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We present the current status of United States domestic heavy ion single-event effects (SEE) radiation test facilities, including general perspectives on near- and mid-term needs for both capacity and capabilities.
The two main objectives of this trade study are characterizing the mission radiation environment for multiple Design Reference Missions (DRM) and analysis of radiation effects on avionics with the goal of producing radiation tolerant Neuromorphic Computing processor chips with innovative radiation-induced fault mitigation. The NASA process for defining radiation requirements for flight avionics is applied to this domain. The effects of trapped protons and electrons in the Van Allen radiation belts predominates in Low-Earth-Orbit (LEO) and the solar wind, solar flares and Galactic Cosmic Rays (GCRs) are the dominant radiation challenge in the open space between the planets of our solar system. The nature and energy of the particles that cause circuit upset and failure is very different in the two regimes. Two results are produced from the radiation models: determining the Total Integrated Dose (TID) experienced by avionics for a given DRM and predicting the Single Event Effects (SEE) rates for avionics during high rate exposure. These tools are applied to existing semiconductors and can be used for predicting the radiation performance of future semiconductors based on early radiation testing of new devices.
- NAIRAS Model Description - Nowcast of Aerospace Ionizing RAdiation System (NAIRAS) Model - Running in real-time on LaRC computer cluster since 2011, results hosted on Space Environment Technologies server/website - Running in real-time at CCMC since 2020 - Key Model Features - Global ionizing radiation environment model - Physics-based HZETRN (High Charge (Z) and Energy TRaNsport) code - Real-time inclusion of solar energetic particle (SEP) radiation - Real-time solar-magnetospheric effects on radiation (cutoff model by Kress et al. [2004, 2010]) - New/Current Model Development - Improved SEP dose nowcast and forecast - Extend to low-Earth orbit (LEO) environment - Single-Event Effects (SEE) radiation risk assessment quantities - Run-on-Request (RoR) @ CCMC
The Nowcast of Aerospace Ionizing RAdiation System (NAIRAS) predicts dosimetric quantities for quantifying human radiation exposure and differential/integral flux/fluence quantities for assessing single event effects (SEE) in avionic systems from galactic cosmic rays (GCR), trapped inner belt protons, and solar energetic particle (SEP) events from the Earth’s surface to the space environment. Real-time predictions of the aviation radiation environment are available at NASA Goddard Space Flight Center’s Community Coordinated Modeling Center (CCMC) integrated Space Weather Analysis (iSWA) data feeds and cygnets, and a run-on-request (RoR) capability has also been deployed at CCMC. Recent model improvements include a more accurate atmospheric ionizing radiation transport methodology and more robust and reliable SEP nowcast dose predictions. In addition, preliminary results of SEP dose forecasts are shown by coupling the University of Malaga Solar Energetic Particle (UMASEP) model of integral proton flux forecasts with the NAIRAS model. These model updates and improvements are presented, and results are shown for aircraft, high-latitude balloon, and low-Earth orbit flights during quiescent and solar-geomagnetic disturbed conditions. Model comparisons with flight measurements are also shown.
Single-Event Effects (SEE) testing was previously conducted on the AMD v1200 System on Chip (SoC) at Massachusetts General Hospital’s (MGH) Francis H. Burr Proton Therapy Center on May 28, 2022, using 200-MeV protons.
We present single event effects (SEE) evaluation of the Everspin Technologies 1Gb non-volatile ST-DDR4 spin-transfer torque MRAM.
The Nowcast of Aerospace Ionizing RAdiation System (NAIRAS) model is a real-time, global, physics-based model originally developed to predict exposure from cosmic radiation to air travelers from both galactic and solar sources. A prototype operational NAIRAS model has provided tabular and graphical data products via its public web site for about ten years. A new version of the NAIRAS model has been developed that incorporates an extension of the model domain from the atmospheric ionizing radiation environment to the space radiation environment, with the addition of the trapped inner belt proton source and altitude-dependent and rigidity-dependent geomagnetic shielding of the galactic cosmic rays (GCR) and solar energetic particle (SEP) protons. New output products of differential and integral particle flux have been developed for the characterization of single-event effects (SEE), expanding the application of NAIRAS from human radiation exposure assessment to allowing end-users to quantify radiation environment risks to aviation and spacecraft microelectronic systems. The NAIRAS model has transitioned to prototype operations at the Community Coordinated Modeling Center (CCMC) where the model now operates in two modes: (1) real-time global predictions of the atmospheric radiation environment and (2) a run-on-request (RoR) service allowing the user to select a specific time period for the global dosimetric calculations, or to upload an aircraft, balloon, or spaceflight trajectory file to provide predictions of the dosimetric and particle flux quantities along the flight path. The new features of NAIRAS version 3.0 are described in this paper and example results of the new output products for low-Earth orbit (LEO), medium-Earth orbit (MEO), and free-space radiation environments are presented
The purpose of this test was to characterize the single-event effects (SEE) susceptibility of the Texas Instrument (TI) DRV8881 2.5A Dual H-Bridge Motor Driver. The device’s output was monitored for changes during exposure to heavy-ions at Lawrence Berkeley National Laboratory (LBNL) 88-inch Cyclotron. The main goal of testing was to test for destructive SEEs. Nondestructive SEEs were recorded during testing but not fully characterized. Testing was performed on November 9th and 11th, 2022.
