Total ionizing dose and single event effects on 12-nm bulk FinFETs.
Abstract not provided.
Wilson, Donald↗
SEARCH · Search NASA
Results for “Single Event Effect”
Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.
Single Event Effects: Space and Atmospheric Environments
The paper discusses the following: 1. Sun-Earth connections. 2. Heavy ions: galactic cosmic rays; solar particle events. 3. Protons: solar particle events; trapped. 4. Atmospheric neutrons. 5. Summary.
Barth, Janet L.↗
Development of a Low-Cost and High-speed Single Event Effects Testers based on Reconfigurable Field Programmable Gate Arrays (FPGA)
A viewgraph presentation on the development of a low cost, high speed tester reconfigurable Field Programmable Gata Array (FPGA) is shown. The topics include: 1) Introduction; 2) Objectives; 3) Tester Descriptions; 4) Tester Validations and Demonstrations; 5) Future Work; and 6) Summary.
Howard, J. W.↗
Radial Dose Profiles: Calculation Refinements and Sensitivities to Single Event Effects Analysis
Comparisons of radial dose calculation are performed, as well as the introduction of important physics to improve the calculation techniques. Also, the consequences to device performance are explored via numerical simulations.
cosmic ray interactions↗
Considerations for a Proton Single Event Effects (SEE) Guideline
The intent of this document is to provide guidance on when and what type of SEE tests should be performed on a device under test (DUT) based on orbit, technology, existing data, and application. It is NOT intended to provide a detailed guideline for how to perform proton SEE radiation tests on electronics.
LaBel, Kenneth A.↗
Test Guideline for Evaluating Low-Energy Proton-Induced Single-Event Effects in Space Systems
No abstract available
Pellish, Jonathan↗
Single-Event Effect Report for EPC Series eGaN FETs: EPC1001, EPC1010, EPC1014, EPC1012
Heavy ion testing of newly available GaN FETs from EPC were tested in March of 2012 at TAM. The EPC1010, EPC1001, EPC1012, and EPC1014 were tested for general radiation response from gold and xenon ions. Overall the devices showed radiation degradation commensurate with breakdown in isolation oxides, and similar testing by EPC and Microsemi agrees with these data. These devices were the first generation production of the device called Gen1. Gen2 parts are scheduled for later in the third quarter of FY2012
Scheick, Leif↗
Single-Event Effect Response of a Commercial ReRAM
We show heavy ion test results of a commercial production-level ReRAM. The memory array is robust to bit upsets. However the ReRAM system is vulnerable to SEFIs due to upsets in peripheral circuits, including the sense amplifier.
commercial-off-the-shelf (COT)↗
Single Event Effects Testing For Low Earth Orbit Missions with Neutrons
Neutrons can effectively be used to screen electronic parts intended to be used in Low Earth Orbit. This paper compares neutron with proton environments in spacecraft and discusses recent comparison testing.
Reddell, Brandon↗
Compendium of Single Event Effects (SEE) Test Results for COTS and Standard Electronics for Low Earth Orbit and Deep Space Applications
We present the results of SEE testing with high energy protons and with low and high energy heavy ions. This paper summarizes test results for components considered for Low Earth Orbit and Deep Space applications.
Reddell, Brandon↗
External Radiation Test Facilities for Testing of Electronics: NASA Overview with Emphasis on Single Event Effects (SEE)
In this presentation we will provide basic radiation effects on electronics, information on radiation effects and sources, a review of domestic SEE facilities and other radiation test facilities.
Space Environment↗
Considerations for a Proton Single Event Effects (SEE) Guideline
The intent of this document is to provide guidance on when and what type of -SEE tests should be performed on a device under test (OUT) based on orbit, technology, existing data, and application. It is NOT intended to provide a detailed guideline for how to perform proton SEE radiation tests on electronics.
LaBel, Kenneth A.↗
The Radiation Assessment Matrix (RAM): A Systematic Approach to Single-Event Effect (SEE) Analysis
Explore the source record for details and available documents.
Ionizing Radiation Effects↗
Guidance for Implementation of a Single Event Effect Criticality Analysis (SEECA)
Explore the source record for details and available documents.
Michael J Campola↗
The Single Event Effects Environment of Space
Explore the source record for details and available documents.
Michael A Xapsos↗
Single-Event Effect Report for EPC Series eGaN FETs: EPC1001, EPC1010, EPC1014, EPC1012
Heavy ion testing of newly available GaN FETs from EPC were tested in March of 2012 at TAM. The EPC1010, EPC1001, EPC1012, and EPC1014 were tested for general radiation response from gold and xenon ions. Overall the devices showed radiation degradation commensurate with breakdown in isolation oxides, and similar testing by EPC and Microsemi agrees with these data. These devices were the first generation production of the device called Gen1. Gen2 parts are scheduled for later in the third quarter of FY2012
Scheick, Leif↗
Single Event Effects Characterization of Dosed UT200SpWPHY01 SpaceWire Physical Layer Transceiver
We present SEE test results for the Cobham SpaceWire transceiver after dosing the device to 300 krad(Si). We performed SEU characterization with variable data rates and patterns. Events resembling SEFIs were also observed and recorded.
Scheick, Leif Z.↗
Single-Event Effects (SEE) Testing Bootcamp at the Texas A&M University (TAMU) Cyclotron Institute
Explore the source record for details and available documents.
Megan Casey↗