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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 217 records · Page 12

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NASA NTRS1989

Product assurance technology for procuring reliable, radiation-hard, custom LSI/VLSI electronics

Advanced measurement methods using microelectronic test chips are described. These chips are intended to be used in acquiring the data needed to qualify Application Specific Integrated Circuits (ASIC's) for space use. Efforts were focused on developing the technology for obtaining custom IC's from CMOS/bulk silicon foundries. A series of test chips were developed: a parametric test strip, a fault chip, a set of reliability chips, and the CRRES (Combined Release and Radiation Effects Satellite) chip, a test circuit for monitoring space radiation effects. The technical accomplishments of the effort include: (1) development of a fault chip that contains a set of test structures used to evaluate the density of various process-induced defects; (2) development of new test structures and testing techniques for measuring gate-oxide capacitance, gate-overlap capacitance, and propagation delay; (3) development of a set of reliability chips that are used to evaluate failure mechanisms in CMOS/bulk: interconnect and contact electromigration and time-dependent dielectric breakdown; (4) development of MOSFET parameter extraction procedures for evaluating subthreshold characteristics; (5) evaluation of test chips and test strips on the second CRRES wafer run; (6) two dedicated fabrication runs for the CRRES chip flight parts; and (7) publication of two papers: one on the split-cross bridge resistor and another on asymmetrical SRAM (static random access memory) cells for single-event upset analysis.

Buehler, M. G.↗

NASA NTRS1990

Environment induced anomalies on the TDRS and the role of spacecraft charging

The NASA Tracking and Data Relay Satellites (TDRS) have experienced several classes of anomalies that appear to be related to the natural environment. The most serious of these have been anomalies in the Attitude Control System control processor electronics which resulted in check sum errors that were ultimately traced to high-energy, particle-induced single event upsets in the RAM memory. Three other types of anomalies on TDRS have also been correlated with environmental effects. This paper briefly documents the occurrences of these anomalies and describes the nature of each. These events are correlated with various environmental factors. For all cases, there appears to be a causal relationship between spacecraft charging events and the engineering anomalies.

Garrett, H. B.↗

NASA NTRS1989

Variation in SEU sensitivity of dose-imprinted CMOS SRAMs

The authors report on an experimental study of dose-induced changes in SEU (single-event-upset) sensitivity of CMOS static RAMs. Two time regimes were investigated following exposure of memories to cobalt-60 gamma rays: the near term, within a few hours after exposure, and the long term, after many days. Samples were irradiated both at room and at liquid nitrogen temperatures. The latter procedure was used in order to freeze in the damage state until SEU measurements could be made prior to annealing. Results show that memories damaged by dose are more sensitive to upsets by heavy ions. The induced changes are substantial: threshold linear energy transfer (LET) values decreased by as much as 46 percent and asymptotic cross sections increased by factors of two to four (unannealed samples).

Stassinopoulos, E. G.↗

NASA NTRS1989

Read disturb errors in a CMOS static RAM chip

Results are reported from an extensive investigation into pattern-sensitive soft errors (read disturb errors) in the TCC244 CMOS static RAM chip. The TCC244, also known as the SA2838, is a radiation-hard single-event-upset-resistant 4 x 256 memory chip. This device is being used by the Jet Propulsion Laboratory in the Galileo and Magellan spacecraft, which will have encounters with Jupiter and Venus, respectively. Two aspects of the part's design are shown to result in the occurrence of read disturb errors: the transparence of the signal path from the address pins to the array of cells, and the large resistance in the Vdd and Vss lines of the cells in the center of the array. Probe measurements taken during a read disturb failure illustrate how address skews and the data pattern in the chip combine to produce a bit flip. A capacitive charge pump formed by the individual cell capacitances and the resistance in the supply lines pumps down both the internal cell voltage and the local supply voltage until a bit flip occurs.

Wood, Steven H.↗

NASA NTRS1991

Study Of Candidate Architectures For Data Processor

Report discusses candidate architectures for digital computer system, part of communication system in spacecraft. Primary issues in analysis; performance, rates of bit errors attributable to single-event upsets (caused by ionizing radiation), reliability, size, and dissipation of power.

