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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 181 records · Page 10

The transition of ground-based space environmental effects testing to the space environment

The goal of the space flight program at the Center for Commercial Development of Space (CCDS)--Materials for Space Structures is to provide environmentally stable structural materials to support the continued humanization and commercialization of the space frontier. Information on environmental stability will be obtained through space exposure, evaluation, documentation, and subsequent return to the supplier of the candidate material for internal investigation. This program provides engineering and scientific service to space systems development firms and also exposes CCDS development candidate materials to space environments representative of in-flight conditions. The maintenance of a technological edge in space for NASA suggests the immediate search for space materials that maintain their structural integrity and remain environmentally stable. The materials being considered for long-lived space structures are complex, high strength/weight ratio composites. In order for these new candidate materials to qualify for use in space structures, they must undergo strenuous testing to determine their reliability and stability when subjected to the space environment. Ultraviolet radiation, atomic oxygen, debris/micrometeoroids, charged particles radiation, and thermal fatigue all influence the design of space structural materials. The investigation of these environmental interactions is the key purpose of this center. Some of the topics discussed with respect to the above information include: the Space Transportation System, mission planning, spaceborne experiments, and space flight payloads.

Zaat, Stephen V.↗

Cost-effective test methods for Shuttle payloads

Techniques are discussed for deriving constrained vibration mode shapes for Space Shuttle payloads using unconstrained or free-boundary dynamic properties. Application of the residual flexibility method requires measurement of a set of free-boundary modes plus the residual flexibility of the payload-to-orbiter interfaces. The mass-additive approach involves the measurement of unconstrained modes and frequencies of a payload with large masses attached to the interfaces. In either case, the orbiter interfaces of the test-verified payload model are analytically constrained to provide the mode shapes for the Shuttle-constrained configuration. Use of these methods or a hybrid combination of them for structures to which they are applicable allows the difficult and expense associated with development and verification of fixed-base test fixtures to be avoided.

Tinker, Michael L.↗

Cost-effective test methods for Shuttle payloads

Techniques are discussed for deriving constrained vibration mode shapes for space shuttle payloads using unconstrained or free-boundary dynamic properties. Application of the residual flexibility method requires measurement of a set of free boundary modes plus the residual flexibility of the payload-to-orbiter interfaces. The mass-additive approach involves the measurement of unconstrained modes and frequencies of a payload with large masses attached to the interfaces. In either case, the orbiter interfaces of the test-verified payload model are analytically constrained to provide the mode shapes for the shuttle-constrained configuration. Use of these methods or a hybrid combination of them for structures to which they are applicable allows the difficulty and expense associated with development and verification of fixed-base test fixtures to be avoided.

Tinker, Michael L.↗

The Hole-Count Test Revisited: Effects of Test Specimen Thickness

For historical reasons the hole count, an important performance test for the Analytical Electron Microscope (AEM), is somewhat arbitrary yielding different numbers for different investigators. This was not a problem a decade ago when AEM specimens were often bathed with large fluxes of stray electrons and hard x rays. At that time the presence or absence of a thick Pt second condenser (C2) aperture could be detected by a simple comparison of the x-ray spectrum taken 'somewhere in the hole' with a spectrum collected on a 'typical thickness' of Mo or Ag foil. A high hole count of about 10-20% indicated that the electron column needed modifications; whereas a hole count of 1-2% was accepted for most AEM work. The absolute level of the hole count is a function of test specimen atomic number, overall specimen shape, and thin-foil thickness. In order that equivalent results may be obtained for any AEM in any laboratory in the world, this test must become standardized. The hole-count test we seek must be as simpl and as nonsubjective as the graphite 0.344nm lattice-line-resolution test. This lattice-resolution test spurred manufacturers to improve the image resolution of the TEM significantly in the 1970s and led to the even more stringent resolution tests of today. A similar phenomenon for AEM instruments would be welcome. The hole-count test can also indicate whether the spurious x-ray signal is generated by high-energy continuum x rays (bremsstrahlung) generated in the electron column (high K-line to L-line ratio) or uncollimated electrons passing through or around the C2 aperture (low K/L ratio).

