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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 181 records · Page 10
All sourcesNASA NTRSDOE OSTI
DOE OSTI2014

Reflection of a TE-polarised Gaussian beam from a layered structure under conditions of resonance excitation of waveguide modes

The problem of reflection of a TE-polarised Gaussian light beam from a layered structure under conditions of resonance excitation of waveguide modes using a total internal reflection prism is considered. Using the spectral approach we have derived the analytic expressions for the mode propagation lengths, widths and depths of m-lines (sharp and narrow dips in the angular dependence of the specular reflection coefficient), depending on the structure parameters. It is shown that in the case of weak coupling, when the propagation lengths l{sub m} of the waveguide modes are mainly determined by the extinction coefficient in the film, the depth of m-lines grows with the mode number m. In the case of strong coupling, when l{sub m} is determined mainly by the radiation of modes into the prism, the depth of m-lines decreases with increasing m. The change in the TE-polarised Gaussian beam shape after its reflection from the layered structure is studied, which is determined by the energy transfer from the incident beam into waveguide modes that propagate along the structure by the distance l{sub m}, are radiated in the direction of specular reflection and interfere with a part of the beam reflected from the working face of the prism. It is shown that this interference can lead to the field intensity oscillations near m-lines. The analysis of different methods for determining the parameters of thin-film structures is presented, including the measurement of mode angles θ{sub m} and the reflected beam shape. The methods are based on simultaneous excitation of a few waveguide modes in the film with a strongly focused monochromatic Gaussian beam, the waist width of which is much smaller than the propagation length of the modes. As an example of using these methods, the refractive index and the thickness of silicon monoxide film on silica substrate at the wavelength 633 nm are determined. (fibre and integrated-optical structures)

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗
DOE OSTI2014

Improved reflection models of black hole accretion disks: Treating the angular distribution of X-rays

X-ray reflection models are used to constrain the properties of the accretion disk, such as the degree of ionization of the gas and the elemental abundances. In combination with general relativistic ray tracing codes, additional parameters like the spin of the black hole and the inclination to the system can be determined. However, current reflection models used for such studies only provide angle-averaged solutions for the flux reflected at the surface of the disk. Moreover, the emission angle of the photons changes over the disk due to relativistic light bending. To overcome this simplification, we have constructed an angle-dependent reflection model with the XILLVER code and self-consistently connected it with the relativistic blurring code RELLINE. The new model, relxill, calculates the proper emission angle of the radiation at each point on the accretion disk and then takes the corresponding reflection spectrum into account. We show that the reflected spectra from illuminated disks follow a limb-brightening law highly dependent on the ionization of disk and yet different from the commonly assumed form I∝ln (1 + 1/μ). A detailed comparison with the angle-averaged model is carried out in order to determine the bias in the parameters obtained by fitting a typical relativistic reflection spectrum. These simulations reveal that although the spin and inclination are mildly affected, the Fe abundance can be overestimated by up to a factor of two when derived from angle-averaged models. The fit of the new model to the Suzaku observation of the Seyfert galaxy Ark 120 clearly shows a significant improvement in the constraint of the physical parameters, in particular by enhancing the accuracy in the inclination angle and the spin determinations.

79 ASTRONOMY AND ASTROPHYSICS↗
DOE OSTI2024

Reconstructing the reflectivity of liquid surfaces from grazing incidence X-ray off-specular scattering data

The capillary wave model of a liquid surface predicts both the X-ray specular reflection and the diffuse scattering around it. A quantitative method is presented to obtain the X-ray reflectivity (XRR) from a liquid surface through the diffuse scattering data around the specular reflection measured using a grazing incidence X-ray off-specular scattering (GIXOS) geometry at a fixed horizontal offset angle with respect to the plane of incidence. With this approach the entire Q z -dependent reflectivity profile can be obtained at a single, fixed incident angle. This permits a much faster acquisition of the profile than with conventional reflectometry, where the incident angle must be scanned point by point to obtain a Q z -dependent profile. The XRR derived from the GIXOS-measured diffuse scattering, referred to in this paper as pseudo-reflectivity, provides a larger Q z range compared with the reflectivity measured by conventional reflectometry. Transforming the GIXOS-measured diffuse scattering profile to pseudo-XRR opens up the GIXOS method to widely available specular XRR analysis software tools. Here the GIXOS-derived pseudo-XRR is compared with the XRR measured by specular reflectometry from two simple vapor–liquid interfaces at different surface tension, and from a hexadecyltrimethylammonium bromide monolayer on a water surface. For the simple liquids, excellent agreement (beyond 11 orders of magnitude in signal) is found between the two methods, supporting the approach of using GIXOS-measured diffuse scattering to derive reflectivities. Pseudo-XRR obtained at different horizontal offset angles with respect to the plane of incidence yields indistinguishable results, and this supports the robustness of the GIXOS-XRR approach. The pseudo-XRR method can be extended to soft thin films on a liquid surface, and criteria are established for the applicability of the approach.

