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At least 181 records · Page 10

Defect Annihilation in the Directed Self-Assembly of Block Copolymers in Films with Increasing Thickness.

We investigate directed self-assembly (DSA), with 3x density multiplication, of symmetric polystyrene-block-poly(methyl methacrylate) (L-0 = 28 nm) with increasing film thicknesses and reveal a thickness limit above which the defect annihilation mechanism is different than in thinner films. Block copolymer films of increasing thickness underwent DSA on a macroscopic chemical pattern under optimum geometrical and chemical conditions. Scanning electron microscopy and grazing-incidence small-angle X-ray scattering (GISAXS) were used to characterize the long-range ordering and buried structures as a function of film thickness and thermal annealing time. Rotational GISAXS measurements revealed a critical thickness of similar to 3L(0,) below which defect annihilation is cooperative across the film depth and above which it is faster at the free surface than in the film's interior. In the latter case, defects can persist in the film's interior despite perfect assembly and registration at the free surface of the film.

Chen, Xuanxuan↗

Thickness-Tunable Self-Assembled Colloidal Nanoplatelet Films Enable Ultrathin Optical Gain Media

We propose and demonstrate construction of highly uniform, multilayered superstructures of CdSe/CdZnS core/shell colloidal nanoplatelets (NPLs) using liquid interface self-assembly. These NPLs are sequentially deposited onto a solid substrate into slabs having monolayer-precise thickness across tens of cm(2) areas. Because of near-unity surface coverage and excellent uniformity, amplified spontaneous emission (ASE) is observed from an uncharacteristically thin film having 6 NPL layers, corresponding to a mere 42 nm thickness. Furthermore, systematic studies on optical gain of these NPL superstructures having thicknesses ranging from 6 to 15 layers revealed the gradual reduction in gain threshold with increasing number of layers, along with a continuous spectral shift of the ASE peak (similar to 18 nm). These observations can be explained by the change in the optical mode confinement factor with the NPL waveguide thickness and propagation wavelength. This bottom-up construction technique for thickness-tunable, three-dimensional NPL superstructures can be used for large-area device fabrication.

Erdem, Onur↗

Three‐Dimensional Magnetic Reconnection Spreading in Current Sheets of Non‐Uniform Thickness

Abstract Magnetic reconnection in naturally occurring and laboratory settings often begins locally and elongates, or spreads, in the direction perpendicular to the plane of reconnection. Previous work has largely focused on current sheets with a uniform thickness, for which the predicted spreading speed for anti‐parallel reconnection is the local speed of the current carriers. We derive a scaling theory of three‐dimensional (3D) spreading of collisionless anti‐parallel reconnection in a current sheet with its thickness varying in the out‐of‐plane direction, both for spreading from a thinner to thicker region and a thicker to thinner region. We derive an expression for calculating the time it takes for spreading to occur for a current sheet with a given profile of its thickness. A key result is that when reconnection spreads from a thinner to a thicker region, the spreading speed in the thicker region is slower than both the Alfvén speed and the speed of the local current carriers by a factor of the ratio of thin to thick current sheet thicknesses. This is important because magnetospheric and solar observations have previously measured the spreading speed to be slower than previously predicted, so the present mechanism might explain this feature. We confirm the theory via a parametric study using 3D two‐fluid numerical simulations. We use the prediction to calculate the time scale for reconnection spreading in Earth's magnetotail during geomagnetic activity. The results are also potentially important for understanding reconnection spreading in solar flares and the dayside magnetopause of Earth and other planets.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗

Simultaneous thickness and thermal conductivity measurements of thinned silicon from 100 nm to 17 μm

Studies of size effects on thermal conductivity typically necessitate the fabrication of a comprehensive film thickness series. In this Letter, we demonstrate how material fabricated in a wedged geometry can enable similar, yet higher-throughput measurements to accelerate experimental analysis. Frequency domain thermoreflectance (FDTR) is used to simultaneously determine the thermal conductivity and thickness of a wedged silicon film for thicknesses between 100 nm and 17 μm by considering these features as fitting parameters in a thermal model. FDTR-deduced thicknesses are compared to values obtained from cross-sectional scanning electron microscopy, and corresponding thermal conductivity measurements are compared against several thickness-dependent analytical models based upon solutions to the Boltzmann transport equation. Our results demonstrate how the insight gained from a series of thin films can be obtained via fabrication of a single sample.

