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Radiation test data submitted by many testers is collated to serve as a reference for engineers who are concerned with and have some knowledge of the effects of the natural radiation environment on microcircuits. Total dose damage information and single event upset cross sections, i.e., the probability of a soft error (bit flip) or of a hard error (latchup) are presented.
Future space power needs are extrapolated to be at least three to four orders of magnitude more than is currently available. This long-term reliable power will be required on missions such as the Space Station, Pathfinder, Space Plane, and high-powered satellites, and for defense. Electrical insulation and dielectrics are the key electrical materials needed to support these power systems, where a single-point system failure could prove catastrophic or even fatal for the whole mission. Therefore, the impact of radiation, an environmental stress, on the properties and performance of insulation and dielectrics must be understood. The influence of radiation on polymer dielectrics, the insulating materials most commonly used for power transmission and storage, is reviewed. The effects of the type of radiation, dose, rate, and total exposure on the key electrical, mechanical, and physical properties of polymer dielectrics are described and explained.
Testing methods for memories and non-volatile memories have become increasingly sophisticated as they become denser and more complex. High frequency and faster rewrite times as well as smaller feature sizes have led to many testing challenges. This paper outlines several testing issues posed by novel memories and approaches to testing for radiation and reliability effects. We discuss methods for measurements of Total Ionizing Dose (TID).
Total dose test of commercially available radiation hardened bipolar voltage regulators and references show reduced sensitivity to dose rate and varying sensitivity to bias under pressure. Behavior of critical parameters in different dose rate and bias conditions is compared and the impact to hardness assurance methodology is discussed.
Single-event-effect test results for hi-rel total-dose-hardened power MOSFETs are presented in this report. TheSCF9550 from Semicoa and the IRHM57260SE from International Rectifier were tested to NASA test condition/standards and requirements.The IRHM57260SE performed much better when compared to previous testing. These initial results confirm that parts from the Temecula line are marginally comparable to the El Segundo line. The SCF9550 from Semicoa was also tested and represents the initial parts offering from this vendor. Both parts experienced single-event gate rupture (SEGR) and single-event burnout (SEB). All of the SEGR was from gate to drain.
The purpose of this testing was to perform a Radiation Lot Acceptance Test (RLAT) for Total Ionizing Dose (TID) of MAX4651 Low-Voltage, 4Ω, Quad, SPST, CMOS Analog Switches for the Roman Space Telescope (RST).
This study was undertaken to determine the total ionizing dose (TID) sensitivity of the PA10 Power Op Amp Manufactured by APEX (figure 1), which is a candidate for use on the LDCM TIRS instrument. The test was conducted with interest in both parametric degradation and functional failure in the configuration like that of the TIRS application. (See figure 2). The DUT was irradiated in a stepwise fashion, with parametric and functional degradation measured between steps. The parts were irradiated with gamma rays at a low dose rate (~0.01 rads(Si)/sec.).
NASA spacecraft are subjected to a harsh space environment that includes exposure to various types of ionizing radiation. The performance of electronic devices in a space radiation environment are often limited by their susceptibility to single event effects (SEE). Ground-based testing is used to evaluate candidate spacecraft electronics to determine risk to spaceflight applications. Interpreting the results of radiation testing of complex devices is and adequate understanding of the test condition is critical. Studies discussed herein were undertaken to establish the application-specific sensitivities of candidate spacecraft and emerging electronic devices to single-event upset (SEU), single-event latchup (SEL), single-event gate rupture (SEGR), single-event burnout (SEB), and single-event transient (SET). For total ionizing dose (TID) and displacement damage dose (DDD) results, see a companion paper submitted to the 2015 Institute of Electrical and Electronics Engineers (IEEE) Nuclear and Space Radiation Effects Conference (NSREC) Radiation Effects Data Workshop (REDW) entitled "compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA by M. Campola, et al.
A CMOS circuit formed in a semiconductor substrate having improved immunity to total ionizing dose radiation, improved immunity to radiation induced latch up, and improved immunity to a single event upset. The architecture of the present invention can be utilized with the n-well, p-well, or dual-well processes. For example, a preferred embodiment of the present invention is described relative to a p-well process wherein the p-well is formed in an n-type substrate. A network of NMOS transistors is formed in the p-well, and a network of PMOS transistors is formed in the n-type substrate. A contact is electrically coupled to the p-well region and is coupled to first means for independently controlling the voltage in the p-well region. Another contact is electrically coupled to the n-type substrate and is coupled to second means for independently controlling the voltage in the n-type substrate. By controlling the p-well voltage, the effective threshold voltages of the n-channel transistors both drawn and parasitic can be dynamically tuned. Likewise, by controlling the n-type substrate, the effective threshold voltages of the p-channel transistors both drawn and parasitic can also be dynamically tuned. Preferably, by optimizing the threshold voltages of the n-channel and p-channel transistors, the total ionizing dose radiation effect will be neutralized and lower supply voltages can be utilized for the circuit which would result in the circuit requiring less power.
