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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 235 records · Page 13

Radiation model predictions and validation using LDEF data

Radiation dosimetry aboard LDEF, as well as post-flight measurements of the radioactivity induced in numerous LDEF spacecraft components, provide unique data for evaluating the accuracy of current models for predicting both the space radiation environments (trapped proton intensity, spectra, and directionality; cosmic ray fluence) and the radiation environments induced in spacecraft components (fluence, energy spectra, secondary particle, linear energy transfer, etc.). By determining the accuracy of such models using LDEF data, and with model updates where required, improved radiation environment predictions can be made for future missions, which in turn allows improved predictions for specific radiation effects for future spacecraft components (single event upsets of microelectronics, radiation damage to focal plane arrays, noise in sensitive instrumentation, etc.). Herein, the status and results from radiation model predictions and comparisons with LDEF data is given. The calculations are made using radiation transport codes coupled with a 3-D geometry/mass model of LDEF, together with current models of the space radiation environment.

Armstrong, T. W.↗

SEU hardened memory cells for a CCSDS Reed-Solomon encoder

A design technique to harden CMOS memory circuits against single event upset (SEU) in the space environment is reported. The design technique provides a recovery mechanism which is independent of the shape of the upsetting event. A RAM cell and flip-flop design are presented to demonstrate the method. The flip-flop was used in the control circuitry for a Reed-Solomon encoder designed for the Space Station and Explorer platforms.

Whitaker, Sterling↗

Effects Of Environmental Electrical Charges On Spacecraft

Handbook presents information on three kinds of disruptive effects of environmental electrical charges upon operations of electronic circuits and other sensitive equipment in spacecraft. Addresses surface and internal charging and discharging, single-event upsets, and related design issues.

Robinson, Paul A., Jr.↗

Upper-Bound SEU Rates In Anisotropic Fluxes

Upper bounds on rates of single-event upsets (SEU's) in digital integrated circuits and other electronic devices exposed to anisotropic fluxes of energetic ionizing particles computed by use of improved method. Derived from simplified, worst-case mathematical models of charge-collecting volumes and physical phenomena in electronic devices.

Edmonds, Larry D.↗

An expert system for diagnosing environmentally induced spacecraft anomalies

A new rule-based, machine independent analytical tool was designed for diagnosing spacecraft anomalies using an expert system. Expert systems provide an effective method for saving knowledge, allow computers to sift through large amounts of data pinpointing significant parts, and most importantly, use heuristics in addition to algorithms, which allow approximate reasoning and inference and the ability to attack problems not rigidly defined. The knowledge base consists of over two-hundred (200) rules and provides links to historical and environmental databases. The environmental causes considered are bulk charging, single event upsets (SEU), surface charging, and total radiation dose. The system's driver translates forward chaining rules into a backward chaining sequence, prompting the user for information pertinent to the causes considered. The use of heuristics frees the user from searching through large amounts of irrelevant information and allows the user to input partial information (varying degrees of confidence in an answer) or 'unknown' to any question. The modularity of the expert system allows for easy updates and modifications. It not only provides scientists with needed risk analysis and confidence not found in algorithmic programs, but is also an effective learning tool, and the window implementation makes it very easy to use. The system currently runs on a Micro VAX II at Goddard Space Flight Center (GSFC). The inference engine used is NASA's C Language Integrated Production System (CLIPS).

Rolincik, Mark↗

Clementine Sensor Processing System

The design of the DSPSE Satellite Controller (DSC) is baselined as a single-string satellite controller. The DSC performs two main functions: health and maintenance of the spacecraft; and image capture, storage, and playback. The DSC contains two processors: a radiation-hardened Mil-Std-1750, and a commercial R3000. The Mil-Std-1750 processor performs all housekeeping operations, while the R3000 is mainly used to perform the image processing functions associated with the navigation functions, as well as performing various experiments. The DSC also contains a data handling unit (DHU) used to interface to various spacecraft imaging sensors and to capture, compress, and store selected images onto the solid-state data recorder. The development of the DSC evolved from several key requirements; the DSPSE satellite was to do the following: (1) have a radiation-hardened spacecraft control system and be immune to single-event upsets (SEU's); (2) use an R3000-based processor to run the star tracker software that was developed by SDIO (due to schedule and cost constraints, there was no time to port the software to a radiation-hardened processor); and (3) fly a commercial processor to verify its suitability for use in a space environment. In order to enhance the DSC reliability, the system was designed with multiple processing paths. These multiple processing paths provide for greater tolerance to various component failures. The DSC was designed so that all housekeeping processing functions are performed by either the Mil-Std-1750 processor or the R3000 processor. The image capture and storage is performed either by the DHU or the R3000 processor.

