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At least 217 records · Page 12

The Fluorescent Decay of CsI(T1) Excited by Charged Particles

The fluorescence from a CsI(0.08% T1) scintillator excited by charged particles which come to a stop within the scintillator has been measured for alpha particles, deuterons, and protons. In the region 0.1 to 0.6 microseconds after its initial rise, the fluorescent decay can be accurately described by a simple exponential. The characteristic time for this exponential decay has been measured at several energies up to 28.7 MeV for a particles and 7.2 MeV for protons. We have found a linear relationship between this decay time and the logarithm of the particle energy, τ = k ln E + τo, where k and τo are constants which are characteristic of the type of stopping particle.

Womack, E. A.↗

Trajectories of charged particles in radial electric and uniform axial magnetic fields

Trajectories of charged particles were determined over a wide range of parameters characterizing motion in cylindrical low-pressure gas discharges and plasma heating devices which have steady radial electric fields perpendicular to uniform steady magnetic fields. Consideration was given to radial distributions characteristic of fields measured in a modified Penning discharge, in two NASA Lewis burnout-type plasma heating devices, and that estimated for the Ixion device. Numerical calculations of trajectories for such devices showed that differences between cyclotron frequency and qB/m and between azimuthal drift and a guiding center approximation are appreciable.

Englert, G. W.↗

Controlling Charged Particles with Inhomogeneous Electrostatic Fields

An energy analyzer for a charged-particle spectrometer may include a top deflection plate and a bottom deflection plate. The top and bottom deflection plates may be non-symmetric and configured to generate an inhomogeneous electrostatic field when a voltage is applied to one of the top or bottom deflection plates. In some instances, the top and bottom deflection plates may be L-shaped deflection plates.

Herrero, Federico A.↗

DNA Damage by Ionizing Radiation: Tandem Double Lesions by Charged Particles

Oxidative damages by ionizing radiation are the source of radiation-induced carcinogenesis, damage to the central nervous system, lowering of the immune response, as well as other radiation-induced damages to human health. Monte Carlo track simulations and kinetic modeling of radiation damages to the DNA employ available molecular and cellular data to simulate the biological effect of high and low LET radiation io the DNA. While the simulations predict single and double strand breaks and base damages, so far all complex lesions are the result of stochastic coincidence from independent processes. Tandem double lesions have not yet been taken into account. Unlike the standard double lesions that are produced by two separate attacks by charged particles or radicals, tandem double lesions are produced by one single attack. The standard double lesions dominate at the high dosage regime. On the other hand, tandem double lesions do not depend on stochastic coincidences and become important at the low dosage regime of particular interest to NASA. Tandem double lesions by hydroxyl radical attack of guanine in isolated DNA have been reported at a dosage of radiation as low as 10 Gy. The formation of two tandem base lesions was found to be linear with the applied doses, a characteristic of tandem lesions. However, tandem double lesions from attack by a charged particle have not been reported.

Huo, Winifred M.↗

Fokker-Planck equations for charged-particle transport in random fields.

The Fokker-Planck equations for charged-particle dynamics are rederived, extending somewhat the elegant discussion of Hasselmann and Wibberenz. It is shown that the usual results are obtae and the conclusions in many cases are correct over a very broad range in energy. In particular, the rate for pitch-angle scattering may be accurately given down to energies much lower than previously thought. Recent claims that these Fokker-Planck equations are in general incorrect are thus shown to be in error.

Jokipii, J. R.↗