2017

Field Programmable Gate Array Reliability Analysis Guidelines for Launch Vehicle Reliability Block Diagrams

Field Programmable Gate Arrays (FPGAs) integrated circuits (IC) are one of the key electronic components in today's sophisticated launch and space vehicle complex avionic systems, largely due to their superb reprogrammable and reconfigurable capabilities combined with relatively low non-recurring engineering costs (NRE) and short design cycle. Consequently, FPGAs are prevalent ICs in communication protocols and control signal commands. This paper will identify reliability concerns and high level guidelines to estimate FPGA total failure rates in a launch vehicle application. The paper will discuss hardware, hardware description language, and radiation induced failures. The hardware contribution of the approach accounts for physical failures of the IC. The hardware description language portion will discuss the high level FPGA programming languages and software/code reliability growth. The radiation portion will discuss FPGA susceptibility to space environment radiation.

Al Hassan, Mohammad↗

NASA NTRS1980

JANTX1N3893 diode

Diodes manufactured by Siemens and Motorola were tested. Testing of Motorola diodes was stopped in all 3 groups because 50% failure-rate limit was reached. Siemens lot endured more testing in groups 1 and 2 and completed testing on group 3. Failure analysis was performed for group 2 testing.

Source record↗

NASA NTRS1980

LSA field test

After almost four years of endurance testing of photovoltaic modules, no fundamental life-limiting mechanisms were identified that could prevent the twenty-year life goal from being met. The endure data show a continual decline in the failure rate with each new large-scale procurement. Cracked cells and broken interconnects continue to be the principal causes of failure. Although the modules are more adversely affected physically by hot, humid environments than by cool or dry environments there are insufficient data to correlate failure with environment. There is little connection between the outward physical condition of a module and changes in its electrical performance.

Jaffe, P.↗

NASA NTRS1990

Is it possible to identify a trend in problem/failure data

One of the major obstacles in identifying and interpreting a trend is the small number of data points. Future trending reports will begin with 1983 data. As the problem/failure data are aggregated by year, there are just seven observations (1983 to 1989) for the 1990 reports. Any statistical inferences with a small amount of data will have a large degree of uncertainty. Consequently, a regression technique approach to identify a trend is limited. Though trend determination by failure mode may be unrealistic, the data may be explored for consistency or stability and the failure rate investigated. Various alternative data analysis procedures are briefly discussed. Techniques that could be used to explore problem/failure data by failure mode are addressed. The data used are taken from Section One, Space Shuttle Main Engine, of the Calspan Quarterly Report dated April 2, 1990.

Church, Curtis K.↗

NASA NTRS1978

On-orbit spacecraft reliability

Operational and historic data for 350 spacecraft from 52 U.S. space programs were analyzed for on-orbit reliability. Failure rates estimates are made for on-orbit operation of spacecraft subsystems, components, and piece parts, as well as estimates of failure probability for the same elements during launch. Confidence intervals for both parameters are also given. The results indicate that: (1) the success of spacecraft operation is only slightly affected by most reported incidents of anomalous behavior; (2) the occurrence of the majority of anomalous incidents could have been prevented piror to launch; (3) no detrimental effect of spacecraft dormancy is evident; (4) cycled components in general are not demonstrably less reliable than uncycled components; and (5) application of product assurance elements is conductive to spacecraft success.

Bloomquist, C.↗

NASA NTRS2001

Report of the Odyssey FPGA Independent Assessment Team

An independent assessment team (IAT) was formed and met on April 2, 2001, at Lockheed Martin in Denver, Colorado, to aid in understanding a technical issue for the Mars Odyssey spacecraft scheduled for launch on April 7, 2001. An RP1280A field-programmable gate array (FPGA) from a lot of parts common to the SIRTF, Odyssey, and Genesis missions had failed on a SIRTF printed circuit board. A second FPGA from an earlier Odyssey circuit board was also known to have failed and was also included in the analysis by the IAT. Observations indicated an abnormally high failure rate for flight RP1280A devices (the first flight lot produced using this flow) at Lockheed Martin and the causes of these failures were not determined. Standard failure analysis techniques were applied to these parts, however, additional diagnostic techniques unique for devices of this class were not used, and the parts were prematurely submitted to a destructive physical analysis, making a determination of the root cause of failure difficult. Any of several potential failure scenarios may have caused these failures, including electrostatic discharge, electrical overstress, manufacturing defects, board design errors, board manufacturing errors, FPGA design errors, or programmer errors. Several of these mechanisms would have relatively benign consequences for disposition of the parts currently installed on boards in the Odyssey spacecraft if established as the root cause of failure. However, other potential failure mechanisms could have more dire consequences. As there is no simple way to determine the likely failure mechanisms with reasonable confidence before Odyssey launch, it is not possible for the IAT to recommend a disposition for the other parts on boards in the Odyssey spacecraft based on sound engineering principles.

