Improved method of removing plastic backing films from carbon electron microscope replicas.
Plastic backing films removal from carbon electron microscope replicas by maintaining specimens in horizontal position
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Plastic backing films removal from carbon electron microscope replicas by maintaining specimens in horizontal position
Mechanism absolutely immobilizes microscope stage at a preset focus, preserving focus indefinitely. The lock is a second-class lever consisting of a straight body having a fulcrum with a cylindrical bearing surface at one end and a thumbscrew at the other end.
Development and testing of atom probe field-ion microscope and quantitative measurements of atomic order in platinum and nickel alloys
Microscopic structure analysis of inverted nuclear coexistence using Hartree-Fock method
Microscopic and thermal study of n-paraffins as phase change thermal control materials
Microscopic reversibility for rates of chemical reactions with partial resolution of product and reactant states
Microscopic study of solid/liquid phase change in several members of paraffin family
Ammonium perchlorate decomposition, deflagration, sublimation, crystal growth and surface properties, using scanning electron microscope
Metal particles additives behavior in solid rocket propellant combustion, using scanning electron microscope
Bi polycrystalline film grown by vacuum deposition on amorphous substrates investigated for electron microscope beam effects
Electron microscope-thin film microprobe techniques in biomaterial studies of chemical segregation, species diffusion and small particle analysis
Thickness measurement for thin films in inaccessible locations using scanning electron microscope, comparing accuracy with interferometric techniques
Senescent Drosophila melanogaster flight muscle electron microscopic examination showing mitochondria in stages of degeneration
Study of defect structures with field ion microscope
Measuring intermittent enhancement of blinking effect upon addition of neon to imaging gas in helium-tungsten field-ion microscope
Scanning electron microscope used to determine surface morphology of TD-NiCr oxidized at 800 to 1200 deg for up to 64 hours
Electron microscope, electron diffraction, and electron microprobe analysis of defective solid state weldment on liquid hydrogen tank from Apollo 12 fuel cell system
Solar wind microscopic structure, examining interplanetary wave-particle interactions