This irradiation campaign was performed to evaluate the destructive single event effect (SEE) susceptibility of a n-channel power MOSFET from SSDI for space-based instrumentation. Testing was performed at Michigan State University’s (MSU) Facility for Rate Isotope Beams (FRIB) using an LET of 50.5 MeV·cm 2 /mg
Radiation effects in electrical, electronic, electro-motive, and electro-optical (EEEE) hardware encompass a complex variety of interactions, processes, environments, and an evolving landscape of relevant hardware. Appropriately mitigating the effects of radiation in sensors, data acquisition, and control hardware is among the most significant challenges associated with deploying space nuclear power and propulsion systems. The expertise within EEEE radiation effects disciplines require working knowledge that is at least as complex and diverse as the problem itself, but that should not dissuade stakeholders and engineers in adjacent disciplines from attempting to understand the general principles associated with the problem at hand. This brief overview seeks to bring to the foreground a set of relevant topics that are of special importance for space nuclear propulsion applications that involve high rates of neutron and gamma radiation. The unique set of environments and design requirements for space nuclear systems mean that the experience and utility for methods applied to typical spaceflight hardware or terrestrial nuclear systems must not be applied naively. Forward consideration on the applicability of testing methods applied to either existing or bespoke hardware is likely to drive early decisions on system-wide radiation effects mitigation strategies, and will influence procurement requirements for providers of radiation tolerant hardware who are unlikely to have experience in this unique set of environments. Radiation hardness assurance (RHA) guidance should be adapted and emphasize the importance of hardware testing in the relevant environment. These must consider the combined effects of temperature, total ionizing dose (TID), non-ionizing/displacement damage (TNID/DD), and single event effects (SEE), and should consider the impacts of flux (rate) in addition to cumulative effects.
We present single-event effect (SEE) test results and analysis produced by NASA JSC in 2023 for candidate electronic components and devices. Test environments include heavy ions or protons, depending on the intended use case regarding mission, environment, application, and lifetime.
Single-event effects (SEE) and total ionizing dose (TID) data are presented for several automotive- and industrial-grade solid-state drives, and the effects of different active test configurations on hardness assurance are explored.
The Analog Devices ADXL354 3-AXIS MEMS accelerometer was tested for single-event effects, both destructive and non-destructive. The device was characterized for single-event upset (SEU) sensitivity and evaluated for any possibility of single-event latchup (SEL), single-event dielectric rupture (SEDR) and single-event functional interrupts (SEFI). Single-event transient (SET) response was also monitored.
The presentation will cover a variety of mitigation strategies that were developed for critical applications. An emphasis is placed on strengths and weaknesses per mitigation technique as it pertains to different Field programmable gate array (FPGA) device types.
In 1972, when engineers at Hughes Aircraft Corporation discovered that errors in their satellite avionics were being caused by cosmic rays (so-called single-event effects, or SEE), Moore's Law was only 7 years old. Now, more than 45 years on, the scaling that drove Moore's Law for its first 35 years has reached its limits. However, electronics technology continues to evolve exponentially and SEE remain a formidable issue for use of electronics in space. SEE occur when a single ionizing particle passes through a sensitive volume in an active semiconductor device and generates sufficient charge to cause anomalous behavior or failure in the device. Because SEE can occur at any time during the mission, the emphasis of SEE risk management methodologies is ensuring that all SEE modes in a device under test are detected by the test. Because a particle's probability of causing an SEE generally increases as the particle becomes more ionizing, heavy-ion beams have been and remain the preferred tools for elucidating SEE vulnerabilities. In this talk we briefly discuss space radiation environments and SEE mechanisms, describe SEE test methodologies and discuss current and future challenges for use of heavy-ion beams for SEE testing in an era when the continued validity of Moore's law depends on innovation rather than CMOS scaling.
Previous testing of the Enhanced Power Conversion (EPC) eGaN FETs showed sensitivity to destructive single-event effects (SEE) effects to heavy ions. The presence of tungsten plugs in the gate area raises concerns that the device may be vulnerable to SEE from protons. Irradiation of biased and unbiased devices with heavy ion has results in some damage suspected of being due to total non-ionizing dose (TNID). Proton irradiation is a better radiation type to study this effect. This study presents the results of testing device with protons for SEE and TNID. No SEE in the EPC2012 device, the most sensitive device to SEE, were seen with 53 MeV protons at several angles. The devices continued to function after 1.5 Mrad (Si) of proton dose with only a slight shift in parameters. These results suggest that gross TNID will not be a factor in using these devices nor suffer from SEE due to protons. However, the device should be tested at with 500 MeV protons to guarantee to immunity proton SEE.
We have reported on initial SEE sensitivity of the full 49-core Maestro device. Supporting the low-level structures and qualitative system observation goals of phase 1 of testing. Observed sensitivities found to be consistent with Boeing predictions. Highlighted by the L1 data cache sensitivity which drives the rates on the current Maestro device. Presented details to the hardware and software setups that show where the limitations - highlighting future work. Key future work includes testing with memory and IO ports.
While we have been utilizing standard fluence levels such as those listed in the JESD57 document, we have begun revisiting what an appropriate test fluence is when it comes to qualifying a device for single events. Instead of a fixed fluence level or until a specific number of events occurs, a different thought process is required.