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Results for “Module Reliability”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 181 records · Page 10
All sourcesNASA NTRSDOE OSTI
DOE OSTI2023

Susceptibility to polarization type potential induced degradation in commercial bifacial p-PERC PV modules

Potential induced degradation (PID) is a reliability issue affecting photovoltaic (PV) modules, mainly when PV strings operate under high voltages in hot/humid conditions. Polarization-type PID (PID-p) has been known to decrease module performance quickly. PID-p can be reduced or recovered under the light in some cases, but this effect, as expected, would be less pronounced on the rear side of bifacial PV modules receiving lower irradiance. As bifacial PV modules are projected to dominate the PV market within the next 10 years, it is crucial to understand the PID-p issue in bifacial modules better. In this study, we performed indoor PID testing to induce PID-p on 14 commercial bifacial p-PERC modules with three different module constructions from three manufacturers. Here, four rounds (+ve and –ve polarities for front and rear sides) of PID testing are done at 25°C, 54% relative humidity (RH) for 168 h using the aluminum foil method. Each module side (front cell side and back cell side) is tested individually under both negative and positive voltage bias. The results show that the highest degradation of 32% in maximum power (Pmax) at standard test conditions (1000 W/m 2 ) and 51% at low irradiance (200 W/m 2 ) has been observed in some cases. Recovery under sunlight is also done, and outcomes show a near-complete recovery in Pmax. This study presents an extensive experimental methodology and a detailed analysis to systematically and simultaneously/sequentially evaluate multiple construction types of bifacial modules to the PID-p susceptibility and recovery.

14 SOLAR ENERGY↗
NASA NTRS1992

Reliability analysis of laminated CMC components through shell subelement techniques

An updated version of the integrated design program Composite Ceramics Analysis and Reliability Evaluation of Structures (C/CARES) was developed for the reliability evaluation of ceramic matrix composites (CMC) laminated shell components. The algorithm is now split into two modules: a finite-element data interface program and a reliability evaluation algorithm. More flexibility is achieved, allowing for easy implementation with various finite-element programs. The interface program creates a neutral data base which is then read by the reliability module. This neutral data base concept allows easy data transfer between different computer systems. The new interface program from the finite-element code Matrix Automated Reduction and Coupling (MARC) also includes the option of using hybrid laminates (a combination of plies of different materials or different layups) and allows for variations in temperature fields throughout the component. In the current version of C/CARES, a subelement technique was implemented, enabling stress gradients within an element to be taken into account. The noninteractive reliability function is now evaluated at each Gaussian integration point instead of using averaging techniques. As a result of the increased number of stress evaluation points, considerable improvements in the accuracy of reliability analyses were realized.

Starlinger, Alois↗
DOE OSTI2015

Robust Measurement of Thin-Film Photovoltaic Modules Exhibiting Light-Induced Transients: Preprint

Light-induced changes to the current-voltage characteristic of thin-film photovoltaic modules (i.e. light-soaking effects) frustrate the repeatable measurement of their operating power. We describe best practices for mitigating, or stabilizing, light-soaking effects for both CdTe and CIGS modules to enable robust, repeatable, and relevant power measurements. We motivate the practices by detailing how modules react to changes in different stabilization methods. We also describe and demonstrate a method for validating alternative stabilization procedures, such as those relying on forward bias in the dark. Reliable measurements of module power are critical for qualification testing, reliability testing, and power rating.

14 SOLAR ENERGY↗
NASA NTRS1985

Module voltage isolation and corrosion research

A summary of recent research at JPL on two topics related to achieving long term reliability of photovoltaic modules: voltage isolation and electrochemical corrosion is presented. Special emphasis is given to similarities and differences in performance between crystalline silicon modules and amorphous silicon modules.

Mon, G. R.↗
DOE OSTI2021

Thermal analyses of high-power advanced thermoacoustic radioisotope power system for future space exploration missions