Mcroberts, Lou↗

NASA NTRS1991

A machine independent expert system for diagnosing environmentally induced spacecraft anomalies

A new rule-based, machine independent analytical tool for diagnosing spacecraft anomalies, the EnviroNET expert system, was developed. Expert systems provide an effective method for storing knowledge, allow computers to sift through large amounts of data pinpointing significant parts, and most importantly, use heuristics in addition to algorithms which allow approximate reasoning and inference, and the ability to attack problems not rigidly defines. The EviroNET expert system knowledge base currently contains over two hundred rules, and links to databases which include past environmental data, satellite data, and previous known anomalies. The environmental causes considered are bulk charging, single event upsets (SEU), surface charging, and total radiation dose.

Rolincik, Mark J.↗

NASA NTRS1991

Test chips and ASIC qualification

A test chip set being developed to aid in the qualification of spaceborne Application Specific Integrated Circuits (ASICs) is described. The chip set consists of a process monitor for process parameter verification, a fault chip for yield analysis, a reliability chip for ASIC failure rate analysis, and total ionizing dose and single event upset chips for radiation effect analysis. The test structures contained in these chips are discussed along with representative test results.

Buehler, M. G.↗

NASA NTRS1990

1990 IEEE Annual Conference on Nuclear and Space Radiation Effects, 27th, Reno, NV, July 16-20, 1990, Proceedings

Various papers on nuclear and space radiation effects are presented. The general topics addressed include: basic mechanisms of radiation effects, dosimetry and energy-dependent effects, hardness assurance and testing techniques, single-event upset and latchup, isolation technologies, device and integrated circuit effects and hardening, spacecraft charging and electromagnetic effects.

Fleetwood, Daniel M.↗

NASA NTRS1990

A new method for using Cf-252 in SEU testing

A system using Cf-252 and associated nuclear instrumentation has determined the single-event upset (SEU) cross section versus linear energy transfer (LET) curve for several 2K x 8 static random access memories (SRAMs). The Cf-252 fission fragments pass through a thin-film organic scintillator detector (TFD) on the way to the device under test (DUT). The TFD provides energy information for each transiting fragment. Data analysis provides the energy of the individual ion responsible for each SEU; thus, separate upset cross sections can be developed for different energy and mass regions of the californium spectrum. This californium-based device is quite small and fits onto a bench top. It provides a convenient and inexpensive supplement or alternative to accelerator and high-altitude/space SEU testing.

Costantine, A.↗

NASA NTRS1990

Single event induced transients in I/O devices - A characterization

The results of single-event upset (SEU) testing performed to evaluate the parametric transients, i.e., amplitude and duration, in several I/O devices, and the impact of these transients are discussed. The failure rate of these devices is dependent on the susceptibility of interconnected devices to the resulting transient change in the output of the I/O device. This failure rate, which is a function of the susceptibility of the interconnected device as well as the SEU response of the I/O device itself, may be significantly different from an upset rate calculated without taking these factors into account. The impact at the system level is discussed by way of an example.

Newberry, D. M.↗

NASA NTRS1991

Upper bound SEU rate for devices in an isotropic or nonisotropic flux

A method for constructing upper bound estimates for device single event upset (SEU) rates is presented. A directional Heinrich flux, as a function of direction, must be known. A computer code, included, converts the directional Heinrich flux into an 'effective flux'. The effective flux provides a simple way to estimate upper bound SEU rates for devices with a known normal incident cross section versus LET curve.

Edmonds, Larry D.↗

NASA NTRS1992

Charge, energy, and LET spectra measurements of charged particles in P0006 experiment of LDEF

Measurements are under way of the charged particle radiation environment of the LDEF satellite using stacks of plastic nuclear track detectors (PNTDs) placed in different locations of the satellite. In the initial work, the charge, energy, and linear energy transfer (LET) spectra of charged particles were measured with CR-39 double layer PNTDs located on the west end of the satellite. Primary and secondary stopping heavy ions as well as relativistic galactic cosmic rays (mostly iron particles) were measured separately. The results will be compared with similar measurements in other locations on LDEF with different orientation and shielding conditions. The remarkably detailed study of the charged particle radiation environment of the LDEF satellite will lead to a better understanding of the radiation environment of the Space Station Freedom. It will enable more accurate prediction of single event upsets (SEUs) in microelectronics and, especially, more accurate assessment of the risk, contributed by the different components of the radiation field to the health and safety of crew members.