Field programmable gate arrays (FPGA) are used in every space application. Currently, most space flight applications use radiation hardened (RH) FPGAs, which are very expensive. There is a desire to use cheaper, commercial off the shelf reprogrammable FPGAs, which are more susceptible to radiation effects known as single-event effects (SEE). The RH parts have SEE and total ionizing dose (TID) hardened elements pre-integrated into the part. This means that the designer does not need to implement any hardening techniques while configuring the device. The COTS parts on the other hand must be mitigated by design in order to insure any form of mitigation. The design techniques this project examines concern the use of localized triple modular redundancy (LTMR) and distributed triple modular redundancy (DTMR). LTMR triples every flip flop in the device architecture while DTMR triples everything except for the global routes (clocks, resets, and enables). The testing was performed on a ProASIC3E FPGA at the Texas A&M cyclotron facility. Two design architectures were used: shift registers and counters, both with LTMR and DTMR mitigation techniques. The test results prove that DTMR is more effective at reducing SEE than LTMR. We also determined that there was not a significant difference between the use of shift registers and counters for test purposes. More testing is required to obtain additional linear energy transfer values for each architecture and mitigation technique in order to determine the most cost-effective method of SEE mitigation.
The goal of part II of this study was to evaluate the effects of gamma-radiation on circulating blood cells, functional characteristics of splenocytes, and cytokine expression after whole-body irradiation at varying total doses and at low- and high-dose-rates (LDR, HDR). Young adult C57BL/6 mice (n = 75) were irradiated with either 1 cGy/min or 80 cGy/min photons from a 60Co source to cumulative doses of 0.5, 1.5, and 3.0 Gy. The animals were euthanized at 4 days post-exposure for in vitro assays. Significant dose- (but not dose-rate-) dependent decreases were observed in erythrocyte and blood leukocyte counts, hemoglobin, hematocrit, lipopolysaccharide (LPS)-induced 3H-thymidine incorporation, and interleukin-2 (IL-2) secretion by activated spleen cells when compared to sham-irradiated controls (p < 0.05). Basal proliferation of leukocytes in the blood and spleen increased significantly with increasing dose (p < 0.05). Significant dose rate effects were observed only in thrombocyte counts. Plasma levels of transforming growth factor-beta 1 (TGF-beta 1) and splenocyte secretion of tumor necrosis factor-alpha (TNF-alpha) were not affected by either the dose or dose rate of radiation. The data demonstrate that the responses of blood and spleen were largely dependent upon the total dose of radiation employed and that an 80-fold difference in the dose rate was not a significant factor in the great majority of measurements.
Infrared (IR) spectroscopy and tensile modulus testing were used to evaluate the importance of experimental procedure on changes in properties of pyromellitic dianhydride-p,p prime-oxydianiline film exposed to electron radiation. The radiation exposures were accelerated, approximate equivalents to the total dose expected for a 30 year mission in geosynchronous Earth orbit. The change in the tensile modulus depends more on the dose rate and the time interval between exposure and testing than on total dose. The IR data vary with both total dose and dose rate. A threshold dose rate exists below which reversible radiation effects on the IR spectra occur. Above the threshold dose rate, irreversible effects occur with the appearance of a new band. Post-irradiation and in situ IR absorption bands are significantly different. It is suggested that the electron radiation induced metastable, excites molecular states.
Experiments are described to test a theory for the origin of optical activity wherein the longitudinally polarized electrons resulting from parity violation during radioactive beta-decay, and their resulting circularly polarized bremsstrahlung, might interact asymmetrically with organic matter to yield optically active products. The historical background to this subject is briefly reviewed. Our experiments involve subjecting a number of racemic and optically active amino acid samples to a beta-radiation source for a period of 1.34 years (total dose: 411 Mrads), then examining them for any asymmetric effects by means of optical rotatory dispersion and analytical gas chromatography.
A test chip set being developed to aid in the qualification of spaceborne Application Specific Integrated Circuits (ASICs) is described. The chip set consists of a process monitor for process parameter verification, a fault chip for yield analysis, a reliability chip for ASIC failure rate analysis, and total ionizing dose and single event upset chips for radiation effect analysis. The test structures contained in these chips are discussed along with representative test results.