Feldstein, A. A.↗

LET spectra measurements of charged particles in the P0006 experiment on LDEF

Measurements are under way of the charged particle radiation environment of the Long Duration Exposure Facility (LDEF) satellite using stacks of plastic nuclear track detectors (PNTD's) placed in different locations of the satellite. In the initial work the charge, energy, and linear energy transfer (LET) spectra of charged particles were measured with CR-39 double layer PNTD's located on the west side of the satellite (Experiment P0006). Primary and secondary stopping heavy ions were measured separately from the more energetic particles. Both trapped and galactic cosmic ray (GCR) particles are included, with the latter component being dominated by relativistic iron particles. The results from the P0006 experiment will be compared with similar measurements in other locations on LDEF with different orientation and shielding conditions. The remarkably detailed investigation of the charged particle radiation environment of the LDEF satellite will lead to a better understanding of the radiation environment of the Space Station Freedom. It will enable more accurate prediction of single event upsets (SEU's) in microelectronics and, especially, more accurate assessment of the risk - contributed by different components of the radiation field (GCR's, trapped protons, secondaries and heavy recoils, etc.) - to the health and safety of crew members.

Benton, E. V.↗

An on-line expert system for diagnosing environmentally induced spacecraft anomalies using CLIPS

A new rule-based, expert system for diagnosing spacecraft anomalies is under development. The knowledge base consists of over two-hundred rules and provide links to historical and environmental databases. Environmental causes considered are bulk charging, single event upsets (SEU), surface charging, and total radiation dose. The system's driver translates forward chaining rules into a backward chaining sequence, prompting the user for information pertinent to the causes considered. The use of heuristics frees the user from searching through large amounts of irrelevant information (varying degrees of confidence in an answer) or 'unknown' to any question. The expert system not only provides scientists with needed risk analysis and confidence estimates not available in standard numerical models or databases, but it is also an effective learning tool. In addition, the architecture of the expert system allows easy additions to the knowledge base and the database. For example, new frames concerning orbital debris and ionospheric scintillation are being considered. The system currently runs on a MicroVAX and uses the C Language Integrated Production System (CLIPS).

Lauriente, Michael↗

Implementation of ionizing radiation environment requirements for Space Station

Proper functioning of Space Station hardware requires that the effects of high-energy ionizing particles from the natural environment and (possibly) from man-made sources be considered during design. At the Space Station orbit of 28.5-deg inclination and 330-440 km altitude, geomagnetically trapped protons and electrons contribute almost all of the dose, while galactic cosmic rays and anomalous cosmic rays may produce Single Event Upsets (SEUs), latchups, and burnouts of microelectronic devices. Implementing ionizing radiation environment requirements for Space Station has been a two part process, including the development of a description of the environment for imposing requirements on the design and the development of a control process for assessing how well the design addresses the effects of the ionizing radiation environment. We will review both the design requirements and the control process for addressing ionizing radiation effects on Space Station.

Boeder, Paul A.↗

Charge collection at large angles of incidence

Charge collection exhibited by p-n junctions, which have at least one small dimension, deviates from the geometric assumptions commonly used in SEU (single event upset) testing. The amount of charge collected did not increase with the secant of the angle of incidence. The number of events under the peak in the charge collection spectrum did not decrease as the cosine of the angle of incidence. Both the position of the peak and the number of events under the peak measured at a given angle of incidence depended upon which symmetry axis of the device was chosen to be the axis of rotation.

Mcnulty, P. J.↗

Low power SEU immune CMOS memory circuits

The authors report a design improvement for CMOS static memory circuits hardened against single event upset (SEU) using a recently proposed logic/circuit design technique. This improvement drastically reduces static power consumption, reduces the number of transistors required in a D flip-flop design, and eliminates the possibility of capturing an upset state in the slave section during a clock transition.