Lyman, C. E.↗

Space Environmental Effects Testing and Characterization of the Candidate Solar Sail Material Aluminized Mylar

The usage of solar sails as a propellantless propulsion system has been proposed for many years. The technical challenges associated with solar sails are fabrication of ultralightweight films, deploying the sails and controlling the spacecraft. Integral to all these challenges is the mechanical property integrity of the sail while exposed to the harsh environment of space. This paper describes testing and characterization of a candidate solar sail material, Aluminized Mylar. This material was exposed to a simulated Geosynchronous Transfer Orbit (GTO) and evaluated by measuring thermooptical and mechanical property changes. Testing procedures and results are presented.

Edwards, D. L.↗

The optimum cost-effective test time for redundant systems with specified reliability and confidence

This paper investigates the optimum test time to determine the number of redundant units needed to achieve high reliability with high confidence. Newly designed systems often have high initial failure rates which can be reduced by testing to find failure modes and remove them by redesign. To accurately estimate the required number of redundant units, the test time must be extended to accurately determine the failure rate. If the measured failure rate is used, there is a 50% chance that the actual hardware failure rate is higher. Using the measured failure rate gives only a 50% confidence that the failure rate and number of spares are not too low. After the test, given the measured failure rate and the desired reliability, the number of spares can be determined and the confidence in the reliability computed. Instead of accepting the reliability results of a fixed duration test, it is possible to set the requirements for both the redundant reliability and the confidence level and then compute the test time needed to minimize the total cost required to achieve these requirements. The confidence that the redundant reliability is not too low is increased by using a higher than measured failure rate to increase the number of spares. The higher number of spares increases cost. Longer test time reduces the variance in the failure rate and the increase in the number of spares, so that test cost increases and spares cost decreases. The total cost is the sum of the cost of the test time and the spares. The optimum test time produces the minimum total cost for the system failure rate, mission length, and required reliability and confidence level. Longer testing is justified by reduced cost. Some examples are given.

Harry W Jones↗

Linear Systems LSK389 and LSK489 Dual N-Channel JFET Amplifier Total Ionizing Dose and Single-Event Effects Test Report

The purpose of these tests was to characterize the susceptibility of the LSK389 and LSK489 Dual N-Channel JFET from Linear Systems to Single-Event Latchup due to heavy ions and to Total Ionizing Dose (TID) degradation at -65 °C and intermediate dose rate. The test was carried out to assess suitability of the amplifiers for the Ocean Color instrument (OCI) on the Plankton, Aerosol, Cloud, ocean Ecosystem (PACE) spacecraft.

Ray Ladbury↗

Single-Event Effect Test Report Analog Devices LTC1604AIG#90117 ADC

This study is to characterize the destructive single-event latchup (SEL) susceptibility of the LTC1604AIG#90117 (LTC1604) analog/digital converter (ADC). The device was monitored for SEL current events on the power supplies during exposure to a heavy ion beam at Lawrence Berkeley National Laboratory (LBNL) 88-inch Cyclotron. Testing was performed on September 11, 2021.

single-event latchup (SEL)↗

Single-Event Effect Testing of the Analog Devices AD8041ARZ Operational Amplifier

This study was undertaken to determine the single event transient distribution of a transimpedance amplifier configuration of the AD8041 Operational Amplifier. The AD8041 is made in a bipolar technology and the application of interest has a bipolar supply of ±5 V. The device was monitored for transient events on the output voltage during exposure to a heavy ion beam at Lawrence Berkeley National Laboratory’s (LBNL) 88-inch Cyclotron.

Matthew B. Joplin↗

AMD Radeon e9173 Low Power PCIE GPU Single Event Effects Test Report

The AMD Radeon Embedded e9170 Graphics Processing Unit (GPU), notably the e9173 Peripheral Component Interconnect Express (PCIE) variant, is of interest to Artemis generation programs with requirements for graphics rendering, compute, artificial intelligence (Ai) with a constraints-requiring piece-part procurement and power consumption of less than 50W. In addition to collecting heavy ion data on this device, a secondary purpose of this test campaign was to validate video capture hardware and software workflows used with GPU, microprocessor and system-on-chip device testing. Five (5) test patterns from the NEPP Processor Enclave (NPE) test suite were used with the e9173. The test patterns covered the operating system’s (OS) idle contribution towards the cross section, matrix math using tensorflow-rocm, two artificial intelligence models developed at NASA GSFC, and an industry standard GPU benchmarking application called Mesa GLXGears.

NASA Technical Memorandum (TM) test report for pos↗