A Space Environment Monitor (SEM) subsystem architecture has been developed and demonstrated that can benefit future spacecraft by providing (1) real-time knowledge of the spacecraft state in terms of exposure to the environment; (2) critical, instantaneous information for anomaly resolution; and (3) invaluable environmental data for designing future missions. The SEM architecture consists of a network of plug-and- play (PnP) Sensor Interface Units (SIUs), each servicing one or more environmental sensors. The SEM architecture is influenced by the IEEE Smart Transducer Interface Bus standard (IEEE Std 1451) for its PnP functionality. A network of PnP Spacecraft SIUs is enabling technology for gathering continuous real-time information critical to validating spacecraft health in harsh space environments. The demonstrated system that provided a proof-of-concept of the SEM architecture consisted of three SIUs for measurement of total ionizing dose (TID) and single event upset (SEU) radiation effects, electromagnetic interference (EMI), and deep dielectric charging through use of a prototype Internal Electro-Static Discharge Monitor (IESDM). Each SIU consists of two stacked 2X2 in. (approximately 5X5 cm) circuit boards: a Bus Interface Unit (BIU) board that provides data conversion, processing and connection to the SEM power-and-data bus, and a Sensor Interface Electronics (SIE) board that provides sensor interface needs and data path connection to the BIU.
This handbook was assembled to document he radiation environment for design of Orbiter avionics. It also maps the environment through vehicle shielding and mission usage into discrete requirements such as total dose. Some details of analytical techniques for calculating radiation effects are provided. It is anticipated that appropriate portions of this document will be added to formal program specifications.
Radioisotope Power Systems (RPS) have been and will be enabling or significantly enhancing for many missions, including several concepts identified in the 2011 Planetary Science Decadal Survey. Some mission planners and science investigators might have concerns about possible impacts from RPS-induced conditions upon the scientific capabilities of their mission concepts. To alleviate these concerns, this paper looks at existing and potential future RPS designs, and examines their potential radiation, thermal, vibration, electromagnetic interference (EMI), and magnetic fields impacts on representative science instruments and science measurements. Radiation impacts from RPS on science instruments are of potential concern for instruments with optical detectors and instruments with high-voltage electronics. The two main areas of concern are noise effects on the instrument measurements, and long-term effects of instrument damage. While RPS by their nature will contribute to total radiation dose, their addition for most missions should be relatively small. For example, the gamma dose rate from one Multi-Mission Radioisotope Thermoelectric Generator (MMRTG) would be an order of magnitude lower than the environmental dose rate at Mars, and would have a correspondingly lower contribution to instrument noise and to any permanent damage to payload sensors. Increasing the number of General Purpose Heat Source (GPHS) modules used in an RPS would be expected to increase the generated radiation proportionally; however, the effect of more GPHS modules is mitigated from a strictly linear relationship by self-shielding effects. The radiation field of an RPS is anisotropic due to the deviation of the modules from a point-source-geometry. For particularly sensitive instruments the total radiation dose could be mitigated with separation or application of spot shielding. Though a new, higher-power RPS could generate more heat per unit than current designs, thermal impact to the flight system could be mitigated with shading and pointing if required by the mission. Alternatively, excess heat could prove beneficial in providing needed heat to spacecraft components and instruments in some thermal environments. Vibration for a new higher-power Stirling Radioisotope Generator (SRG) would be expected to be similar to the recent Advanced Stirling Radioisotope Generator (ASRG) design. While vibration should be low, it must be considered and addressed during spacecraft and instrument design. EMI and magnetic fields for new RPS concepts are expected to be low as for the current RPS, but must be considered and addressed if the mission includes sensitive instruments such as magnetometers. The assessment conducted for this paper focused on orbiter instrument payloads for two representative mission concepts- a Titan Saturn System Mission (TSSM) and a Uranus Orbiter and Probe (UOP)-since both of these Decadal Survey concepts would include many diverse instruments on board. Quick-look design studies using notional new RPS concepts were carried out for these two mission concepts, and their specific instrument packages were analyzed for their interactions with new RPS designs. The original Decadal Survey TSSM and UOP concepts did not have complete instrument performance requirements so typical measurement requirements were used where needed. Then, the general RPS environments were evaluated for impacts to various types of instruments. This paper describes how the potential impacts of the RPS on science instruments and measurements were assessed, which impacts were addressed, proposed mitigation strategies against those impacts, and provides an overview of future work.
A multianode microchannel array (MAMA) detector tube without a photocathode was exposed to a total dose of 1,000,000 rads of 1-MeV gamma radiation from a Co-60 source. The high-voltage characteristic of the microchannel array plate, average dark count, gain, and resolution of pulse height distribution characteristics showed no degradation after this total dose. In fact, the degassing of the microchannels induced by the high radiation flux had the effect of cleaning up the array plate and improving its characteristics.