36 MATERIALS SCIENCE↗
DOE OSTI2017

Measurement of the infrared optical constants for spectral modeling: n and k values for (NH4)2SO4 via single-angle reflectance and ellipsometric methods

The optical constants n and k can be used to model infrared spectra, including refraction, absorption, reflectance, and emissivity, but obtaining reliable values for solid materials (pure or otherwise) presents a challenge: In the past, the best results for n and k have been obtained from bulk, homogeneous materials, free of defects. That is, materials where the Fresnel equations are operant since there is no light scattering. Since it is often not possible to obtain a pure macroscopic (crystalline) material, it may be possible to press the material into a (uniform, void-free) disk. We have recently been able to do this with ammonium sulfate powder and then measured the n & k values via two independent methods: 1) Ellipsometry - which measures the changes in amplitude and phase of light reflected from the material of interest as a function of wavelength and angle of incidence, and 2) Single angle specular reflectance with an FT spectrometer using a specular reflectance device within an FT instrument which measures the change in amplitude of light reflected from the material of interest as a function of wavelength and angle of incidence over a wide wavelength range. The quality of the derived n & k values was tested by generating the reflectance spectra of the pellet and comparing to the calculated to measured reflectance spectra of the pure material which has been previously published. The comparison to literature values showed good accuracy and good agreement, indicating promise to measure other materials by such methods.

ammonium sulfate↗
DOE OSTI2020

Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX

Abstract Liquid xenon particle detectors rely on excellent light collection efficiency for their performance. This depends on the high reflectivity of polytetrafluoroethylene (PTFE) at the xenon scintillation wavelength of 178 nm, but the angular dependence of this reflectivity is not well-understood. IBEX is designed to directly measure the angular distribution of xenon scintillation light reflected off PTFE in liquid xenon. These measurements are fully described by a microphysical reflectivity model with few free parameters. Dependence on PTFE type, surface finish, xenon pressure, and wavelength of incident light is explored. Total internal reflection is observed, which results in the dominance of specular over diffuse reflection and a reflectivity near 100% for high angles of incidence.

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗
DOE OSTI2022

Anomalous dips in reflection spectra of optical polymers deposited on plasmonic metals

Abstract We have studied reflection spectra of dye-doped and undoped polymers deposited onto Ag and Au substrates and found anomalous dips in the UV spectral range. On top of Ag substrates, the λ ∼ 375 nm dips were observed in undoped PMMA, PVP, and PS polymers as well as PMMA doped with Rh590 and HITC laser dyes. In silver-based samples, the spectral positions of the observed reflection dips were close to singularities in the refractive indexes of surface plasmon polaritons (SPPs) propagating at the interface between Ag and polymer. The latter singularities can tentatively explain the λ ∼ 375 nm reflection dips, if the scattering of Ag and polymeric films is large enough to launch SPP without any prism or grating. The dips observed in reflection of Rh590:PMMA and HITC:PMMA on top of Au, were more pronounced than those on Ag, broader, shifted to shorter wavelengths, and their spectral positions had large standard deviations. Furthermore, no anomalous dips in gold-based samples were observed in the reflection spectra of undoped PMMA, PVP, and PS polymers, and a modest singularity in the SPP refractive index, predicted theoretically at λ ∼ 500 nm, cannot explain the dips in the UV reflection spectra observed experimentally. It appears likely that the origin of the reflection dips on top of Au substrates is different from that on top of Ag substrates.