Benton, E. V.↗

NASA NTRS1992

Radiation model predictions and validation using LDEF data

Radiation dosimetry aboard LDEF, as well as post-flight measurements of the radioactivity induced in numerous LDEF spacecraft components, provide unique data for evaluating the accuracy of current models for predicting both the space radiation environments (trapped proton intensity, spectra, and directionality; cosmic ray fluence) and the radiation environments induced in spacecraft components (fluence, energy spectra, secondary particle, linear energy transfer, etc.). By determining the accuracy of such models using LDEF data, and with model updates where required, improved radiation environment predictions can be made for future missions, which in turn allows improved predictions for specific radiation effects for future spacecraft components (single event upsets of microelectronics, radiation damage to focal plane arrays, noise in sensitive instrumentation, etc.). Herein, the status and results from radiation model predictions and comparisons with LDEF data is given. The calculations are made using radiation transport codes coupled with a 3-D geometry/mass model of LDEF, together with current models of the space radiation environment.

Armstrong, T. W.↗

NASA NTRS1991

SEU hardened memory cells for a CCSDS Reed-Solomon encoder

A design technique to harden CMOS memory circuits against single event upset (SEU) in the space environment is reported. The design technique provides a recovery mechanism which is independent of the shape of the upsetting event. A RAM cell and flip-flop design are presented to demonstrate the method. The flip-flop was used in the control circuitry for a Reed-Solomon encoder designed for the Space Station and Explorer platforms.

Whitaker, Sterling↗

NASA NTRS1993

Effects Of Environmental Electrical Charges On Spacecraft

Handbook presents information on three kinds of disruptive effects of environmental electrical charges upon operations of electronic circuits and other sensitive equipment in spacecraft. Addresses surface and internal charging and discharging, single-event upsets, and related design issues.

Robinson, Paul A., Jr.↗

NASA NTRS1993

Upper-Bound SEU Rates In Anisotropic Fluxes

Upper bounds on rates of single-event upsets (SEU's) in digital integrated circuits and other electronic devices exposed to anisotropic fluxes of energetic ionizing particles computed by use of improved method. Derived from simplified, worst-case mathematical models of charge-collecting volumes and physical phenomena in electronic devices.

Edmonds, Larry D.↗

NASA NTRS1992

An expert system for diagnosing environmentally induced spacecraft anomalies

A new rule-based, machine independent analytical tool was designed for diagnosing spacecraft anomalies using an expert system. Expert systems provide an effective method for saving knowledge, allow computers to sift through large amounts of data pinpointing significant parts, and most importantly, use heuristics in addition to algorithms, which allow approximate reasoning and inference and the ability to attack problems not rigidly defined. The knowledge base consists of over two-hundred (200) rules and provides links to historical and environmental databases. The environmental causes considered are bulk charging, single event upsets (SEU), surface charging, and total radiation dose. The system's driver translates forward chaining rules into a backward chaining sequence, prompting the user for information pertinent to the causes considered. The use of heuristics frees the user from searching through large amounts of irrelevant information and allows the user to input partial information (varying degrees of confidence in an answer) or 'unknown' to any question. The modularity of the expert system allows for easy updates and modifications. It not only provides scientists with needed risk analysis and confidence not found in algorithmic programs, but is also an effective learning tool, and the window implementation makes it very easy to use. The system currently runs on a Micro VAX II at Goddard Space Flight Center (GSFC). The inference engine used is NASA's C Language Integrated Production System (CLIPS).

Rolincik, Mark↗

NASA NTRS1993

Clementine Sensor Processing System

The design of the DSPSE Satellite Controller (DSC) is baselined as a single-string satellite controller. The DSC performs two main functions: health and maintenance of the spacecraft; and image capture, storage, and playback. The DSC contains two processors: a radiation-hardened Mil-Std-1750, and a commercial R3000. The Mil-Std-1750 processor performs all housekeeping operations, while the R3000 is mainly used to perform the image processing functions associated with the navigation functions, as well as performing various experiments. The DSC also contains a data handling unit (DHU) used to interface to various spacecraft imaging sensors and to capture, compress, and store selected images onto the solid-state data recorder. The development of the DSC evolved from several key requirements; the DSPSE satellite was to do the following: (1) have a radiation-hardened spacecraft control system and be immune to single-event upsets (SEU's); (2) use an R3000-based processor to run the star tracker software that was developed by SDIO (due to schedule and cost constraints, there was no time to port the software to a radiation-hardened processor); and (3) fly a commercial processor to verify its suitability for use in a space environment. In order to enhance the DSC reliability, the system was designed with multiple processing paths. These multiple processing paths provide for greater tolerance to various component failures. The DSC was designed so that all housekeeping processing functions are performed by either the Mil-Std-1750 processor or the R3000 processor. The image capture and storage is performed either by the DHU or the R3000 processor.

Feldstein, A. A.↗