36 MATERIALS SCIENCE↗

Thickness and temperature dependence of the atomic-scale structure of SrRuO 3 thin films

The temperature-dependent layer-resolved structure of 3 to 44 unit cell thick SrRuO 3 (SRO) films grown on Nb-doped SrTiO 3 substrates is investigated using a combination of high-resolution synchrotron x-ray diffraction and high-resolution electron microscopy to understand the role that structural distortions play in suppressing ferromagnetism in ultra-thin SRO films. The oxygen octahedral tilts and rotations and Sr displacements characteristic of the bulk orthorhombic phase are found to be strongly dependent on temperature, the film thickness, and the distance away from the film–substrate interface. For thicknesses, t, above the critical thickness for ferromagnetism (t > 3 uc), the orthorhombic distortions decrease with increasing temperature above T C . Below T C , the structure of the films remains constant due to the magneto-structural coupling observed in bulk SRO. The orthorhombic distortions are found to be suppressed in the 2–3 interfacial layers due to structural coupling with the SrTiO 3 substrate and correlate with the critical thickness for ferromagnetism in uncapped SRO films.

36 MATERIALS SCIENCE↗

Strain- and thickness-dependent magnetic properties of epitaxial La 0.67 Sr 0.33 CoO 3 /La 0.67 Sr 0.33 MnO 3 bilayers

Magnetic properties and interfacial phenomena of epitaxial perovskite oxides depend sensitively on parameters such as film thickness and strain state. In this work, epitaxial La0 .67 Sr 0.33 CoO 3 (LSCO)/La 0.67 Sr 0.33 MnO 3 (LSMO) bilayers were grown on NdGaO 3 (NGO) and LaAlO 3 (LAO) substrates with a fixed LSMO thickness of 6 nm, and LSCO thickness (t LSCO ) varying from 2 to 10 nm. Soft x-ray magnetic spectroscopy revealed that magnetically active Co 2+ ions that strongly coupled to the LSMO layer were observed below a critical t LSCO for bilayers grown on both substrates. On LAO substrates, this critical thickness was 2 nm, above which the formation of Co 2+ ions was quickly suppressed leaving only a soft LSCO layer with mixed valence Co 3+ /Co 4+ ions. The magnetic properties of both LSCO and LSMO layers displayed strong t LSCO dependence. This critical t LSCO increased to 4 nm on NGO substrates, and the magnetic properties of only the LSCO layer displayed t LSCO dependence. A non-magnetic layer characterized by Co 3+ ions and with a thickness below 2 nm exists at the LSCO/substrate interface for both substrates. Therefore, the results contribute to the understanding of interfacial exchange spring behavior needed for applications in next generation spintronic and magnetic memory devices.

36 MATERIALS SCIENCE↗

Thickness dependent OER electrocatalysis of epitaxial thin film of high entropy oxide

High entropy oxides (HEOs), which contain multiple elements in the same crystallographic site, are a promising platform for electrocatalysis in oxygen evolution reaction (OER). Investigating these materials in epitaxial thin film form expands the possibility of tuning OER activity by several means, which are not realizable in polycrystalline samples. To date, very few such studies have been reported. In this work, the OER activity of single-crystalline thin films of (La 0.2 Pr 0.2 Nd 0.2 Sm 0.2 Eu 0.2 )NiO 3 , grown on NdGaO 3 substrates have been investigated in 0.1 M KOH electrolyte as a function of film thickness. The OER activity increases with the thickness of the film. X-ray absorption spectroscopy measurements find an increase in Ni $d$-O $p$ covalency and a decrease in charge transfer energy with the increase in film thickness. These facilitate higher charge transfer between Ni and surface adsorbates, increasing OER activity. However, the OER process leads to excessive leaching of thicker films and the OER activity of a 75 unit cell thick film is found to be optimal in the present study. In conclusion, this work demonstrates that the thickness of perovskite oxides can be used as a parameter to enhance OER activity.