36 MATERIALS SCIENCE↗
NASA NTRS2012

Quality Assessment of Landsat Surface Reflectance Products Using MODIS Data

Surface reflectance adjusted for atmospheric effects is a primary input for land cover change detection and for developing many higher level surface geophysical parameters. With the development of automated atmospheric correction algorithms, it is now feasible to produce large quantities of surface reflectance products using Landsat images. Validation of these products requires in situ measurements, which either do not exist or are difficult to obtain for most Landsat images. The surface reflectance products derived using data acquired by the Moderate Resolution Imaging Spectroradiometer (MODIS), however, have been validated more comprehensively. Because the MODIS on the Terra platform and the Landsat 7 are only half an hour apart following the same orbit, and each of the 6 Landsat spectral bands overlaps with a MODIS band, good agreements between MODIS and Landsat surface reflectance values can be considered indicators of the reliability of the Landsat products, while disagreements may suggest potential quality problems that need to be further investigated. Here we develop a system called Landsat-MODIS Consistency Checking System (LMCCS). This system automatically matches Landsat data with MODIS observations acquired on the same date over the same locations and uses them to calculate a set of agreement metrics. To maximize its portability, Java and open-source libraries were used in developing this system, and object-oriented programming (OOP) principles were followed to make it more flexible for future expansion. As a highly automated system designed to run as a stand-alone package or as a component of other Landsat data processing systems, this system can be used to assess the quality of essentially every Landsat surface reflectance image where spatially and temporally matching MODIS data are available. The effectiveness of this system was demonstrated using it to assess preliminary surface reflectance products derived using the Global Land Survey (GLS) Landsat images for the 2000 epoch. As surface reflectance likely will be a standard product for future Landsat missions, the approach developed in this study can be adapted as an operational quality assessment system for those missions.

Landsat↗
DOE OSTI2025

Hyperspectral leaf reflectance of grasses varies with evolutionary lineage more than with site

Abstract To predict ecological responses at broad environmental scales, grass species are commonly grouped into two broad functional types based on photosynthetic pathway. However, closely related species may have distinctive anatomical and physiological attributes that influence ecological responses, beyond those related to photosynthetic pathway alone. Hyperspectral leaf reflectance can provide an integrated measure of covarying leaf traits that may result from phylogenetic trait conservatism and/or environmental conditions. Understanding whether spectra‐trait relationships are lineage specific or reflect environmental variation across sites is necessary for using hyperspectral reflectance to predict plant responses to environmental changes across spatial scales. We measured hyperspectral leaf reflectance (400–2400 nm) and 12 structural, biochemical, and physiological leaf traits from five grass‐dominated sites spanning the Great Plains of North America. We assessed if variation in leaf reflectance spectra among grass species is explained more by evolutionary lineage (as captured by tribes or subfamilies), photosynthetic pathway (C 3 or C 4 ), or site differences. We then determined whether leaf spectra can be used to predict leaf traits within and across lineages. Our results using redundancy analysis ordination (RDA) show that grass tribe identity explained more variation in leaf spectra (adjusted R 2 = 0.12) than photosynthetic pathway, which explained little variation in leaf spectra (adjusted R 2 = 0.00). Furthermore, leaf reflectance from the same tribe across multiple sites was more similar than leaf reflectance from the same site across tribes (adjusted R 2 = 0.12 and 0.08, respectively). Across all sites and species, trait predictions based on spectra ranged considerably in predictive accuracies ( R 2 = 0.65 to <0.01), but R 2 was >0.80 for certain lineages and sites. The relationship between Vc max , a measure of photosynthetic capacity, and spectra was particularly promising. Chloridoideae, a lineage more common at drier sites, appears to have distinct spectra‐trait relationships compared with other lineages. Overall, our results show that evolutionary relatedness explains more variation in grass leaf spectra than photosynthetic pathway or site, but consideration of lineage‐ and site‐specific trait relationships is needed to interpret spectral variation across large environmental gradients.

Pau, Stephanie [Department of Geography University↗
DOE OSTI2018

A dual-layer structure with record-high solar reflectance for daytime radiative cooling

We demonstrate a diffusive solar reflector with record high reflectance when integrated over the wavelength region from 0.28-4.0 μm. The reflector has a dual-layer structure consisting of a polytetrafluoroethylene (PTFE) sheet on top of a silver film. The thickness of the PTFE varies from 0.25 mm to 1 mm. Spectral reflectance and transmittance of the PTFE sheets (with and without a silver film) were measured using a monochromator and a Fourier-transform infrared spectrometer, with integrating spheres, at wavelengths from 0.28 μm to 15 μm. The scattering and absorption coefficients of the PTFE samples were obtained by fitting the reflectance and transmittance spectra. Integration over the solar irradiation spectrum (AM1.5) reveals that the total solar reflectance is approximately 0.99 for the reflector. This is the highest solar reflectance reported to date. A Monte Carlo ray-tracing method and a modified two-flux model were used to calculate the reflectance and compare with the experiments to shed light on mechanisms for the high reflectance. Our measurements also suggest that PTFE has a high emittance around 0.9 in the mid-infrared region. Therefore, we conclude the proposed structure holds promise for passive daytime radiative cooling.

