The Next Generation of MeV Energy X-ray Sources for Use in the Inspection of Additively Manufactured Parts for Industry
In September 2022, we investigated whether we can change the way we perform non-destructive characterization (NDC) of dense, micrometer-scale objects, e.g., additively manufactured (AM) parts, using the BELLA inverse Compton source (ICS). X-ray computed tomography (CT) is the most suitable technique for NDC of these objects, but often requires x-rays with MeV energy for penetration, sub-mm spatial resolution for small structures, a narrow spectrum for low-artifact images, and the ability to tune x ray energy to image a wide range of materials. The BELLA ICS has the unique potential to produce such an x-ray beam with a repetition rate high enough for CT. We scanned a geometric calibration phantom, fabricated by LLNL, a bearing, and an AM part manufactured by Renishaw. We reconstructed the first CT images of their kind. The results are very promising, and LLNL will present our findings at an SPIE conference.