36 MATERIALS SCIENCE↗

Impact of quantum well thickness on efficiency loss in InGaN/GaN LEDs: Challenges for thin-well designs

We investigate the impact of quantum well (QW) thickness on efficiency loss in c-plane InGaN/GaN LEDs using a small-signal electroluminescence technique. Multiple mechanisms related to efficiency loss are independently examined, including injection efficiency, carrier density vs current density relationship, phase space filling, quantum-confined Stark effect, and Coulomb enhancement. An optimal QW thickness of around 2.7 nm in these InGaN/GaN LEDs was determined for QWs having constant In composition. Despite improved control of deep-level defects and lower carrier density at a given current density, LEDs with thin QWs still suffer from an imbalance in enhancement effects on the radiative and intrinsic Auger–Meitner recombination coefficients. The imbalance in enhancement effects results in a decline in internal quantum efficiency and radiative efficiency with decreasing QW thickness at low current density in LEDs with QW thicknesses below 2.7 nm. Here, we also investigate how LED modulation bandwidth varies with QW thickness, identifying the key trends and their implications for device performance.

36 MATERIALS SCIENCE↗

Anomalous thickness-dependent electrical conductivity in van der Waals layered transition metal halide, Nb 3 Cl 8

Understanding the electronic transport properties of layered, van der Waals transition metal halides (TMHs) and chalcogenides is a highly active research topic today. Of particular interest is the evolution of those properties with changing thickness as the 2D limit is approached. Here, we present the electrical conductivity of exfoliated single crystals of the TMH, cluster magnet, Nb 3 Cl 8 , over a wide range of thicknesses both with and without hexagonal boron nitride (hBN) encapsulation. The conductivity is found to increase by more than three orders of magnitude when the thickness is decreased from 280 µm to 5 nm, at 300 K. At low temperatures and below ~50 nm, the conductance becomes thickness independent, implying surface conduction is dominating. Temperature dependent conductivity measurements indicate Nb 3 Cl 8 is an insulator, however, the effective activation energy decreases from a bulk value of 310 meV to 140 meV by 5 nm. X-ray photoelectron spectroscopy (XPS) shows mild surface oxidation in devices without hBN capping, however, no significant difference in transport is observed when compared to the capped devices, implying the thickness dependent transport behavior is intrinsic to the material. A conduction mechanism comprised of a higher conductivity surface channel in parallel with a lower conductivity interlayer channel is discussed.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

The dependence of tungsten fuzz layer thickness and porosity on tungsten deposition rate and helium ion fluence

Abstract Fuzz formation on a heated tungsten surface in the presence of a helium-containing plasma and tungsten deposition source was investigated. Tungsten samples were exposed at 1123 K to pure helium plasma with ion incident energy of 76 eV, W/He ion flux ratio of ∼ 0.4 × 10 − 4 , and varied helium ion fluence from 0.18 to 3.4 × 10 26 m −2 . Fuzz thickness was measured by cross-sectional scanning electron microscopy to increase from 0.22 to 15 µ m with increasing helium ion fluence. No indication of saturation in fuzz thickness at high fluence was observed, in contrast to fuzz produced on a tungsten surface without tungsten deposition. Additional tungsten samples were exposed at 1123 K to pure helium plasma with ion incident energy of 76 eV, helium ion fluence of ∼ 3.4 × 10 26 m −2 , and varied W/He ion flux ratio from 0.26 to 3.0 × 10 − 4 . Fuzz thickness increased from 7.5 to 120 µ m with increasing W/He ion ratio. A final sample exposed at 1123 K to a mixed helium-deuterium plasma with ion incident energy of 76 eV, helium ion fluence of 0.18 × 10 26 m −2 , and W/He ion flux ratio of 2.2 × 10 − 4 developed nearly identical fuzz structures to that developed in a pure He plasma. As a function of deposited tungsten fluence, all results were found to trace out a single layer-growth curve given by a power law relation, indicating that fuzz thickness is independent of the W/He ion flux ratio in the range investigated and independent of any deuterium present in the plasma. As a result, for tungsten plasma facing walls in magnetic fusion devices at 1000–2000 K with 10 −4 W/He ion flux ratio, fuzz with thicknesses greater than hundreds of microns may form in as little as 10 4 s (in the absence of ELM-induced erosion or annealing), and may more significantly affect its thermophysical properties than fuzz generated without a tungsten deposition source.