14 SOLAR ENERGY↗
DOE OSTI2020

Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon

Considering reflective properties of materials and photodetection efficiency (PDE) of photodetectors is important for optimizing energy resolution and sensitivity of the next generation neutrinoless double beta decay, direct detection dark matter, and neutrino oscillation experiments that will use noble liquid gases, such as nEXO, DARWIN, DarkSide-20k, and DUNE . Little information is currently available about reflectivity and PDE in liquid noble gases, because such measurements are difficult to conduct in a cryogenic environment and at short enough wavelengths. Here we report a measurement of specular reflectivity and relative PDE of Hamamatsu VUV4 silicon photomultipliers (SiPMs) with 50 μ m micro-cells conducted with xenon scintillation light ( ~ 175 nm) in liquid xenon. The specular reflectivity at 15 o incidence of three samples of VUV4 SiPMs is found to be 30.4 ± 1.4%, 28.6 ± 1.3%, and 28.0 ± 1.3%, respectively. The PDE at normal incidence differs by ± 8% (standard deviation) among the three devices. The angular dependence of the reflectivity and PDE was further measured for one of the SiPMs. Both the reflectivity and PDE decrease as the angle of incidence increases. This is the first measurement of an angular dependence of PDE and reflectivity of a SiPM in liquid xenon.

47 OTHER INSTRUMENTATION↗
DOE OSTI2024

Validation of the VUV-reflective coating for next-generation liquid xenon detectors

Abstract Coating detector materials with films highly reflective in the vacuum ultraviolet region improves sensitivity of the next-generation rare-event detectors that use liquid xenon. In this work, we investigate the MgF 2 -Al-MgF 2 coating designed to achieve high reflectance at 175 nm, the mean wavelength of liquid xenon (LXe) scintillation. The coating was applied to an unpolished, passivated copper substrate mimicking a realistic detector component of the proposed nEXO experiment, as well as to two unpassivated substrates with “high” and “average” levels of polishing. After confirming the composition and morphology of the thin-film coating using TEM and EDS, the samples underwent reflectance measurements in LXe and gaseous nitrogen (GN2). Measurements in LXe exposed the coated samples to -100°C for several hours. No peeling of the coatings was observed after several thermal cycles. Polishing is found to strongly correlate with the measured specular reflectance (R spec ). In particular, 5.8(5)% specular spike reflectance in LXe was measured for the realistic sample at 20° of incidence, while the values for similar angles of incidence on the high and average polish samples are 62.3(1.3)% and 27.4(7)%, respectively. At large angles (66°–75°), theR spec in LXe for the three samples increases to 23(5)%, 80(8)%, and 84(18)%, respectively. The R spec at around 45° was measured in both GN2 and LXe for average polish sample and shows a reasonable agreement. Importantly, the total reflectance of the samples is comparable and estimated to be 92(8)%, 85(8)%, and 83(8)% in GN2 for the realistic, average, and high polish samples, respectively. This is considered satisfactory for the next-generation LXe experiments that could benefit from using reflective films, such as nEXO and DARWIN, thus validating the design of the coating.

Instruments & Instrumentation↗
DOE OSTI2022

Quasielastic least-squares reverse time migration of PS reflections

Conventional analysis of amplitude variation with offset for elastic PS reflections is based on analytical reflection coefficients in a layered medium, and wave-equation-based PS migration is mainly used to produce a structural image. To overcome this problem, we have developed a least-squares reverse time migration (LSRTM) method for elastic PS reflections based on a quasielastic wave equation. Here, the quasielastic wave equation can accurately model PS reflections with elastic amplitudes under the first-order Born approximation. Our LSRTM method inverts for perturbations of the S-wave velocity and density by minimizing the L 2 norm of the difference between recorded and predicted PS reflections modeled using a quasielastic wave equation. We refer to our new method as quasielastic LSRTM of PS reflections. Numerical tests on synthetic and field data indicate that our method can properly handle the amplitudes of elastic PS reflections and provides an accurate estimate of the perturbations of S-wave velocity and density. Extending the method to the 3D case is not straightforward and might require incorporating certain PS data processing techniques into the inversion itself.

58 GEOSCIENCES↗
NASA NTRS1975

Further tests of plant canopy reflectance models and investigation of non-Lambertian properties of plant canopies

The experimental bidirectional reflectance of cotton is presented and compared to the Suits vegetation model. Some wheat reflectance data are presented for a Mexican dwarf wheat. The general results are that the exchange of source position and detector position gives the same reflectance measurement if the irradiance is purely specular. This agrees with Suites. The reflectance versus sun angle and reflectance versus detector angle do not agree with the Suits predictions. There is qualitative agreement between the Suits model and reflectance versus wavelength, but quantitative agreement has not been observed. Reflectance of a vegetation canopy with detector azimuth shows a change of 10 to 40% for even sun angles near zenith, so it seems advisable to include azimuthal angles into models of vegetation.