This paper presents the results of 3-D thermal analyses of the heat source assembly of a 440 We advanced radioisotope power system (RPS) for future space exploration missions. This high thermal efficiency RPS employs a heat source assembly of eight Step 2 General Purpose Heat Source (GPHS) modules and four Thermoacoustic Power Converter (TAPC) units. Each unit is thermally coupled to two GPHS modules. Here, the analyses investigated the temperatures of the Iridium (Ir) alloy cladding of the 238 PuO 2 fuel pellets and the surface of the Fine Weave Pierced Fabric (FWPF) aeroshell in the GPHS modules to ensure reliable operation and safety in case of an unlikely reentry. Conductive coupling of the GPHS modules to the heater heads of the TAPC units produces relatively uniform axial and azimuthal distributions of heat flux and temperature. However, for this case the temperature of the Ir alloy cladding is lower than the desired values of 1173 K to maintain sufficient ductility. Adding a 5 mm wide He filled gap and decreasing the thickness of the graphite sleeve to 10 mm increased Ir cladding temperature to 1197–1174 K, which are in the desired range. The maximum surface temperatures of the FWPF graphite aeroshell of 1022–1131 K is well below the NASA specified limit of 1373 K. In addition, the total mass of the heat source assembly decreased by 19.6 kg, ~43% saving compared to original design.

42 ENGINEERING↗
DOE OSTI2015

Application of electrically invisible antennas to the Modulated Scatterer Technique

The modulated scatterer technique (MST) has shown promise for applications in microwave imaging, electric field mapping, and materials characterization. Traditionally, MST scatterers are dipoles centrally loaded with an element capable of modulation (e.g., a p-i-n diode). By modulating the load element, signals scattered from the MST scatterer are also modulated. However, due to the small size of such scatterers, it can be difficult to reliably detect the modulated signal. Increasing the modulation depth (MD; a parameter related to how well the scatterer modulates the scattered signal) may improve the detectability of the scattered signal. In an effort to improve the MD, the concept of electrically invisible antennas is applied to the design of MST scatterers. Our paper presents simulations and measurements of MST scatterers that have been designed to be electrically invisible during the reverse bias state of the modulated element (a p-i-n diode in this case), while producing detectable scattering during the forward bias state (i.e., operate in an electrically visible state). Furthermore, the results using the new design show significant improvement to the MD of the scattered signal as compared with a traditional MST scatterer (i.e., dipole centrally loaded with a p-i-n diode).

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
DOE OSTI2026

Lessons from the IEC Durability of Adhesion Accelerated Test Sequence

The IEC 62788-1-1 and IEC 63209-2 standards use aging sequences for durability of adhesion in photovoltaic (PV) modules, which may be evaluated using the single cantilever beam (SCB) test. Because the encapsulant forms critical interfaces with the front glass and solar cells, degradation at those interfaces under ultraviolet (UV) exposure, elevated temperature, and humidity can lead to interfacial delamination - compromising the long-term reliability. In this work, adhesion durability of UV-transmitting poly(ethylene-co-vinyl acetate) (EVA) encapsulant to glass and to silicon solar cells is evaluated after sequenced UV and damp heat aging (85C/85%RH). Laminates were prepared using StarPhire solar front glass with thin glass or PERC cells, and two EVA formulations with different concentrations of siloxane coupling agent. Adhesion was quantified by measuring critical debond energy using the SCB method. Both formulations exhibit similar qualitative trends, while different adhesion is observed at the periphery despite the use of low-shrink manufacturing. The results show that while glass/EVA adhesion remains stable or increases after UV exposure and shows only moderate changes after damp heat, the EVA/cell interface exhibits an irreversible loss of adhesion following UV and then damp heat exposure. Although glass/EVA interfaces generally exhibit lower debond energies, the EVA/cell interface is significantly more vulnerable to UV-driven degradation, identifying it as the dominant reliability risk location through early- and intermediate-module life. These results demonstrate that accelerated aging sequences can expose large, interface-specific losses in adhesion durability and underscore the importance of interface engineering for long-term PV module reliability.

14 SOLAR ENERGY↗
DOE OSTI2018

Artifact-Free Coring Procedures for Removing Samples from Photovoltaic Modules for Microscopic Analysis

An important step in producing more reliable and efficient photovoltaic modules is to establish a relationship between the microscopic properties of modules deployed in the field for many years and efficiency-related parameters. The first step in accomplishing this task is to be able to identify and remove small areas from these modules without causing any damage to these samples. In this work, we will describe two different procedures to core small areas of deployed and stressed solar panels produced with different materials (Si, CIGS, and CdTe), and we will prove that these processes did not damage the cored material. We will also show that the coring procedure changes for different types of photovoltaic modules.