Liu, M. N.↗

Charge generation by heavy ions in power MOSFETs, burnout space predictions, and dynamic SEB sensitivity

The transport, energy loss, and charge production of heavy ions in the sensitive regions of IRF 150 power MOSFETs are described. The dependence and variation of transport parameters with ion type and energy relative to the requirements for single event burnout in this part type are discussed. Test data taken with this power MOSFET are used together with analyses by means of a computer code of the ion energy loss and charge production in the device to establish criteria for burnout and parameters for space predictions. These parameters are then used in an application to predict burnout rates in a geostationary orbit for power converters operating in a dynamic mode. Comparisons of rates for different geometries in simulating SEU (single event upset) sensitive volumes are presented.

Stassinopoulos, E. G.↗

Galileo environmental test and analysis program summary

This paper presents an overview of the Galileo Project's environmental test and analysis program during the spacecraft development phase - October 1978 through launch in October 1989. After describing the top-level objectives of the program, summaries of-the approach, requirements, and margins are provided. Examples of assembly- and system-level test results are given for both the pre-1986 (direct mission) testing and the post-1986 (Venus-Earth-Earth gravity assist mission) testing, including dynamic, thermal, electromagnetic compatibility (EMC), and magnetic. The approaches and results for verifying by analysis that the requirements of certain environments (e.g., radiation, micrometeoroids, and single event upsets) are satisfied are presented. The environmental program implemented on Galileo satisfied the spirit and intent of the requirements imposed by the Project during the spacecraft's development. The lessons learned from the Galileo environmental program are discussed in this paper.

Hoffman, A. R.↗

Nonvolatile GaAs Random-Access Memory

Proposed random-access integrated-circuit electronic memory offers nonvolatile magnetic storage. Bits stored magnetically and read out with Hall-effect sensors. Advantages include short reading and writing times and high degree of immunity to both single-event upsets and permanent damage by ionizing radiation. Use of same basic material for both transistors and sensors simplifies fabrication process, with consequent benefits in increased yield and reduced cost.

Katti, Romney R.↗

Making A D-Latch Sensitive To Alpha Particles

Standard complementary metal oxide/semiconductor (CMOS) D-latch integrated circuit modified to increase susceptibility to single-event upsets (SEU's) (changes in logic state) caused by impacts of energetic alpha particles. Suitable for use in relatively inexpensive bench-scale SEU tests of itself and of related integrated circuits like static random-access memories.

Buehler, Martin G.↗

A high speed CCSDS encoder for space applications

This paper reports a VLSI implementation of the CCSDS standard Reed Solomon encoder circuit for the Space Station. The 1.0 micron double metal CMOS chip is 5.9 mm by 3.6 mm, contains 48,000 transistors, operates at a sustained data rate of 320 Mbits/s, and executes 2,560 Mops. The chip features a pin selectable interleave depth of 1 to 8. Block lengths of up to 255 bytes, as well as shortened codes, are supported. The control circuitry uses register cells which are immune to Single Event Upset. In addition, the CMOS process used is reported to be tolerant of over 1 Mrad total dose radiation.

Whitaker, S.↗

SEU hardening of CMOS memory circuit

This paper reports a design technique to harden CMOS memory circuits against Single Event Upset (SEU) in the space environment. A RAM cell and Flip Flop design are presented to demonstrate the method. The Flip Flop was used in the control circuitry for a Reed Solomon encoder designed for the Space Station.

Whitaker, S.↗

Single event effects and laser simulation studies

The single event upset (SEU) linear energy transfer threshold (LETTH) of radiation hardened 64K Static Random Access Memories (SRAM's) was measured with a picosecond pulsed dye laser system. These results were compared with standard heavy ion accelerator (Brookhaven National Laboratory (BNL)) measurements of the same SRAM's. With heavy ions, the LETTH of the Honeywell HC6364 was 27 MeV-sq cm/mg at 125 C compared with a value of 24 MeV-sq cm/mg obtained with the laser. In the case of the second type of 64K SRAM, the IBM640lCRH no upsets were observed at 125 C with the highest LET ions used at BNL. In contrast, the pulsed dye laser tests indicated a value of 90 MeV-sq cm/mg at room temperature for the SEU-hardened IBM SRAM. No latchups or multiple SEU's were observed on any of the SRAM's even under worst case conditions. The results of this study suggest that the laser can be used as an inexpensive laboratory SEU prescreen tool in certain cases.

Kim, Q.↗