Fabrication and encapsulation of transistors and computation of voltage capability and current gain Second quarterly report, Oct. - Dec. 1965
Fabrication and encapsulation of epitaxial surface transistor
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Fabrication and encapsulation of epitaxial surface transistor
Instability, high threshold voltage and gamma radiation sensitivity of metal-oxide-silicon transistors
Specifications, design, and fabrication of high power, high speed silicon transistors on large area epitaxial slices
Effects of electrical bias during irradiation on radiation damage and of different measurement conditions on magnitude of degradation in N-P-N PLANAR transistors
High-current, low-voltage silicon switching transistor redesigned for obtaining lowest possible saturation drop
Failure modes of diffused planar transistors under stress screening and life testing
Electron radiation effects on terminal characteristics of unijunction transistors
Instability, high threshold voltage, and gamma radiation in MOS transistors
Ionizing radiation effects on transistor surfaces
Logical circuit for analysis of switching circuits with cell matching using p-n-p and n-p-n transistors
Silicon transistor design effects on radiation resistance, and radiation response of majority carrier device
Ionizing radiation effects on transistor surfaces in vacuum or ambient nitrogen environment
Damage to field effect transistors by proton irradiation
High voltage pulse causing beta degradation and junction resistance drop in transistor
Ionizing radiation effects on silicon planar bipolar transistors to determine degradation mechanisms
Compound diode-transistor structure with current gain invariant with temperature
Design theory and fabrication procedure for n-p-n 100 ampere silicon switching transistor