14 SOLAR ENERGY↗
DOE OSTI2023

Follow-Up from the Photovoltaic Reliability Workshop (PVRW): Cost Modeling Capabilities to Evaluate Trends in PV Technologies

NREL's Solar and Storage Techno-Economic Analysis (TEA) team reviews live polling results from the Photovoltaic Reliability Workshop (PVRW) related to module technology trends believed to have the greatest reliability impacts. Then, the team reviews the publicly available tools and inputs necessary for evaluating reliability tradeoffs between initial module and system costs, degradation profiles, and levelized cost of energy (LCOE). These tools include the online Detailed Cost Analysis Models (DCAM) and the DuraMAT LCOE calculator.

cost modeling↗
DOE OSTI2016

On the Path to SunShot - The Role of Advancements in Solar Photovoltaic Efficiency, Reliability, and Costs

Although tremendous progress has been made in reducing the cost of PV systems, additional LCOE reductions of 40%–50% between 2015 and 2020 will be required to reach the SunShot Initiative’s targets (see Woodhouse et al. 2016). Understanding the tradeoffs between installed prices and other PV system characteristics—such as module efficiency, module degradation rate, and system lifetime—are vital. For example, with 29%-efficient modules and high reliability (a 50-year lifetime and a 0.2%/year module degradation rate), a residential PV system could achieve the SunShot LCOE goal with modules priced at almost $1.20/W. But change the lifetime to 10 years and the degradation rate to 2%/year, and the system would need those very high-efficiency modules at zero cost to achieve the same LCOE. Although these examples are extreme, they serve to illustrate the wide range of technological combinations that could help drive PV toward the LCOE goals. SunShot’s PV roadmaps illustrate specific potential pathways to the target cost reductions.

14 SOLAR ENERGY↗
DOE OSTI2022

Dependence of adhesion on degradation mechanisms of ethylene co-vinyl acetate encapsulants over the lifetime of photovoltaic modules

The long-term reliability of encapsulation has a critical impact on the overall cost and effectiveness of photovoltaic modules. An often overlooked but important element of this reliability concerns adhesive degradation of the encapsulant, which results in delamination. This work critically examines the degradation mechanisms – deacetylation, β-scission, and hydrolytic depolymerization – primarily responsible for adhesion loss in ethylene co-vinyl acetate (EVA) encapsulants to provide evidence and clarity regarding the contribution of these mechanisms to the adhesive degradation over the lifetime of a module. EVA samples obtained from mini-modules exposed in two sets of controlled, accelerated conditions – with and without ultraviolet (UV) radiation – are characterized to find specific evidence for the proposed degradation mechanisms. The mini-modules were exposed up to 10,000 h, which represents up to 15–20 years in the field. Results affirm that initially, deacetylation dominates the degradation before scission takes over, followed by hydrolytic depolymerization. Additional analysis highlights the climacteric interdependency between deacetylation and hydrolytic depolymerization as it relates to eventual delamination, where deacetylation products catalyze interfacial hydrolysis reactions. Furthermore, effects occurring at a given interface are isolated, explicitly providing evidence for how these mechanisms are nonuniform throughout the thickness of the EVA. Results demonstrate that the EVA that interfaces with the glass as opposed to the cell experiences increased levels of degradation, explaining why this initially stronger interface becomes the preferential interface for delamination after longer periods of exposure. Additionally, elevated temperatures alone are shown to induce limited migration of sodium ions across the glass/EVA interface.

36 MATERIALS SCIENCE↗
DOE OSTI2019

Improving reliability and reducing cost in CdTe photovoltaics via grain boundary engineering

A key pathway toward achieving the SunShot 2030 goals for thin films devices is to increase the overall module efficiency and reliability. Photovoltaic devices based on polycrystalline CdTe thin films are the leading candidate, followed closely by Si, that have achieved the 2020 SunShot target of $\$0.05$/kWh. However, to reach the goal for the levelized cost of electricity (LCOE) of less than $\$0.03$/kWh by 2030, several fundamental problems of CdTebased devices will need to be addressed: i) low Voc and conversion efficiencies of even the best research cell, ii) large variability of individual cell performances manufactured under identical conditions, and iii) degradation of cell performance within the first few years of operation in the field.