Mayer, Donald C.↗

NASA NTRS2012

Probability and Confidence Trade-space (PACT) Evaluation: Accounting for Uncertainty in Sparing Assessments

There are two general shortcomings to the current annual sparing assessment: 1. The vehicle functions are currently assessed according to confidence targets, which can be misleading- overly conservative or optimistic. 2. The current confidence levels are arbitrarily determined and do not account for epistemic uncertainty (lack of knowledge) in the ORU failure rate. There are two major categories of uncertainty that impact Sparing Assessment: (a) Aleatory Uncertainty: Natural variability in distribution of actual failures around an Mean Time Between Failure (MTBF) (b) Epistemic Uncertainty : Lack of knowledge about the true value of an Orbital Replacement Unit's (ORU) MTBF We propose an approach to revise confidence targets and account for both categories of uncertainty, an approach we call Probability and Confidence Trade-space (PACT) evaluation.

Anderson, Leif↗

NASA NTRS1977

Redundant integrated flight control/navigation inertial sensor complex

A redundant strapdown inertial navigation system for integrated flight control/navigation use is described. Design of the system, which consists of four tuned-gimbal gyros, eight accelerometers, and four processors, is discussed, with emphasis on its compact configuration (13 by 13 by 14 in.), based on symmetry properties of an octahedron. A matrix operator for least-squares combination of data from an arbitrary number of two-degree-of-freedom gyros is derived, and general parity equations for error analysis are given. Self-contained detection and isolation of a two-axis gyro failure is considered; system failure probability, which depends on component failure rates and self-correction capacities, is analyzed. Test data, including typical parity equation responses during motion and simulated gyro and accelerometer failures, are also presented.

Ebner, R. E.↗

NASA NTRS2007

Reliability Effects of Surge Current Testing of Solid Tantalum Capacitors

Solid tantalum capacitors are widely used in space applications to filter low-frequency ripple currents in power supply circuits and stabilize DC voltages in the system. Tantalum capacitors manufactured per military specifications (MIL-PRF-55365) are established reliability components and have less than 0.001% of failures per 1000 hours (the failure rate is less than 10 FIT) for grades D or S, thus positioning these parts among electronic components with the highest reliability characteristics. Still, failures of tantalum capacitors do happen and when it occurs it might have catastrophic consequences for the system. This is due to a short-circuit failure mode, which might be damaging to a power supply, and also to the capability of tantalum capacitors with manganese cathodes to self-ignite when a failure occurs in low-impedance applications. During such a failure, a substantial amount of energy is released by exothermic reaction of the tantalum pellet with oxygen generated by the overheated manganese oxide cathode, resulting not only in destruction of the part, but also in damage of the board and surrounding components. A specific feature of tantalum capacitors, compared to ceramic parts, is a relatively large value of capacitance, which in contemporary low-size chip capacitors reaches dozens and hundreds of microfarads. This might result in so-called surge current or turn-on failures in the parts when the board is first powered up. Such a failure, which is considered as the most prevalent type of failures in tantalum capacitors [I], is due to fast changes of the voltage in the circuit, dV/dt, producing high surge current spikes, I(sub sp) = Cx(dV/dt), when current in the circuit is unrestricted. These spikes can reach hundreds of amperes and cause catastrophic failures in the system. The mechanism of surge current failures has not been understood completely yet, and different hypotheses were discussed in relevant literature. These include a sustained scintillation breakdown model [1-3]; electrical oscillations in circuits with a relatively high inductance [4-6]; local overheating of the cathode [5,7, 8]; mechanical damage to tantalum pentoxide dielectric caused by the impact of MnO2 crystals [2,9, 10]; or stress-induced-generation of electron traps caused by electromagnetic forces developed during current spikes [11]. A commonly accepted explanation of the surge current failures is that at unlimited current supply during surge current conditions, the self-healing mechanism in tantalum capacitors does not work, and what would be a minor scintillation spike if the current were limited, becomes a catastrophic failure of the part [l, 12]. However, our data show that the scintillation breakdown voltages are significantly greater that the surge current breakdown voltages, so it is still not clear why the part, which has no scintillations, would fail at the same voltage during surge current testing (SCT).

Teverovsky, Alexander↗

NASA NTRS1974

Reliability analysis of Skylab ATM solar cell modules

A detailed reliability analysis was performed on both types of Skylab Apollo telescope mount solar cell modules. Failure rates used were based on testing of several modules of each type for over 4000 thermal cycles. The analysis delineated several important differences between the failure modes of the two differently designed solar cell modules, and, more importantly, showed that the modules can be expected to meet all mission requirements.

Jones, G. M.↗

NASA NTRS1976

Reliability analysis of structures under periodic proof tests in service

A reliability analysis of structures subjected to random service loads and periodic proof tests treats gust loads and maneuver loads as random processes. Crack initiation, crack propagation, and strength degradation are treated as the fatigue process. The time to fatigue crack initiation and ultimate strength are random variables. Residual strength decreases during crack propagation, so that failure rate increases with time. When a structure fails under periodic proof testing, a new structure is built and proof-tested. The probability of structural failure in service is derived from treatment of all the random variables, strength degradations, service loads, proof tests, and the renewal of failed structures. Some numerical examples are worked out.

Yang, J.-N.↗