Physics↗

Thickness dependence of magnetotransport properties of tungsten ditelluride

Here we investigate the electronic structure of tungsten ditelluride (WTe 2 ) flakes with different thicknesses in magnetotransport studies. The temperature-dependent resistance and magnetoresistance (MR) measurements both confirm the breaking of carrier balance induced by thickness reduction, which suppresses the “turn-on” behavior and large positive MR. The Shubnikov-de-Haas oscillation studies further confirm the thickness-dependent change of electronic structure of WTe 2 and reveal a possible temperature-sensitive electronic structure change. Finally, we report the thickness-dependent anisotropy of the Fermi surface, which reveals that multilayer WTe 2 is an electronic 3D material and the anisotropy decreases as thickness decreases.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Towards Construction of a Novel Nanometer-Resolution MeV-STEM for Imaging Thick Frozen Biological Samples

Driven by life-science applications, a mega-electron-volt Scanning Transmission Electron Microscope (MeV-STEM) has been proposed here to image thick frozen biological samples as a conventional Transmission Electron Microscope (TEM) may not be suitable to image samples thicker than 300–500 nm and various volume electron microscopy (EM) techniques either suffering from low resolution, or low speed. The high penetration of inelastic scattering signals of MeV electrons could make the MeV-STEM an appropriate microscope for biological samples as thick as 10 μm or more with a nanoscale resolution, considering the effect of electron energy, beam broadening, and low-dose limit on resolution. The best resolution is inversely related to the sample thickness and changes from 6 nm to 24 nm when the sample thickness increases from 1 μm to 10 μm. To achieve such a resolution in STEM, the imaging electrons must be focused on the specimen with a nm size and an mrad semi-convergence angle. This requires an electron beam emittance of a few picometers, which is ~1000 times smaller than the presently achieved nm emittance, in conjunction with less than 10 -4 energy spread and 1 nA current. We numerically simulated two different approaches that are potentially applicable to build a compact MeV-STEM instrument: (1) DC (Direct Current) gun, aperture, superconducting radio-frequency (SRF) cavities, and STEM column; (2) SRF gun, aperture, SRF cavities, and STEM column. Beam dynamic simulations show promising results, which meet the needs of an MeV-STEM, a few-picometer emittance, less than 10 -4 energy spread, and 0.1–1 nA current from both options. Also, we designed a compact STEM column based on permanent quadrupole quintuplet, not only to demagnify the beam size from 1 μm at the source point to 2 nm at the specimen but also to provide the freedom of changing the magnifications at the specimen and a scanning system to raster the electron beam across the sample with a step size of 2 nm and the repetition rate of 1 MHz. This makes it possible to build a compact MeV-STEM and use it to study thick, large-volume samples in cell biology.

36 MATERIALS SCIENCE↗

Measurement of Piston Deposit Thickness Using Laser Profilometer

In this work, a novel method of measuring the thickness of deposits on engine pistons, including within ring grooves, is described. A laser profilometer is used in conjunction with a rotary stage to measure a continuous profile of the piston with deposits, and the measurement is repeated after cleaning the deposits from the piston. Algorithms for aligning the scans and determining the differential thickness are described, and results are compared to deposit thickness measurements using a contact-type magnetic induction coating thickness gauge. This method allows continuous measurement of deposit thickness across the entire surface including lands and ring grooves as well as quantification of the volume of the deposits.

42 ENGINEERING↗

Effect of trailing edge geometry and thickness on the performance of certain turbine stator blading

The experimental and analytical investigation included solid blades with five different trailing-edge thicknesses and four different trailing-edge geometries. One of the geometries was round, one was square, one was tapered from the suction surface, and the other tapered from the pressure surface. One of the trailing-edge thicknesses was sharp edged; the other four thicknesses were equivalent to about 5, 11, 16, and 20 percent of the blade throat width. The experimental results show increased efficiency loss for increased trailing-edge thickness for all trailing-edge geometries. The blade with round trailing edge, equal to about 11 percent of the blade throat width, had 60 percent more loss than the sharp-edged blade. For the same trailing-edge thickness, square trailing edges caused more loss than round trailing edges, and the tapered trailing edges caused about the same loss as the round trailing edges.