Lemaster, E. W.↗
NASA NTRS1976

Earth-atmosphere system and surface reflectivities in arid regions from LANDSAT multispectral scanner measurements

Programs for computing atmospheric transmission and scattering solar radiation were used to compute the ratios of the Earth-atmosphere system (space) directional reflectivities in the vertical direction to the surface reflectivity, for the four bands of the LANDSAT multispectral scanner (MSS). These ratios are presented as graphs for two water vapor levels, as a function of the surface reflectivity, for various sun elevation angles. Space directional reflectivities in the vertical direction are reported for selected arid regions in Asia, Africa and Central America from the spectral radiance levels measured by the LANDSAT MSS. From these space reflectivities, surface vertical reflectivities were computed applying the pertinent graphs. These surface reflectivities were used to estimate the surface albedo for the entire solar spectrum. The estimated albedos are in the range 0.34-0.52, higher than the values reported by most previous researchers from space measurements, but are consistent with laboratory measurements.

Otterman, J.↗
NASA NTRS1976

Earth-atmosphere system and surface reflectivities in arid regions from Landsat MSS data

Previously developed programs for computing atmospheric transmission and scattering of the solar radiation are used to compute the ratios of the earth-atmosphere system (space) directional reflectivities in the nadir direction to the surface Lambertian reflectivity, for the four bands of the Landsat multispectral scanner (MSS). These ratios are presented as graphs for two water vapor levels, as a function of the surface reflectivity, for various sun elevation angles. Space directional reflectivities in the vertical direction are reported for selected arid regions in Asia, Africa, and Central America from the spectral radiance levels measured by the Landsat MSS. From these space reflectivities, surface reflectivities are computed applying the pertinent graphs. These surface reflectivities are used to estimate the surface albedo for the entire solar spectrum. The estimated albedos are in the range 0.34-0.52, higher than the values reported by most previous researchers from space measurements, but are consistent with laboratory and in situ measurements.

Otterman, J.↗
NASA NTRS1977

Further tests of the suits reflectance model

Experiments performed by stacking cotton leaves in the port of a spectroradiometer indicate that single leaf reflectance ceases to vary with more than two leaves in the visible region and eight leaves in the infrared region. Chance and LeMaster have shown that the Suits spectral reflectance model predicts an asymptotic dependence of crop reflectance on leaf area index (LAI) with crop reflectance static for leaf area indices in excess of two in the visible regions and six in the infrared regions of the spectrum. These results are experimentally verified in the field for Milam and Penjamo spring wheat, and a theoretical relationship is discussed that relates crop reflectance at 650 nm to crop canopy LAI. Experimental data are given that relate observer zenith angle to crop reflectance for wheat. The Suits reflectance model calculations for wheat fail to agree with this data.

Lemaster, E. W.↗
NASA NTRS1980

Effects of management practices on reflectance of spring wheat canopies

The effects of available soil moisture, planting date, nitrogen fertilization, and cultivar on reflectance of spring wheat (Triticum aestivum L.) canopies were investigated. Spectral measurements were acquired on eight dates throughout the growing season, along with measurements of crop maturity stage, leaf area index, biomass, plant height, percent soil cover, and soil moisture. Planting date and available soil moisture were the primary agronomic factors which affected reflectance of spring wheat canopies from tillering to maturity. Comparisons of treatments indicated that during the seedling and tillering stages planting date was associated with 36 percent and 85 percent of variation in red and near infrared reflectances, respectively. As the wheat headed and matured, less of the variation in reflectance was associated with planting date and more with available soil moisture. By mid July, soil moisture accounted for 73 percent and 69 percent of the variation in reflectance in red and near infrared bands, respectively. Differences in spectral reflectance among treatments were attributed to changes in leaf area index, biomass, and percent soil cover. Cultivar and N fertilization rate were associated with very little of the variation in the reflectance of these canopies.

Daughtry, C. S. T.↗
NASA NTRS1981

Soybean canopy reflectance as a function of view and illumination geometry

Reflectances were calculated from measurements at four wavelength bands through eight view azimuth and seven view zenith directions, for various solar zenith and azimuth angles over portions of three days, in an experimental characterization of a soybean field by means of its reflectances and physical and agronomic attributes. Results indicate that the distribution of reflectance from a soybean field is a function of the solar illumination and viewing geometry, wavelength, and row direction, as well as the state of canopy development. Shadows between rows were found to affect visible wavelength band reflectance to a greater extent than near-IR reflectance. A model describing reflectance variation as a function of projected solar and viewing angles is proposed, which approximates the visible wavelength band reflectance variations of a canopy with a well-defined row structure.

Ranson, K. J.↗