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The subject grants support development of High-Performance Active Pixel Sensors for X-ray Astronomy at the Massachusetts Institute of Technology (MIT) Center for Space Research and at MIT's Lincoln Laboratory. This memo reports our progress in the second year of the project, from April, 2004 through the present.
The passive infrared and microwave nadir sounders such as (A)TOVS observe the atmosphere from a polar orbit by directing their scan pointed at the ground up to about 49 degrees from nadir. Except for the pixels located right on the satellite ground track, the radiance measurements collected by these instruments characterize hence atmospheric emission paths which are slanted with respect to the zenithal direction at the ground. At the outer swath edges, the deviations from nadir reach about 60 degrees in terms of Satellite Zenith Angle (SZA). The radiative transfer codes used in operational Numerical Weather Prediction applications make the appropriate corrections to account for the extra path induced by the non-zero SZA. However, no corrections are made to account for the fact that the atmospheric profiles along the slanted line-of-sight (LOS) are different from the vertical because of horizontal gradients in the atmosphere. Using NASA EOS Aqua satellite's orbits, zenith and azimuth angles, as well as three-dimensional fields of temperature, water vapor, and ozone produced by the NASA Global Modeling and Assimilation Office, we extracted slanted atmospheric profiles for actual soundings performed by the AIRS and AMSU-A instruments onboard EOS Aqua. We will present the results of our study comparing the calculated brightness temperatures along slanted LOS and vertical LOS with AIRS and AMSU-A observations.
In this paper we describe a method to increase the spatial resolution of surface micro-roughness measurements. As the surface specifications for precision optics become more demanding, the metrology instruments must cover a broad spatial frequency range. Generally, multiple instruments are used to cover the full range of the specifications. For example, a Fizeau interferometer would be used to test low spatial frequency surface errors, a white light interferometer would be used for mid spatial frequency errors, and an AFM would be used for high spatial frequency errors. For some precision optics, three instruments would be necessary. However, in many applications, an increase in the spatial resolution of a metrology instrument could negate the need for multiple instruments. A solution to increase the spatial resolution of micro-roughness measurements obtained using white light interferometry with "interlaced stitching" will be presented. In "interlaced stitching", multiple interferometric measurements are made as the optic under test (or the CCD array) is laterally shifted at sub-pixel increments. The measurements are then combined to construct a measurement with higher spatial resolution. Initial results obtained while implementing a similar process used to increase the spatial resolution of measurements made with a commercially available Fizeau interferometer will be presented.
Measurement of mid spatial frequency figure error is critical to large precision optics for missions such as TPF-C. This presentation introduces a technique for increasing the spatial sampling resolution to meet these requirements using conventional video resolution phase-measuring interferometer. Technique involves sub-pixel data shifts, interlaced stitching and PSF deconvolution.
A high-performance computational imager based on integration of CMOS active pixel imager array with on-chip signal processing and control via a new column-parallel architecture is presented.
We have demonstrated the first monolithic spatially separated four-band 640x512 pixel QWIP focal plane array.
We present new CMOS photodiode imager pixel with ultra-low read noise through on-chip suppression of reset noise via column-based feedback circuitry. The noise reduction is achieved without introducing any image lag, and with insignificant reduction in quantum efficiency and full well.
A low power smart vision system based on a large format (currently 1K x 1K) active pixel sensor (APS) integrated with a programmable neural processor for fast vision applications is presented.
Availability of mature sub-micron CMOS technology and the advent of the new low noise active pixel sensor (APS) concept have enabled the development of low power, miniature, single-chip, CMOS digital imagers in the decade of the 1990's.
A low power smart vision system based on a large format (currently 1Kx1K) active pixel sensor (APS) integrated with a programmable neural processor for fast vision applications is presented.
A 128 x 128 element CMOS active pixel image sensor (APS) with on-chip timing, control, and.
A highly integrated active pixel sensor with on-chip 1 bit thresholding circuitry achieving an 8,000.
This paper will present the JPL-developed complementary metal- oxide-semiconductor (CMOS) active pixel sensor (APS) technology. The CMOS APS has achieved performance comparable to charge coupled devices, yet features ultra low power operation, random access readout, on-chip timing and control, and on-chip analog to digital conversion. Previously published open literature will be reviewed.
A second generation image sensor technology has been developed at the NASA Jet Propulsion Laboratory as a result of the continuing need to miniaturize space science imaging instruments. Implemented using standard CMOS, the active pixel sensor (APS) technology permits the integration of the detector array with on-chip timing, control and signal chain electronics, including analog-to-digital conversion.
A second generation image sensor technology has been developed at the NASA Jet Propulsion Laboratory as a result of the continuing need to miniaturize space science imaging instruments. Implemented using standard CMOS, the active pixel sensor (APS) technology permits the integration of the detector array with on-chip timing, control and signal chain electronics, including analog-to-digital conversion.
A family of CMOS-based active pixel image sensors (APS) that are inherently compatible with the integration of on-chip signal processing circuitry is reported.
Mid-wavelength infrared (MWIR) and long-wavelength infrared (LWIR) 10(24) x 10(24) pixel quantum well infrared photodetector (QWIP) focal planes have been demonstrated with excellent imaging performance. The MWIR QWIP detector array has demonstrated a noise equivalent differential temperature (NEAT) of 17 mK at a 95 K operating temperature with f/2.5 optics at 300 K background and the LWIR detector array has demonstrated a NEAT of 13 mK at a 70 K operating temperature with the same optical and background conditions as the MWIR detector array after the subtraction of system noise. Both MWIR and LWIR focal planes have shown background limited performance (BLIP) at 90 K and 70 K operating temperatures respectively, with similar optical and background conditions. In this paper, we will discuss the performance in terms of quantum efficiency, NE(delta)T, uniformity, operability and modulation transfer functions.
The operational retrieval of height-resolved cloud motion vectors by the Multiangle Imaging SpectroRadiometer on the Terra satellite has been significantly improved by using sub-pixel approaches to co-registration and disparity assessment, and by imposing stronger quality control based on the agreement between independent forward and aft triplet retrievals. Analysis of the fore-aft differences indicates that CMVs pass the basic operational quality control 67% of the time, with rms differences - in speed of 2.4 m/s, in direction of 17 deg, and in height assignment of 290 m. The use of enhanced quality control thresholds reduces these rms values to 1.5 m/s, 17 deg and 165 m, respectively, at the cost of reduced coverage to 45%. Use of the enhanced thresholds also eliminates a tendency for the rms differences to increase with height. Comparison of CMVs from an earlier operational version that had slightly weaker quality control, with 6-hour forecast winds from the Global Modeling and Assimilation Office yielded very low bias values and an rms vector difference that ranged from 5 m/s for low clouds to 10 m/s for high clouds.