Prust, H. W., Jr.↗

Effect of specimen thickness of fatigue-crack-growth behavior and fracture toughness of 7075-T6 and 7178-T6 aluminum alloys

A study was made to determine the effects of specimen thickness on fatigue crack growth and fracture behavior of 7075-T6 and 7178-T6 aluminum alloy sheet and plate. Specimen thicknesses ranged from 5.1 to 12.7 mm (0.20 to 0.50 in.) for 7075-T6 and from 1.3 to 6.4 mm (0.05 to 0.25 in.) for 7178-T6. The stress ratios R used in the crack growth experiments were 0.02 and 0.50. For 7075-T6, specimen thickness had relatively little effect on fatigue-crack growth. However, the fracture toughness of the thickness of the thickest gage of 7075-T6 was about two-thirds of the fracture toughness of the thinner gages of 7075-T6. For 7178-T6, fatigue cracks generally grew somewhat faster in the thicker gages than in the thinnest gage. The fracture toughness of the thickest gage of 7178-T6 was about two-thirds of the fracture toughness of the thinner gages of 7178-T6. Stress intensity methods were used to analyze the experimental results. For a given thickness and value of R, the rate of fatigue crack growth was essentially a single-valued function of the stress intensity range for 7075-T6 and 7178-T6. An empirical equation developed by Forman, Kearney, and Engle fit the 7075-T6 and 7178-T6 crack growth data reasonably well.

Hudson, C. M.↗

Thickness noise of helicopter rotors at high tip speeds

A new formulation of helicopter rotor thickness, noise for hover and forward flight, is discussed. The parameters required for this formulation are rotor motion, planform and airfoil thickness distribution. A computer program has been developed to calculate the pressure signature due to blade thickness for a helicopter in arbitrary motion. Comparison with high-speed helicopter tests shows good agreement with calculations when the observer is in or near the horizontal plane in which the rotor disk lies. Characteristics of thickness noise are illustrated by numerical examples indicating strongly that the high-speed blade slap may be due primarily to the thickness effect. The methods of Deming and Arnoldi are discussed as the special cases of this technique.

Farassat, F.↗

Shockless airfoils with thicknesses of 20.6 and 20.7 percent chord analytically designed for a Mach number of 0.68 and a lift coefficient of 0.40

A 20.8 percent-thick airfoil shape was designed to have shockless inviscid flow at a Mach number of 0.68 and a lift coefficient of 0.40. In order to determine the actual airfoils which would yield this same shockless flow when viscous effects are included, boundary layer displacement thicknesses were subtracted from the inviscid shape for Reynolds numbers of 100 and 35 million. This process yielded airfoils with thicknesses of 20.7 and 20.6 percent, respectively. Subtraction of boundary layer displacement thicknesses for Reynolds numbers below 35 million yielded nonphysical airfoils, that is airfoils with negative thicknesses near tHe trailing edge. The pitching moment about the quarter-chord point at the design condition was -0.082 for the inviscid shape and, consequently, for both airfoils. Off-design calculations for the two airfoils were made using a computer program which provides for the interaction of the inviscid flow and boundary layer solutions. The pressure distributions of the airfoils were shockless for conditions from the design point to lower Mach numbers and lift coefficients. No boundary layer separation was predicted except in the last 3 percent chord on the upper surface.

Allison, D. O.↗

Flight-measured pressure characteristics of aft-facing steps in thick boundary layer flow for transonic and supersonic Mach numbers

Aft-facing step base pressure flight data were obtained for three step heights for nominal transonic Mach numbers of 0.80, 0.90, and 0.95, and for supersonic Mach numbers of 2.2, 2.5, and 2.8 with a Reynolds number, based on the fuselage length ahead of the step, of about 10 to the 8th power. Surface static pressures were measured ahead of the step, behind the step, and on the step face (base), and a boundary layer rake was used to obtain boundary layer reference conditions. A comparison of the data from the present and previous experiments shows the same trend of increasing base pressure ratio (decreasing drag) with increasing values of momentum thickness to step height ratios. However, the absolute level of these data does not always agree at the supersonic Mach numbers. For momentum thickness to height ratios near 1.0, the differences in the base pressure ratios appear to be primarily a function of Reynolds number based on the momentum thickness. Thus, for Mach numbers above 2, the data analyzed show that the base pressure ratio decreases (drag increases) as Reynolds number based on momentum thickness increases for a given momentum thickness and step height.

Powers, S. G.↗