14 SOLAR ENERGY↗
DOE OSTI2019

Application of Electronics Packaging Fundamentals to Photovoltaic Interconnects and Packaging

The energy capacity of photovoltaic (PV) installations worldwide has increased significantly in the last decade, increasing the demand for rigorous investigation of the physical phenomena causing degradation and failures in PV modules. As PV reliability science develops, established methods and approaches from longer-standing industries can inform and expedite PV reliability advances. This work demonstrates how thermomechanical solder bond fatigue models derived for electronics packaging applications can be applied to both standard and emerging PV interconnect designs. This expertise cannot be directly translated to PV however, as target PV module lifetimes are significantly longer than most electronics and the modules must withstand the natural climate wherever they are deployed. Verification of analytical reliability models is then an additional challenge, due to model size, test time, and climate variability. Furthermore, unconventional materials, such as low-temperature solders, are now being integrated into PV designs, for which appropriate material models must be selected and material parameters derived. In this paper, the current state of PV interconnect research is explored, with an emphasis on the experimental and simulation approaches and models being used for this work. Recent results for standard module architectures as well as emerging interconnect schemes are discussed.

14 SOLAR ENERGY↗
DOE OSTI2023

Comparative Analysis of Hotspot Stress Endurance in Pristine and Thermal Cycled Prestressed Glass–Glass Photovoltaic Modules

Hotspots pose a significant long-term reliability challenge in photovoltaic (PV) modules that can have a detrimental impact on the efficiency, safety, and financial viability of a PV system. This paper aims to evaluate the endurance of hotspot stress in pristine and prestressed glass–glass (GG) modules. The accelerated prestressing was conducted for 600 thermal cycles (TC600) to represent decades of field exposure. GG modules are quickly becoming an alternative to the traditional glass–backsheet (GB) modules that have been the industry standard. Unlike other conventional studies that subject only pristine modules to hotspot stress, this paper evaluates the performance of an accelerated/simulated field-aged GG module (using TC600) and a pristine GG module. Pre- and post-characterizations were performed before and after each test to determine changes in electrical performance and observe any defects in GG modules. During the hotspot test, an approximately 200 °C maximum cell temperature was observed with a cell shading of 25% (the worst-case shading ratio). After the hotspot test, electroluminescence imaging indicated that most cells in the prestressed GG module exhibited severe damage whereas no significant defects were evident in the pristine GG module where the prestressed GG module degraded 8.2% and the pristine GG module degraded 1.5% in maximum power. These findings are critical for the industry, considering that GG bifacial modules will dominate the market.

14 SOLAR ENERGY↗
NASA NTRS1984

Determination of hot-spot susceptibility of multistring photovoltaic modules in a central-station application

Part of the effort of the Jet Propulsion Laboratory (JPL) Flat-Plate Solar Array Project (FSA) includes a program to improve module and array reliability. A collaborative activity with industry dealing with the problem of hot-spot heating due to the shadowing of photovoltaic cells in modules and arrays containing several paralleled cell strings is described. The use of multiparallel strings in large central-station arrays introduces the likelihood of unequal current sharing and increased heating levels. Test results that relate power dissipated, current imbalance, cross-strapping frequency, and shadow configuration to hot-spot heating levels are presented. Recommendations for circuit design configurations appropriate to central-station applications that reduce the risk of hot-spot problems are offered. Guidelines are provided for developing hot-spot tests for arrays when current imbalance is a threat.

Gonzalez, C. C.↗
DOE OSTI2015

Thermal and Electrical Effects of Partial Shade in Monolithic Thin-Film Photovoltaic Modules

Photovoltaic cells can be damaged by reverse bias stress, which arises during service when a monolithically integrated thin-film module is partially shaded. We introduce a model for describing a module's internal thermal and electrical state, which cannot normally be measured. Using this model and experimental measurements, we present several results with relevance for reliability testing and module engineering: Modules with a small breakdown voltage experience less stress than those with a large breakdown voltage, with some exceptions for modules having light-enhanced reverse breakdown. Masks leaving a small part of the masked cells illuminated can lead to very high temperature and current density compared to masks covering entire cells.

14 SOLAR ENERGY↗
DOE OSTI2015

Thermal and Electrical Effects of Partial Shade in Monolithic Thin-Film Photovoltaic Modules: Preprint

Photovoltaic cells can be damaged by reverse bias stress, which arises during service when a monolithically integrated thin-film module is partially shaded. We introduce a model for describing a module's internal thermal and electrical state, which cannot normally be measured. Using this model and experimental measurements, we present several results with relevance for reliability testing and module engineering: Modules with a small breakdown voltage experience less stress than those with a large breakdown voltage, with some exceptions for modules having light-enhanced reverse breakdown. Masks leaving a small part of the masked cells illuminated can lead to very high temperature and current density compared to masks covering entire cells.

14 SOLAR ENERGY↗